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Knowledge base articles covering topics such as integration of Marvin Test Solutions products, new functionality, and frequently asked questions. Articles cover PXI Instruments, ATEasy software, LabView integration, etc. and should be a first stop for anyone with questions.

Metal-Oxide (MOX) Gas Sensor Testing

This application note discusses how a semiconductor manufacturer of Gas Sensors employed a focused test solution that provided the required accuracy, accommodated very large site counts, and matched the over-all throughput performance of high performance semiconductor t...

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Q200313

Apr 13, 2018
White Paper

White Paper: Metal-Oxide (MOX) Gas Sensor Testing

This application note discusses how a semiconductor manufacturer of Gas Sensors employed a focused test solution that provided the required accuracy, accommodated very large site counts, and matched the over-all throughput performance of high performance semiconductor test systems at a much lower cost. Read more...

Q200312

Mar 7, 2018

Consolidating Test Resources for Avionics Production Test

The manufacturing and test of avionics products for military and commercial aircraft presents a unique set of requirements and challenges. A common test platform and consolidation of test resources facilitates development and long-term support of complex, high-value assemblies. Read more...

Q200239

Feb 1, 2018

Synchronizing Resource for Multiple UUT Testing

ATEasy offers test programmers the ability to write test programs to test multiple UUTs in Sequential or Parallel. This article presents the synchronization classes and synchronization events used to facilitate multi-UUT test programs. Read more...

Q200311

Dec 18, 2017

Active Power Management for Digital Functional Test Systems

Describes how to implement an active power management system for digital functional test that minimizes power dissipation without sacrificing system performance. Read more...

Q200308

Sep 22, 2017
White Paper

White Paper: Implementing Digital Interfaces with User Programmable FPGAs

This paper will provide an overview of present day digital test interface requirements with a focus on serial digital interfaces which have become increasingly common for the control and monitoring of electronic modules and systems. Read more...

Q200306

Apr 26, 2017

How to Convert C++ Driver Example to LabWindows/CVI

This Knowledge base will give guidance on how to convert Marvin Test Solutions C++ Driver Example to LabWindows/CVI. Read more...

Q200307

Apr 25, 2017

Migrating from ATEasy 2.x to ATEasy 9.0

This article will go over the details of migration from ATEasy 2.x to ATEasy 9.0. During the process or migration the differences between the two will be discussed. Read more...

Q200305

Nov 9, 2017

How to Modify ATEasy HTML Test Log Tests Table

Example of modifying HTML Test Log in order to add a new column for a time stamp to the tests tables for MinMax and Other test types. Read more...

Q200303

Nov 29, 2016
White Paper

White Paper: Presentation: Leveraging the PXI Modular Architecture for Semiconductor ATE Platforms

This presentation focuses on the benefits of the PXI platform for semiconductor test applications. Read more...

Q200302

Nov 15, 2016
White Paper

Combat Helicopters and Armament Test

This paper examines the evolution of rotary wing aircraft and the challenges of ensuring readiness of their mission-critical armament systems. Read more...

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