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53 GHz VNA RF test performance
Intermediate, depot, and production testing of MIL-STD-1760 and legacy armament systems including launchers and bomb racks
PXI-based, replacement solution for the Summation Test System
Preconfigured, cost effective, functional test solutions for analog, digital, mixed signal and avionics applications
Imports, converts and executes IEEE-1445 compliant .tap files from a LASAR simulation for use with MTS digital hardware and digital functional test systems
50 MS/s (GX1200) and 100 MS/s (GX1201) sample rates
21 Slot Smart Chassis with health monitoring
Sep 14, 2022
This article demonstrates how to interface with MATLAB from ATEASY with an example for using the GXAO software package used to control and interface the GX1648. Read more...
Dec 20, 2021
Detailed list of main features of ATEasy 2021 with images. Read more...
Aug 18, 2021
ATEasy contains many native cybersecurity features to support secure test development Read more...
Oct 16, 2019
This paper explores the ATE cybersecurity issue from the perspective of the test development environment, including the use of test executives, and the challenges associated with minimizing impact to data integrity and access to control, as well as the potential impact on the UUT from substandard counterfeit parts and those embedded with malware. Read more...
Oct 10, 2019 White Paper
This paper provides an overview of how MTS' GENASYS functional test system can successfully address both current and future test needs that are presently supported by legacy functional test platforms. Read more...
Sep 5, 2019
This paper reviews the specific details and rationale associated with the revisions made to seven of the specifications which are maintained by the PXI Systems Alliance (PXISA). Read more...
This paper discusses how the use of a form / fit / function instrument replacement solution was employed for replacing pulse and arbitrary waveform function generators that are part of the Hybrid Test Set (HTS) AN/USM-484 test system. Read more...
May 24, 2019 White Paper
The PATS (Portable Automated Test Set)-70 is a flightline test set that is based on the MTS-207 for supporting and maintaining a variety of A-10/C systems. Read more...
Sep 8, 2021 White Paper
The quest for commonality, capability and long term sustainment of armament test equipment for optically guided smart weapons Read more...
Sep 25, 2018 White Paper
This paper discusses the use of industry standard design tools, the proper use of intellectual property (IP), and the use/adoption of standardized FPGA interfaces such as the ANSI/VITA 57 standard. Read more...
Jan 2, 2018 8 Replies 2819 Views
Hi all,I'm using GX5295 DIO card in PCI Chassis linked to a PC. I wanna to call the DIO_LoadFile of the GtDio32.dll to load Multiple pattern files to the board's ... Read more... 1/16/2018 9:31:38 AM by Jason D.
Nov 22, 2012 4 Replies 4362 Views
I'm currently using Visual C# 2010 to write a .NET assembly (DLL).I want to debug my .NET code that is called from ATEasy 8 (see KB article Q200219 for the genera... Read more... 11/28/2012 5:41:33 AM by Darrell L.
Nov 5, 2013 4 Replies 1856 Views
I've installed Visual Studio 2010 Professional, and have run the DotNet demo that comes with ATEasy. That works, no problem. My problem however lies in the fact t... Read more... 11/7/2013 9:41:33 AM by Darrell L.
Dec 18, 2012 3 Replies 2172 Views
Hi,I'm currently using Visual C# 2010 to write several .NET assembly (DLL) In the ATEasy.config.exe I add this line : <supportedRuntime version="v4... Read more... 1/2/2013 4:15:49 PM by DrATEasy (Ron Y.)
Feb 21, 2013 1 Reply 6080 Views
Recently I updated Ateasy to version 8.When I try to debug any class library built in VS 2005 I receive the following error message from Visual studio: "Error w... Read more... 2/21/2013 10:21:57 AM by DrATEasy (Ron Y.)
Jun 2, 2014 3 Replies 2296 Views
I would like to be able to load test parameters from an Excel file at initilization.Knowledge base article #Q200233 provides an example, but requires Excel.drv which is... Read more... 7/7/2014 10:27:08 AM by Orr K.
Nov 8, 2011 1 Reply 5889 Views
We are pleased to announce to you that our TS-900 PXI Semiconductor Test System is a contender for the Best in Test Award from Test and Measurement World (publication). ... Read more... 4/23/2015 8:27:05 AM by Olga T.
Feb 24, 2023 version: C 162.13 KB
type: Datasheet
Jun 5, 2014 version: A 145.89 KB
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Sep 29, 2023
Newsletter Section(s): Solution Spotlight Read more...
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Newsletter Section(s): Did You Know Read more...
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Newsletter Section(s): Focus On Read more...
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Newsletter Section(s): Focus On; Did You Know Read more...
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Newsletter Section(s): In The News Read more...
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Newsletter Section(s): Focus On; Product Highlight; Solution Spotlight; In The News; Did You Know Read more...
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Newsletter Section(s): Focus On; Product Highlight; Solution Spotlight; In The News Read more...
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Newsletter Section(s): Focus On; Product Highlight; In The News; Did You Know Read more...
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Jun 14, 2021
Through the DoD Automatic Test Systems Executive Directorate, Read more...
Apr 14, 2021
Five different aircraft Field Training Detachment (FTD) courses, 200+ hours of aircraft test set training, 15 unique Intermediate and Operational-Level test sets utilized; all for one USAF Armament troop. Makes sense, right? Each aircraft is unique, so logic would say “You can’t test an F-16 the same as an F-15E or F-22.” But why not? Is it possible to have a Read more...
