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Summary
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This presentation focuses on the benefits of the PXI platform for semiconductor test applications.
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Leveraging the PXI Modular Architecture for ATE Platforms
The PXI platform presents a flexible, innovative, cost-effective alternative to big-iron ATE systems for semiconductor test. Marvin Test Solutions offers a range of advanced, PXI-based test system configurations for digital, mixed-signal and RF test applications.
Originally presented at International Test Conference 2016.
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Article Date
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11/29/2016
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Keywords
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ATE. semiconductor, digital, RF, mixed-signal, PXI
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