Workshops & Seminars

Marvin Test Solutions presents the following workshops and seminars:

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Mixed Signal Testing Using Next Generation Modular Test Platforms - Webinar

This seminar will provide an in depth presentation and review of how you can use the PXI platform to build flexible, cost effective, and compact mixed signal test systems. Read more...

This seminar will provide an in depth presentation and review of how you can use the PXI platform to build flexible, cost effective, and compact mixed signal test systems.

The seminar will include the following topics:

An overview of PXI and an in depth discussion about PXI Express:
  • How PXI Express builds on the PXI standard
  • An overview of PCI express and the PXI Express high performance timing resources
  • What are the performance enhancements you can expect from PXI Express
  • What instruments and applications will benefit the most from PXI Express
Features and benefits of PXI for mixed signal testing:
  • Leveraging PXI to build compact footprint test systems
  • Using PXI for digital, analog, and RF applications
High performance digital instrumentation and applications:
  • Features and capabilities
  • Using digital instrumentation for video capture / playback and other demanding digital test applications
Building hybrid test systems:
  • Software platforms
  • Incorporating other instrument control busses
  • Integrating receiver interface options as part of a PXI test platform
Who Should Attend:
  • Plant Managers (Production, Operations)
  • Manufacturing Engineers (Industrial, Mechanical, Electrical)
  • Software Engineers/Programmers
  • Test Engineers and Technicians
  • System Integrators
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Next Generation Semiconductor Test Using PXI

Discover the Cost-Reduction Benefits of the PXI Platform

Recent advances in PXI systems and instrumentation now offer semiconductor manufacturers lower cost test solutions for digital, mixed signal and SoC test applications. Read more...

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Integrating PXI Solutions

Discover the Cost-Reduction Benefits of the PXI Platform

The increasing capabilities of PXI systems and instrumentation contitnue to offer manufacturers lower cost test solutions for digital, and mixed signal test applications. Read more...

AFA Air & Space Conference

Sep 17, 2014 10:55 AM

Addressing Obsolescence in Legacy Aircraft Test Equipment

The “Addressing Obsolescence in Legacy Test Equipment” seminar will include the following topics and a participatory discussion of the challenges facing operators of aging military 4th generation aircraft:
  • While the avionics and weapons carried by legacy aircraft still in service have changed over the decades, for the most part the test equipment used to service the aircraft has not kept pace
  • Most operational level armament test solutions offer little more than stray voltage and continuity of circuit testing on the flightline and do not support MIL-STD-1760 functional testing
  • The logistical footprints of many of the existing test equipment solutions is larger than necessary due to outdated design, placing burdens on supply chains and day to day operations

Benefits of attending the seminar:

  • Exchange ideas with operations, maintenance, and industry thought leaders
  • Learn about the challenges facing other operators and maintainers of aging aircraft with regards to armament test equipment
  • Discuss potential solutions to overcome obsolete equipment and to reduce flightline clutter

Who Should Attend?

  • Military Operations, Maintenance, and Sustainment Personnel of aircraft such as the F-22, F-15, F-16, F/A-18, B-2, B-52, B-1, F-4, Hawk, and F-5, etc.
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AFA Air & Space Conference

Sep 16, 2014 9:55 AM

Post SDD Warfighting Enhancements to the F-35

The “Post SDD Warfighting Enhancements for the F-35” seminar will include the following topics and a articipatory discussion of what operators of the F-35 face once the aircraft completes System Design and Development and moves into the IOT&E and IOC phases:
  • During SDD, the F-35 meets and complies with the current written armament O-level test requirements, but as it matures and faces real-world operational use, does the current 2-level sustainment strategy really provide maintainable and sustainable readiness levels for the warfighter?
  • With the reliance on smart weapons using the MIL-STD-1760 bus, can more be done to detect potential problems with the interface aside from stray voltage and continuity before live weapons are loaded on the aircraft?
  • Are options available which could enable more thorough troubleshooting of potential armament related issues that could reduce logistical burdens?

Benefits of attending the seminar:

  • Exchange ideas with operations, maintenance and industry thought leaders on what the F-35 will likely face in terms of operational tempo and warfighting needs post SDD
  • Discuss existing and potential future requirements surrounding armament test for the F-35
  • Gain an understanding of the existing post SDD warfighting enhancements that exist today to mitigate risk as the F-35 reaches IOC

Who Should Attend?

  • Military Operations, Maintenance, and Sustainment Personnel
  • Future operators and maintainers of the F-35
  • Representatives of Partner Nations on the F-35 Program
  • Aerospace Industry leaders responsible for post SDD maintenance and sustainment
  • Test Engineers and Technicians
Marvin Test Systems will be hosting this complimentary seminar during the AFA Space Conference and Technology Exposition.
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