PXI - Based Semiconductor Test Systems: Advanced Test Capabilities and Features
PXI-Based Semiconductor Test Systems The ongoing challenge for today’s semiconductor test engineers is to identify and create new test solutions that can offer significantly lower test costs as well as address the need for configurable, open-architecture, flexible test solutions that can provide comparable features to proprietary ATE platforms.

In particular, for test requirements with low to moderate volumes - i.e. pilot production, verification, and focused production test applications, the need for flexible and cost effective ATE solutions is particularly acute. For these applications, test engineers historically have relied upon legacy test systems which have a low acquisition cost but high operating costs or in-house designed, rack and stack solutions.

With timing per pin, PMU per pin, and advanced software tools, the advancements in PXI- based semiconductor test system solutions can offer test engineers the flexibility and performance for both current and future test needs. To learn more, read our white paper.

Please complete the form to download the complete White Paper or our ITC 2015 presentation.

Download the presentation, "Leveraging Open Architecture, Modular Test Platforms for ATE"

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Download "PXI–Based Semiconductor Test Systems: Advanced Test Capabilities and Features"

PXI–Based Semiconductor Test Systems: Advanced Test Capabilities and Features
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