At this year's IEEE AUTOTESTCON show, which is being held at the Disneyland Hotel in Anaheim, California, Geotest will be presenting a variety of test systems, and hardware / software products for functional test. Reinforcing AUTOTESTCON's 2009 show theme "Mission Assurance through Advanced ATE", Geotest will be debuting new systems and ATE products for addressing factory, depot and flight line test applications.
  Technical Session Schedule
  Geotest Event Calendar
New additions to our product line include our expanded line of Geotest Basic Test Systems (GBATS), our enhanced 3U PXI digital I/O cards, and DtifEasy - our full featured LASAR post-processor and execution software. In addition, we will be showcasing an ATML Interoperability Demonstration in collaboration with the DoD ATS Framework Working Group.

Make sure to visit the Geotest Booth (#811) and ask one of our experts for an in-depth review and demonstration of all the new hardware and software products. Whether you’re looking for system components or a complete system solution, Geotest can help give your next test system project a head start.

See you at the show!

Geotest AUTOTESTCON Technical Sessions
Date & Time
Implementing Serial Bus Interfaces with General Purpose Digital Instrumentation
Wednesday - 09/16/09
8:00 am - 9:45 am

Dale Johnson
Integration of Software Technologies into a Test System
Wednesday - 09/16/09
10:00 am - 11:45 am

Ron Yazma
PXI-Based Flight Line Test Sets
Wednesday - 09/16/09
1:30 pm - 3:15 pm

Loofie Gutterman
Consolidating Test Resources for Avionics Production Test - Requirements and Applications
Thursday - 09/17/09
8:00 am - 9:45 am

Michael Dewey & Wolf Sonnenberg (Teledyne Controls, US)
An IEEE-1445 (DTIF)-Based Digital Test Solution for Re-Hosting Test Program Sets
Thursday - 09/17/09
10:00 am - 11:45 am

Ron Yazma / Albert Quan

AUTOTESTCON Product Highlights
Geotest Basic Automated Test System (GBATS) Platform Now offered in Additional Configurations
Based on Geotest's GX7102A PXI platform, the GBATS modular test platform features a preconfigured, compact, 3U / 6U system that includes all of the required functionality needed to support the development and deployment of functional test applications including a system self-test and a high pin count tester interface.

Building on the initial market acceptance of the GBATS TS-775 for military avionics applications and the TS-720 for functional test / boundary scan applications, four new market focused GBATS test systems are now available. And like all GBATS systems, these new offerings can be expanded or re-configured with little or no customization by simply selecting from a list of standard GBATS instrument options, as listed below:

    TS-710 - Targeted for basic functional test applications, the TS-710 offers users a low-cost, preconfigured test platform that can be used for basic analog and digital test. 
    TS-730 - Configured for mixed signal applications, the TS-730 offers performance analog and digital test capabilities. Targeting A to D and D to A devices and modules, the TS-730 offers a cost-effective, ready to test platform. 
    TS-750 - Configured for digital test applications for the component or card level, the TS-750 can support up to 128 digital I/O channels with test rates to 200 MHz. Like the other GBATS platforms, the preconfigured TS-750 is supplied with user power and a 6.5 digit DMM as well as a self-test program and fixture. 
    TS-770 - Based on the TS-775, the TS-770 is configured to support commercial avionics products for both box or card level applications. The platform includes a 16 channel, ARINC-429 bus interface module as well as user power, switching, a DMM, and a 3-channel, programmable 32 volt source. 

All GBATS platforms are available with Geotest's ATEasy software, which provides an integrated and complete test executive and test development environment, allowing users to quickly develop and easily maintain test applications.
Geotest Debuts LASAR-based Digital Test Solution DtifEasy
Geotest has developed a full-featured tool set – DtifEasy, for importing, converting, and executing IEEE-1445 compliant digital test vectors generated by a LASAR simulation. DtifEasy includes a LASAR post-processor, run-time and diagnostic test environments for supporting go / no-go, fault dictionary and guided probe functionality. All four IEEE-1445 file types - UUT model group, Stimulus and Response group, Fault Dictionary group, and Probe group are supported by DtifEasy.
Overall control and execution of the .tap file conversion process, UUT configuration, and execution of go/no-go and probing sequences is provided by the ATEasy test development / execution environment which is included with the DtifEasy product. DtifEasy supports Geotest's 3U PXI GX529x series of dynamic digital instrumentation and the 6U PXI GX5055, 50 MHz digital instrument. Both of these instrument families support a digital logic probe for guided probe diagnostics. DtifEasy's other features include:
    Guided probe tools which offer both textual and UUT image probing aides, guided probe tree display, and repeat / skip probes simplifying the diagnosis of UUT faults 
    Open architecture supports interfaces for programming languages including CVI, LabView, VB, and C/C++ 
    Available with preconfigured Geotest digital subsystems and digital test systems 

The DtifEasy conversion tools in conjunction with Geotest digital instrumentation / systems offers a low cost and superior solution for those users needing to migrate existing LASAR based applications (with .tap files) from a legacy platform to a new test platform. Similarly, by re-simulating UUTs using LASAR, DtifEasy offers users a cost-effective method to re-host UUTs on lower cost, PXI-based, digital functional test platforms.

LASAR is a Teradyne tradename

Geotest Expands the GX5290 Family with the Low-Cost GX5291
Responding to the need for a low-cost, performance digital instrument, Geotest has introduced the GX5291 product, which offers 32 channels of digital I/O, with 32 Mb of vector memory per channel. The card supports 1.5 V, 1.8 V, 2.5 V, 3.3 V, and 5 V TTL/LVTTL logic families and supports a maximum vector rate of 50 or 100 MHz.

Designed to support cost sensitive, performance digital test applications with low to moderate channel count, the GX5291 shares all of the features found on other GX5290 products such as per pin and per vector direction control and supports up 32 channels for one digital domain. The 50 MHz card features an industry-leading price of $115/channel with the 100 MHz card priced at $125/channel.
Geotest Expands Capabilities and Performance for the GX5280 and GX5290 Series Digital I/O Cards GX5290 Series
Geotest has expanded the capabilities and performance of their 3U PXI dynamic digital I/O cards. Both the GX5280 and GX5290 series cards now offer enhanced digital vector load and unload performance with the fastest vector load / unload times in the industry.
These enhanced products provide more than a 2-to-1 reduction in vector load / unload times when compared to competitive offerings - resulting in reduced execution time and faster throughput for digital test applications. Additionally, Geotest has upgraded the GX5290 series products by incorporating real time compare - providing users with a fast-test method for testing digital devices which requires deep test vectors. Current GX5280 and GX5290 products are field upgradable to support these new features by uploading and installing new firmware as well as upgrading to the current DIO driver support package.
Geotest Expands PXI Express Controller Offering GX7944
Geotest has released its newest embedded controller – the GX7944 PXI Express controller. Based on the Intel Core 2 Duo, 2.16 GHz processor, the GX7944 offers an aggregate PXIe bus bandwidth of up to 1 GB/s. And like all other Geotest PXI controllers, the GX7944 requires only one 3U PXI express slot, maximizing PXI rack space for peripheral modules.
When combined with the GX7600 series PXI Express chassis the GX7944 provides a compact, high performance, and integrated PXI Express chassis / controller configuration. The GX7944 offers multiple I/O connections including USB, Ethernet, and VGA.

To learn more about Geotest products please visit

Monday, September 14
8:00 am to 5:00 pm
Tuesday, September 15
Exhibit hall open
10:30 am to 5:00 pm
Technical sessions
8:00 am to 5:15 pm
Exhibitor Reception (exhibit hall)
6:00 pm to 8:30 pm
Wednesday, September 16
Exhibit hall open
9:00 am to 6:00 pm
Technical sessions
8:00 am to 5:15 pm
Thursday, September 17
Exhibit hall open
9:00 am to Noon
Technical sessions
8:00 am to 11:45 am
Geotest Event Calendar
Listed below is our current list of shows, conferences, seminars, and other events that Geotest or a channel partner will be attending in the remainder of 2009. Clicking on the associated link will direct you to our website where you can find more information about the event.
More Information
09/14 - 09/18
Ogden, UT
Forum Electronique
10/06 - 10/08
Paris, France
Weapons and Tactics Conference
10/19 - 10/20
Tuscon, Az
Joint Munitions Worldwide Review
10/25 - 10/31
Las Vegas, NV
11/10 - 11/13
Munich, Germany
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