TANGO Test Log

Company : THALES AIR DEFENCE
Project : TANGO Aquila Test Bench
Program : STAR_DG_NR_TEST 47 068 402
Serial Number : 3
Start Time : 12/11/13   15:37:29

Task 2 : CKTST 2 : POWER SUPPLY TEST

# Name Pin Unit Min Max Result Status
001 test 2_1 : +5 V voltage short circuit P1-36/P1-37 Ohm 300.000 359.507 Pass
002 test 2_2 : +15 V voltage short circuit P1-40/P1-41 Ohm 300.000 388.026 Pass
003 test 2_3 : -5,2 V voltage short circuit P1-46/P1-47 Ohm 30000.000 33516.750 Pass
# Name Pin Unit Tolerence Value Result Status
004 test 2_4 : +5 V current level P1-36/P1-37 Amp +/ -0.200 0.860 1.089 Fail*
005 test 2_5 : +15 V current level P1-40/P1-41 Amp +/ -0.050 0.531 0.556 Pass
006 test 2_6 : -5,2 V current level P1-46/P1-47 Amp +/ -0.050 0.153 0.167 Pass
007 test 2_7 : +5 V power supply voltage P1-36/P1-37 Volt +/ -0.250 5.000 5.241 Pass
008 test 2_8 : +15 V power supply voltage P1-40/P1-41 Volt +/ -0.750 15.000 15.206 Pass
009 test 2_9 : -5,2 V power supply voltage P1-46/P1-47 Volt +/ -0.250 -5.200 -5.189 Pass

Task 3 : CKTST 3 : J3, J4, J7 AND J9 OUTPUT TEST

# Name Pin Unit Tolerence Value Result Status
001 test 3_1A : J3 (H30_REF_1) output power test J3 dBm +/ -1.000 2.000 1.929 Pass
002 test 3_1B : J3 (H30_REF_1) frequency test J3 MHZ +/ -0.100 31.080 31.080 Pass
003 test 3_2A : J4 (H30_REF_2) output power test J4 dBm +/ -1.000 10.000 9.948 Pass
004 test 3_2B : J4 (H30_REF_2) frequency test J4 MHZ +/ -0.100 31.080 31.079 Pass
# Name Pin Unit Min Max Result Status
005 test 3_3A1 : J7 (HCD_RES) output clock TTL high level test J7 Volt 1.600 4.550 Pass
006 test 3_3A2 : J7 (HCD_RES) output clock TTL low level test J7 Volt 0.800 0.190 Pass
# Name Pin Unit Tolerence Value Result Status
007 test 3_3B : J7 (HCD_RES) frequency test J7 MHZ +/ -0.100 1.295 0.155 Fail*
# Name Pin Unit Min Max Result Status
008 test 3_4A1 : J9 (H20_RES_OUT) output clock TTL high level test J9 Volt 1.600 4.250 Pass
009 test 3_4A2 : J9 (H20_RES_OUT) output clock TTL low level test J9 Volt 0.800 0.000 Pass
# Name Pin Unit Tolerence Value Result Status
010 test 3_4B : J9 (H20_RES_OUT) frequency test J9 MHZ +/ -0.100 20.720 20.720 Pass
011 test 3_5 : J7 (HCD_RES_OUT) output clock delay test J7 uSec +/ -0.150 1.500 1.484 Pass
012 test 3_6 : J9 (H20_RES_OUT) output clock delay test J9 nSec +/ -70.000 720.000 750.444 Pass

Task 3 : CKTST 3 : J3, J4, J7 AND J9 OUTPUT TEST

# Name Pin Unit Tolerence Value Result Status
001 test 3_1A : J3 (H30_REF_1) output power test J3 dBm +/ -1.000 2.000 2.015 Pass
002 test 3_1B : J3 (H30_REF_1) frequency test J3 MHZ +/ -0.100 31.080 31.080 Pass
003 test 3_2A : J4 (H30_REF_2) output power test J4 dBm +/ -1.000 10.000 10.014 Pass
004 test 3_2B : J4 (H30_REF_2) frequency test J4 MHZ +/ -0.100 31.080 31.080 Pass
# Name Pin Unit Min Max Result Status
005 test 3_3A1 : J7 (HCD_RES) output clock TTL high level test J7 Volt 1.600 2.470 Pass
006 test 3_3A2 : J7 (HCD_RES) output clock TTL low level test J7 Volt 0.800 0.060 Pass
# Name Pin Unit Tolerence Value Result Status
007 test 3_3B : J7 (HCD_RES) frequency test J7 MHZ +/ -0.100 1.295 1.295 Pass
# Name Pin Unit Min Max Result Status
008 test 3_4A1 : J9 (H20_RES_OUT) output clock TTL high level test J9 Volt 1.600 4.280 Pass
009 test 3_4A2 : J9 (H20_RES_OUT) output clock TTL low level test J9 Volt 0.800 0.000 Pass
# Name Pin Unit Tolerence Value Result Status
010 test 3_4B : J9 (H20_RES_OUT) frequency test J9 MHZ +/ -0.100 20.720 20.714 Pass
011 test 3_5 : J7 (HCD_RES_OUT) output clock delay test J7 uSec +/ -0.150 1.500 1.453 Pass
012 test 3_6 : J9 (H20_RES_OUT) output clock delay test J9 nSec +/ -70.000 720.000 704.771 Pass

Task 4 : CKTST 4 : Sy0 OUTPUT TEST

# Name Pin Unit Min Max Result Status
001 test 4_1A : Sy0 duration(with bus-ci = 00 H) P1-1 0.000 0.000 0.000 Pass
# Name Pin Unit Tolerence Value Result Status
002 test 4_2A : Sy0 duration(with bus-ci = 01 H) P1-1 uSec +/ -0.100 1.496 1.489 Pass
003 test 4_2B: Sy0 delay from SYGENE(with bus-ci = 01 H) P1-1 nSec +/ -0.020 0.160 0.225 Fail*
# Name Pin Unit Min Max Result Status
004 test 4_3A : Sy0 duration(with bus-ci = 02 H) P1-1 uSec 0.000 0.000 0.000 Pass
# Name Pin Unit Tolerence Value Result Status
005 test 4_4A : Sy0 duration(with bus-ci = 03 H) P1-1 uSec +/ -0.100 75.336 75.332 Pass
006 test 4_4B: Sy0 delay from SYGENE(with bus-ci = 03 H) P1-1 uSec +/ -0.020 0.160 0.227 Fail*
# Name Pin Unit Min Max Result Status
007 test 4_5A : Sy0 duration(with bus-ci = 04 H) P1-1 uSec 0.000 0.000 0.000 Pass
# Name Pin Unit Tolerence Value Result Status
008 test 4_6A : Sy0 duration(with bus-ci = 05 H) P1-1 uSec +/ -0.100 98.336 98.355 Pass
009 test 4_6B: Sy0 delay from SYGENE(with bus-ci = 05 H) P1-1 uSec +/ -0.020 0.160 0.202 Fail*
# Name Pin Unit Min Max Result Status
010 test 4_7A: Sy0 duration(with bus-ci = 06 H) P1-1 uSec 0.000 0.000 0.000 Pass
# Name Pin Unit Tolerence Value Result Status
011 test 4_8A : Sy0 duration(with bus-ci = 07 H) P1-1 uSec +/ -0.100 75.336 74.949 Fail*
012 test 4_8B : Sy0 delay from SYGENE(with bus-ci = 07 H) P1-1 uSec +/ -0.020 0.160 0.202 Fail*

Task 4 : CKTST 4 : Sy0 OUTPUT TEST

# Name Pin Unit Min Max Result Status
001 test 4_1A : Sy0 duration(with bus-ci = 00 H) P1-1 0.000 0.000 0.000 Pass
# Name Pin Unit Tolerence Value Result Status
002 test 4_2A : Sy0 duration(with bus-ci = 01 H) P1-1 uSec +/ -0.100 1.496 0.228 Fail*
003 test 4_2B: Sy0 delay from SYGENE(with bus-ci = 01 H) P1-1 nSec +/ -0.020 0.160 0.228 Fail*
011 test 4_8A : Sy0 duration(with bus-ci = 07 H) P1-1 uSec +/ -0.100 75.336 74.966 Fail*
012 test 4_8B : Sy0 delay from SYGENE(with bus-ci = 07 H) P1-1 uSec +/ -0.020 0.160 0.202 Fail*

Task 5 : CKTST 5 : EXTERNAL PHASE TEST

# Name Pin - Value - Result Status
001 test 5_1 : J35 output external phase test (ci=07,without accumulation) J35 - "Correct" - "Correct" Pass
002 test 5_2 : J35 output external phase test (ci=07,with accumulation) J35 - "Correct" - "Correct" Pass
003 test 5_3 : J35 output external phase test (ci=06,without accumulation) J35 - "Correct" - "Correct" Pass
004 test 5_4 : J35 output external phase test (ci=06,with accumulation) J35 - "Correct" - "Correct" Pass

Task 6 : CKTST 6: IMPULSE TIMAL TEST

# Name Pin Unit Tolerence Value Result Status
001 test 6_1A : J1 output signal DURATION test (with bus-ci = 00 H) J1 uSec +/ -0.100 1.000 0.997 Pass
002 test 6_1B : J1 output signal DELAY test (with bus-ci = 00 H) J1 uSec +/ -0.020 1.353 1.407 Fail*
003 test 6_2A : J1 output signal DURATION test (with bus-ci = 01 H) J1 uSec +/ -0.100 1.700 1.691 Pass
004 test 6_2B : J1 output signal DELAY test (with bus-ci = 01 H) J1 uSec +/ -0.020 5.649 5.708 Fail*
005 test 6_3A : J1 output signal DURATION test (with bus-ci = 02 H) J1 uSec +/ -0.100 3.090 3.055 Pass
006 test 6_3B : J1 output signal DELAY test (with bus-ci = 02 H) J1 uSec +/ -0.200 1.353 1.430 Fail*
007 test 6_4A : J1 output signal DURATION test (with bus-ci = 03 H) J1 uSec +/ -0.200 75.600 75.566 Pass
008 test 6_4B : J1 output signal DELAY test (with bus-ci = 03 H) J1 uSec +/ -0.020 5.213 5.708 Fail*
009 test 6_5A: J1 output signal DURATION test (with bus-ci = 04 H) J1 uSec +/ -0.200 74.900 74.893 Pass
010 test 6_5B: J1 output signal DELAY test (with bus-ci = 04 H) J1 uSec +/ -0.020 1.353 1.436 Fail*
011 test 6_6A : J1 output signal DURATION test (with bus-ci = 05 H) J1 uSec +/ -0.200 98.600 98.599 Pass
012 test 6_6B : J1 output signal DELAY test (with bus-ci = 05 H) J1 uSec +/ -0.020 5.649 5.685 Fail*
013 test 6_7A : J1 output signal DURATION test (with bus-ci = 06 H) J1 uSec +/ -0.200 97.900 97.869 Pass
014 test 6_7B : J1 output signal DELAY test (with bus-ci = 06 H) J1 uSec +/ -0.020 1.353 1.426 Fail*
015 test 6_8A : J1 output signal DURATION test (with bus-ci = 07 H) J1 uSec +/ -0.200 75.600 75.563 Pass
016 test 6_8B : J1 output signal DELAY test (with bus-ci = 07 H) J1 uSec +/ -0.020 5.649 5.296 Fail*

Task 7 : CKTST 7: J1 OUTPUT POWER TEST

# Name Pin Unit Tolerence Value Result Status
001 test 7_1 : J1 output power level (with bus-ci = 00 H) J1 dBm +/ -0.500 10.000 10.409 Pass
002 test 7_2 : J1 output power level (with bus-ci = 01 H) J1 dBm +/ -0.500 10.000 10.183 Pass
003 test 7_3 : J1 output power level (with bus-ci = 02 H) J1 dBm +/ -0.500 10.000 10.046 Pass
004 test 7_4 : J1 output power level (with bus-ci = 03 H) J1 dBm +/ -0.500 10.000 9.976 Pass
005 test 7_5 : J1 output power level (with bus-ci = 04 H) J1 dBm +/ -0.500 10.000 9.816 Pass
006 test 7_6 : J1 output power level (with bus-ci = 05 H) J1 dBm +/ -0.500 10.000 9.902 Pass
007 test 7_7 : J1 output power level (with bus-ci = 06 H) J1 dBm +/ -0.500 10.000 9.921 Pass
008 test 7_8 : J1 output power level (with bus-ci = 07 H) J1 dBm +/ -0.500 10.000 -37.204 Fail*

Task 8 : CKTST 8 : J1 OUTPUT SIGNAL FREQUENTIAL TEST

# Name Pin - Value - Result Status
001 test 8_1 : J1 output signal (with bus-ci = 00 H) J1 - "Correct" - "Correct" Pass
002 test 8_2 : J1 output signal (with bus-ci = 01 H) J1 - "Correct" - "Correct" Pass
003 test 8_3 : J1 output signal (with bus-ci = 02 H) J1 - "Correct" - "Correct" Pass
004 test 8_4 : J1 output signal (with bus-ci = 03 H) J1 - "Correct" - "Correct" Pass
005 test 8_5 : J1 output signal (with bus-ci = 04 H) J1 - "Correct" - "Correct" Pass
006 test 8_6 : J1 output signal (with bus-ci = 05 H) J1 - "Correct" - "Correct" Pass
007 test 8_7A : J1 output signal (with bus-ci = 06 H) J1 - "Correct" - "Correct" Pass
# Name Pin Unit Tolerence Value Result Status
008 test 8_7B : J1 output signal 0.3dB bandwidth(with bus-ci = 06 H) J1 KHZ +/ -0.150 1.500 1.516 Pass
# Name Pin - Value - Result Status
009 test 8_8A : J1 output signal (with bus-ci = 07 H) J1 - "Correct" - "Correct" Pass
# Name Pin Unit Min Max Result Status
010 test 8_8B : J1 output signal parasites strip test (with bus-ci = 07 H) J1 dBc 70.000 70.222 Pass

Task 8 : CKTST 8 : J1 OUTPUT SIGNAL FREQUENTIAL TEST

# Name Pin - Value - Result Status
009 test 8_8A : J1 output signal (with bus-ci = 07 H) J1 - "Correct" - "Not correct" Fail*
# Name Pin Unit Min Max Result Status
010 test 8_8B : J1 output signal parasites strip test (with bus-ci = 07 H) J1 dBc 70.000 69.892 Fail*