Knowledge Base

Articles

Knowledge base articles covering topics such as integration of Marvin Test Solutions products, new functionality, and frequently asked questions. Articles cover PXI Instruments, ATEasy software, LabView integration, etc. and should be a first stop for anyone with questions.

Presentation: Leveraging the PXI Modular Architecture for Semiconductor ATE Platforms

This presentation focuses on the benefits of the PXI platform for semiconductor test applications.

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Q200305

Feb 24, 2017

How to Modify ATEasy HTML Test Log Tests Table

Example of modifying HTML Test Log in order to add a new column for a time stamp to the tests tables for MinMax and Other test types. Read more...

Q200303

Nov 29, 2016
White Paper

White Paper: Presentation: Leveraging the PXI Modular Architecture for Semiconductor ATE Platforms

This presentation focuses on the benefits of the PXI platform for semiconductor test applications. Read more...

Q200302

Nov 15, 2016
White Paper

Combat Helicopters and Armament Test

This paper examines the evolution of rotary wing aircraft and the challenges of ensuring readiness of their mission-critical armament systems. Read more...

Q200301

Nov 10, 2016
White Paper

White Paper: Using IEEE 1149.1-2013 (JTAG) with ATEasy

This paper provides an overview of how ATEasy can be used to support JTAG / 1149.1 based instrument control, programming and test. Read more...

Q200298

Sep 28, 2016

Using Subversion (SVN) Source Control From ATEasy

Tutorial to describe how to use the ATEasy integrated Source Control interface used to Add, Check In, Check Out, Merge, Show History and more. ATEasy supports two source control clients SCC API and a command line interface. In this example we are using the Subversion Tortoise command-line client. Other clients perform in a similar manner. Read more...

Q200300

Sep 26, 2016
White Paper

White Paper: The Future Direction of Test, Maintenance, and Instrumentation – A Supplier’s Perspective

This presentation focuses on current and future trends and challenges for the Test and Measurement industry Read more...

Q200299

Sep 21, 2016
White Paper

White Paper: Legacy Test Systems - Replace or Maintain

This paper reviews the various options available to test engineers when faced with replacing or maintaining a test system. Read more...

Q200272

Sep 9, 2016

A Sample of ATEasy IDE Customizations

This article discusses some of the ways you can customize the ATEasy Integrated Development Environment (IDE)to improve your development experience. Read more...

Q200297

Jun 28, 2016
White Paper

White Paper: Modernizing Legacy Automated Test Systems for DoD Depots

This paper reviews the requirements and issues associated with depot ATS equipment and will present a technical strategy for the modernization of Automated Test Systems at Tobyhanna Army Depot. Read more...

Q200291

Jun 16, 2016

Solution Spotlight: Cost Effective Functional Test Solutions with ATEasy

This article describes the benefits of ATEasy test management software for functional test ATE. Read more...

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