To optimize safety when measuring voltages in high-energy distribution circuits, read and use the directions in the following warning.
Warning - Dangerous arcs of an explosive
nature in a high-energy circuit can cause severe personal injury or death.
If the Multimeter is connected to a high-energy circuit when set to a
current range or low resistance range, the circuit is virtually shorted.
Dangerous arcing can result even when the Multimeter is set to a voltage
range if the minimum voltage spacing is reduced in the external connections.
As described in the International Electro Technical
Commission (IEC) Standard IEC 61010-1:2001, the GX2065’s measurement inputs
are rated for Category II measurements...
When making measurements in high energy circuits, use test leads that meet the following requirements:
Test leads should be fully insulated
Only use test leads that can be connected to the circuit (e.g., alligator clips, spade lugs, etc.) for hands-off measurements.
Do not use test leads that decrease voltage spacing. These diminish arc protection and create a hazardous condition.
Warning
- For the front panel inputs, the maximum common-mode voltage (voltage
between INPUT LO and the chassis ground) is 300VDC or rms. Exceeding this
value may cause a breakdown in insulation, creating a shock hazard.
Use the following sequence when testing power circuits:
1. De-energize the circuit using the regular installed connect-disconnect device, for example, by removing the device's power cord or by turning off the power switch.
2. Attach the test leads to the circuit under test. Use appropriate safety rated test leads for this application. If over 42V, uses double insulated test leads or add an additional insulation barrier for the operator.
3. Set the Multimeter to the proper function and range.
4. Energize the circuit using the installed connect-disconnect device and make measurements without disconnecting the Multimeter.
5. De-energize the circuit using the installed connect-disconnect device.
6. Disconnect the test leads from the circuit under test.