Presentation: Leveraging the PXI Modular Architecture for Semiconductor ATE Platforms

Knowledge Base Article # Q200303

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Summary This presentation focuses on the benefits of the PXI platform for semiconductor test applications.

Leveraging the PXI Modular Architecture for ATE Platforms

The PXI platform presents a flexible, innovative, cost-effective alternative to big-iron ATE systems for semiconductor test. Marvin Test Solutions offers a range of advanced, PXI-based test system configurations for digital, mixed-signal and RF test applications.

Originally presented at International Test Conference 2016.

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Article Date 11/29/2016 10:53:27 AM     Updated: 11/29/2016 10:55:28 AM
Keywords ATE. semiconductor, digital, RF, mixed-signal, PXI

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