Test Connections
 

TS-900 Semiconductor Test System
Geotest’s TS-900, a PXI-based, semiconductor test system has been nominated as a Best in Test entry for the Semiconductor Test category. Introduced in July of 2011 at the Semicon West show, the TS-900 Semiconductor Test System represents a new class of semiconductor test systems which takes full advantage of the flexibility and breadth of products available in the PXI market. Featuring an integral, high-performance receiver interface and utilizing Geotest’s market-leading GX5295 100 MHz digital instrument with a PMU per pin architecture, the TS-900 Semiconductor Test System offers an open architecture test platform for high-performance digital and mixed-signal test capabilities including RF test. Available in bench top or in a cart-based configuration the TS-900 offers many of

TS-900 PXI Semiconductor Test System
the same features and capabilities associated with proprietary ATE systems but with a substantially lower price.

To vote for this product, please click here to complete the online ballot or visit the following link: http://bit.tmworld.com/vote/58. Voting ends on December 16th, so please vote today!

GX3700e / GX3700 FLEX FPGA Cards
Geotest’s new GX3700e and GX3700 PXI Express and PXI FlexDIO FPGA cards have also been nominated as a Best in Test entry for the ATE/Production Test category. Introduced in September of this year, these high performance products feature Altera Stratix III devices, support I/O data rates > 700 megahertz and SerDes rates up to 1.2 GB/s. Both cards support data streaming/DMA capability. The GX3700e supports data transfer rates of over 800 MB/s with an x4 PCIe interface. Like Geotest’s other FPGA cards, the GX3700 and GX3700e feature module expansion boards, allowing users to create their own specialized interfaces. And to ensure signal integrity, the I/O connectors are part of the interface module. Users can program the GX3700 / GX3700e by using Altera’s development tools including Altera’s free, web-based Quartus II design tools. Software drivers are provided that support a wide range of application development interfaces including ATEasy, C, LabWindows, LabVIEW and Linux.  

GX3700e PXI Express FlexDIO FPGA card

To vote for this product, please click here to complete the online ballot or visit the following link: http://bit.tmworld.com/vote/32. Voting ends on December 16th, so please vote today!
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Geotest-Marvin Test Systems, Inc.
1770 Kettering
Irvine, CA 92614
1-949-263-2222
1-888-837-8297

Geotest - Marvin Test Systems, Inc.
©2011 Geotest-Marvin Test Systems, Inc. (www.geotestinc.com). All rights reserved.
Geotest - Marvin Test Systems, Inc. - Geat A Head Start With Geotest