The 49th annual IEEE AUTOTESTCON conference takes place September 16 – 19 in Chicago, Illinois and targets ATE leaders,
commercial and government attendees to explore the latest technologies supporting the production and maintenance of mil-aero products and systems for the military and aerospace
Visit Marvin Test Solutions in Booth 307
This year at AUTOTESTCON, Marvin Test Solutions will be featuring a range of test solutions that demonstrate our continuing commitment to delivering systems that provide outstanding value and performance for our military and aerospace customers.
Visit us in booth 307 to see an array of products supporting operational, intermediate, and depot level test including the MTS-3060 SmartCan™ an innovative universal O-level test set that addresses the armament test gap for 4th and 5th generation fighter aircraft.
Attend our Technical Presentations
Marvin Test Solutions’ CEO, Steve Sargeant, Major General USAF (ret) will be a panelist in Wednesday’s executive plenary "Automatic Testing for the Next Decade - Keeping Pace with the New Military" and will address
"Bridging the Armament Test Gap".
Session time: Wednesday, Sept 18th; 8:30 AM
Additionally, Marvin Test Solutions’ staff will be presenting two papers at this year’s conference:
- "Incorporating Optical Test Capabilities into a Depot Test Platform", by Mike Dewey, Sr. Product Marketing Manager & Lowell Parsons, Sr. Program Manager
Session time: Tuesday, Sept 17th; A1 session, 2:00 PM – 3:30 PM
- "Instrument, Hardware and Software Simulation in a Test System", Ron Yazma, VP of Software Engineering
Session time: Thursday, Sept 19th; A8 session, 10:45 AM – 12:15 PM
For more information about the technical program at AUTOTESTCON, please review AUTOTESTCON's program guide
or email Lori Lai
Download Bridging the Armament Test Gap Now
By Major General Steve Sargeant, USAF (Ret.) and
Mr. Loofie Gutterman