As the year draws to a close, we at Marvin Test Solutions would like to thank you for your business and support. We’ve enjoyed the opportunity to successfully fullfil your requirements with our innovative and exciting solutions. As always, you can count on us for unrivaled long-term support. We look forward to working even more closely with you in 2015.
Happy holidays and best wishes to you and yours for a healthy and prosperous New Year!
Steve Sargeant, CEO
We hope you enjoy this month's issue of Test Connections which includes new product updates and news events.
Please send your comments or suggestions regarding this newsletter to marketing@MarvinTest.com.
Tradeshow Wrap Up | | | | | At Marvin Test Solutions, we’ve been busy participating in tradeshows across the country and overseas, meeting with our customers in-person and showcasing some of our newest test technologies for military, aerospace, and manufacturing organizations. |  |
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Upgrading a VXI System with PXI Instrumentation | | | | | A major military contractor was recently given the task of upgrading a VXI-based system containing several obsolete and unsupportable VXI instruments. MTS was engaged to develop a PXI-based replacement solution which included an embedded controller, a GPIB interface module, replacement instrumentation modules, and control software. Read the case study and see a system diagram. |  |
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New Product Announcements | | | | This month, we are pleased to announce the release of two new products:- MTS-916-6, Modular Target Simulator features laser test capabilities for laser-guided missiles such as Hellfire and Maverick.
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MTS has recently added new white papers to its Knowledge Base library.Read on
to learn more.
Integrating ATMate's Data Analysis Tool with ATEasy. Click here
to learn more.
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Tradeshow Wrap Up
In mid-October, we attended the Industrial Cooperation Days in Defense & Aerospace (ICDDA) in Ankara, Turkey, a global conference that this year included more than 250 companies from 34 countries and 4,800 one-to-one meetings. MTS acted as a co-exhibitor with Aero Precision, and showcased our Hellfire test sets, the MTS-3060 SmartCan, and the MT1888 eye-safe laser simulator. Marvin Test Solutions CEO Steve Sargeant also presented a session titled, "How to do Business with The Marvin Group," and lead a seminar on overcoming obsolescence in legacy test sets. We found the show to be very successful, meeting with multiple B2B organizations in the defense industry, and have already been back for follow-on meetings.
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Also in mid-October, we exhibited at the 2014 Association of the United States Army (AUSA) Annual Meeting and Exposition in Washington, D.C. Founded in 1950, the AUSA is a non-profit educational organization that supports all aspects of national security while advancing the interests of America’s Army and the men and women who serve. During the exposition, we showcased our armaments test and support systems, airborne armament equipment, land systems products, heavy armor machined structures and components, and The Flyer® Advanced Light Strike Vehicle.
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| A week later, we traveled to Seattle, WA, to participate in the International Test Conference (ITC). This conference is dedicated to the electronic test for devices, boards, and systems and covers the complete cycle from design verification, test, diagnosis, failure analysis, to process and design improvement. At ITC, we introduced the newest features and options for our TS-900 semiconductor test system, including our new GX5296 digital subsystem that offers timing-per-pin flexibility and is the most-advanced PXI digital subsystem available today. |
In mid-September, we participated in IEEE’s AUTOTEST, the United States’ largest conference focused on automatic test systems for US military systems, held annually since 1965. The show offers ATE leaders and commercial/government organizations the opportunity to learn about the latest technologies supporting the production and maintenance of products and systems for military and aerospace organizations. At our booth, we showcased our field-to-factory test solutions, including the new GX5296 digital subsystem, the MTS-3060 SmartCan, the GENASYS performance functional test system, the TS-900 semiconductor test system, and ATEasy 9, our test executive and development software. We also presented a technical session titled, "Addressing Legacy ATE System Requirements with PXI." |
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That same week, our MTS team traveled to National Harbor, MD, to participate in the Air Force Association (AFA) Air & Space Conference, a one-of-a-kind event that brings together U.S. Air Force leadership, industry experts, academia, and current aerospace specialists from around the world to discuss the issues and challenges facing the aerospace community today. At the show, we hosted two on-site seminars - "Post-SDD Warfighting Enhancements to the F-35" and "Addressing Obsolescence in Legacy Aircraft Test Equipment." At our booth, we displayed several of our military and aerospace maintenance and sustainment solutions that are in high demand globally, including the MTS-206, and MTS-916 (a combination test system for I-level test of Maverick Missiles and launchers), the PATS-70 (an O-level MTS-207-based platform for A-10C avionics), and the TS-210 (an aircraft noise test solution), and the MTS-209 (an I-level test set for legacy and Smart AME).
As you can see, it was a busy fall season for us, but we truly enjoyed interacting with our customers and peers, discussing the challenges they are facing and how MTS solutions can help them make their mission-critical test needs easier, more efficient, and more successful. If you would like to discuss your specific test requirements, or want to learn more about any of the products or topics we showcased above, please call us toll free at 1-888-837-8297 or 1-949-263-2222. |
Upgrading a VXI System with PXI Instrumentation
A military - aerospace contractor was recently given the task of upgrading a VXI-based system containing several obsolete and unsupportable VXI instruments. MTS was engaged to develop a PXI-based replacement solution. With a large investment in existing test programs, the replacement solution required that the existing TPS’ be retained, with no modifications. The existing implementation included several VXI instruments with control of the instruments provided via an IEEE interface from the existing station controller. The instrument functionality included event monitoring, event timing and waveform generation.
All of these capabilities were implemented using FPGA-based modules in conjunction with signal conditioning circuitry, located on the modules’ daughter boards. Using Marvin Test Solutions’ GX3700 FPGA module, the new solution offered the flexibility to modify the final designs as needed to accurately replicate the legacy instrument functions.
Control of the modules from the test station was supported by a GPIB interface. To analyze the existing commands, data received via GPIB for each instrument was analyzed by a program written in ATEasy. To replicate the control and commands of the legacy instruments, the GPIB instructions were recorded into the Windows Events Log. With the control software functions identified, a software module was added to the PXI system, which interpreted each GPIB comment and in turn, communicated with each of the replacement instruments.
The control software for the modules employs a service that runs on the embedded controller which is located in the PXI chassisl. The system is designed to operate autonomously and launches the service upon boot-up. The software creates a 'listener thread' that monitors GPIB traffic, logs communication, and dispatches instructions to instruments. The resulting solution provided the end customer with an upgraded system that eliminated the obsolete instrumentation while retaining the investment in test programs.
Do you have a specific legacy system or instrument replacement requirement? Please contact us or call us toll free at 1-888-837-8297 or 1-949-263-2222 to learn more about how MTS can leverage our hardware, software, and systems expertise to help you extend test system life cycles and supportability.
Want to learn more about updating legacy test systems with next-gen technology?
Read our white paper, "Solving Functional Test Obsolescence." |
MTS-916-6 Modular Target SimulatorMarvin Test Solutions has recently added additional capabilities to its line of Modular Target Simulators. The MTS-916-6 combines the capabilities of the MTS-916-4 and MTS-916-5, offering laser test capabilities for both the Hellfire and Maverick missiles. The target simulator features a solid-state target simulator design with no moving parts, eliminating the need for a moving collimator. The result is a rugged, compact, and reliable system which can replace legacy target simulators. Additionally, the MTS-916-6 can be paired with the MTS-206 test set, providing enhanced test automation features.
Click here to learn more about the MTS-916-6.
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TS-960 Semiconductor Test SystemOur semiconductor customers asked for an alternative to big-iron ATE systems that would combine high-performance test capabilities with a substantially reduced footprint. By using the TS-960 platform and our new GX5296 digital subsystem, customers get a flexible PXI platform with high-performance timing features typically found only in high-end ATE systems.
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Proven Test Platform
The TS-960 platform features a 20-slot, 3U PXI chassis accommodating up to 512, 125 MHz digital I/O channels with PMUs per pin, yet has a small footprint and modular structure, allowing users to address a range of test applications. Available as a bench top, with an integrated cart, or with an integrated manipulator, the TS-960 platform takes full advantage of the PXI architecture to achieve a full-featured test solution for device, SoC and SiP test applications.
High-Performance Digital Test
The GX5296 delivers high-performance digital test capabilities and is ideal for addressing verification, focused production, and failure analysis test needs - or for replacing legacy test systems. The GX5296 builds on the successful GX5295 digital subsystem with enhanced timing performance and features. |  |
As the highest performing PXI card available today, the GX5296 leverages the features and capabilities of multiple Marvin Test Solutions products, delivering unrivaled timing, density, memory, and parametric measurement capabilities. The GX5296 occupies only a single PXI 3U slot, yet features flexible timing and high-resolution edge placement, providing no-compromise digital test capabilities as well as the flexibility to test and characterize a device’s DC and AC performance.
GX5296 Key Features:
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- 32, 125 MHz digital channels, PMU per pin
- Timing per pin with 1 ns edge placement
- Data formatting (6 formats)
- -2 to +7 volt drive / sense range
- Full-featured sequencer with 16 loop counters
- Compatible with standard digital test file formats - VCD, eVCD, STIL, WGL
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For more information regarding the MTS-916, TS-960 and GX5296, please visit
marvintest.com.
Upcoming Events
WEPTAC 2015, January 14th - 15th, 2015
Nellis AFB, Las Vegas, NV
Marvin Test Solutions will be attending the Weapons and Tactic Conference (WEPTAC) on January 14th and 15th, at the Nellis Club, Nellis AFB, Las Vegas, NV. WEPTAC is an annual two - week event that brings together hundreds of warfighters from the Combat Air Forces (CAF) to discuss current issues, look at future issues, and provide solutions for joint employment of forces.
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Featured Articles:
Marvin Test Solutions’ products and people were recently featured in the following publications: |
New White Papers
MTS has two new white papers available for download which demonstrate how PXI based systems can replace obsolete / legacy test systems.
You can view all of our white papers here.
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