Performs a self-test to validate the card functionality and accuracy.
GxAoSelfTest (nHandle,padwTestResult, pszTestResult, pnStatus)
Name |
Type |
Description |
nHandle |
SHORT |
Handle to a GX1649 or GX1632e board. |
padwTestResult |
PDWORD |
Returns an array that contains the result of the self-test. The size of the array depends upon board. See comments below. |
pszTestResult |
PSTR |
Returns a string that summarizes the result of the self-test. |
pnStatus |
PSHORT |
Returned status: 0 on success, negative number on failure. |
The self-test performs the following tests:
Output voltage test for each of the channels (4 Groups of 8 or 16 Channels) and verification of accuracy within 5mV
ARB memory test for each Group (Group A to Group D).
DIO input, output, and direction memory tests
Dynamic DIO test (internal loopback)
The test result is returned in a DWORD array. The size varies based on the board type used. Each element is an individual test result.
This test will change the voltage range of the GX1632e to +/- 25 Volts.
GX1649:
Elements 0 to 63 are the test results from the channel voltage output tests, element 64 to 67 are the ARB Group A to Group D memory tests, element 68 is the DIO Input Memory test, element 69 is the DIO Output Memory test, element 70 is the DIO Direction memory test and element 71 is the DIO Dynamic test.
Element |
Test Type |
Results |
0 to 15 |
Group A Channels 0-15 Output Tests |
Pass=0, Fail=1 |
16 to 31 |
Group B Channels 0-15 Output Tests |
Pass=0, Fail=1 |
32 to 47 |
Group C Channels 0-15 Output Tests |
Pass=0, Fail=1 |
48 to 63 |
Group D Channels 0-15 Output Tests |
Pass=0, Fail=1 |
64 |
ARB Group A Memory Test |
Pass=0, Fail=1 |
65 |
ARB Group B Memory Test |
Pass=0, Fail=1 |
66 |
ARB Group C Memory Test |
Pass=0, Fail=1 |
67 |
ARB Group D Memory Test |
Pass=0, Fail=1 |
68 |
DIO Input Memory Test |
Pass=0, Fail=1 |
69 |
DIO Output Memory Test |
Pass=0, Fail=1 |
70 |
DIO Direction Memory Test |
Pass=0, Fail=1 |
71 |
DIO Dyanmic IO Test |
Pass=0, Fail=1 |
GX1632e:
Elements 0 to 31 are the test results from the channel voltage output tests.
Element |
Test Type |
Results |
0 to 7 |
Group A Channels 0-7 Output Tests |
Pass=0, Fail=1 |
8 to 15 |
Group B Channels 0-7 Output Tests |
Pass=0, Fail=1 |
16 to 23 |
Group C Channels 0-7 Output Tests |
Pass=0, Fail=1 |
24 to 31 |
Group D Channels 0-7 Output Tests |
Pass=0, Fail=1 |
Ensure that the front panel connector is not connected before starting the self-test.
The following example performs a self-test:
SHORT nStatus;
DWORD adwTestResult[72];
CHAR szTestResult[512];
GxAoSelfTest (nHandle, adwTestResult, szTestResult &nStatus);
if (adwTestResults[17]!=0)
printf(“Group B, Channel 1 output voltage test failure”);