| Company | : THALES AIR DEFENCE |
|
| Project | : TANGO Aquila Test Bench | |
| Program | : STAR_DG_NR_TEST | |
| Serial Number | : 3 | |
| Start Time | : 12/16/13 08:12:25 |
| # | Name | Pin | - | Value | - | Result | Status |
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| 001 | test 1_1 : external check | - | "Correct" | - | "Correct" | Pass |
| # | Name | Pin | Unit | Min | Max | Result | Status |
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| 001 | test 2_1 : +5 V voltage short circuit | P1-36/P1-37 | Ohm | 300.000 | 360.080 | Pass |
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| 002 | test 2_2 : +15 V voltage short circuit | P1-40/P1-41 | Ohm | 300.000 | 388.634 | Pass |
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| 003 | test 2_3 : -5,2 V voltage short circuit | P1-46/P1-47 | Ohm | 30000.000 | 33909.930 | Pass |
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| # | Name | Pin | Unit | Tolerence | Value | Result | Status |
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| 004 | test 2_4 : +5 V current level | P1-36/P1-37 | Amp | +/ -0.300 | 0.900 | 1.050 | Pass |
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| 005 | test 2_5 : +15 V current level | P1-40/P1-41 | Amp | +/ -0.100 | 0.531 | 0.551 | Pass |
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| 006 | test 2_6 : -5,2 V current level | P1-46/P1-47 | Amp | +/ -0.050 | 0.153 | 0.168 | Pass |
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| 007 | test 2_7 : +5 V power supply voltage | P1-36/P1-37 | Volt | +/ -0.250 | 5.000 | 5.240 | Pass |
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| 008 | test 2_8 : +15 V power supply voltage | P1-40/P1-41 | Volt | +/ -0.750 | 15.000 | 15.203 | Pass |
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| 009 | test 2_9 : -5,2 V power supply voltage | P1-46/P1-47 | Volt | +/ -0.250 | -5.200 | -5.190 | Pass |
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| # | Name | Pin | Unit | Tolerence | Value | Result | Status |
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| 001 | test 3_1A : J3 (H30_REF_1) output power test | J3 | dBm | +/ -1.000 | 2.000 | 1.961 | Pass |
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| 002 | test 3_1B : J3 (H30_REF_1) frequency test | J3 | MHZ | +/ -0.100 | 31.080 | 31.080 | Pass |
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| 003 | test 3_2A : J4 (H30_REF_2) output power test | J4 | dBm | +/ -1.000 | 10.000 | 10.041 | Pass |
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| 004 | test 3_2B : J4 (H30_REF_2) frequency test | J4 | MHZ | +/ -0.100 | 31.080 | 31.079 | Pass |
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| # | Name | Pin | Unit | Min | Max | Result | Status |
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| 005 | test 3_3A1 : J7 (HCD_RES) output clock TTL high level test | J7 | Volt | 1.600 | 2.770 | Pass |
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| 006 | test 3_3A2 : J7 (HCD_RES) output clock TTL low level test | J7 | Volt | 0.800 | 0.090 | Pass |
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| # | Name | Pin | Unit | Tolerence | Value | Result | Status |
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| 007 | test 3_3B : J7 (HCD_RES) frequency test | J7 | MHZ | +/ -0.100 | 1.295 | 1.295 | Pass |
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| # | Name | Pin | Unit | Min | Max | Result | Status |
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| 008 | test 3_4A1 : J9 (H20_RES_OUT) output clock TTL high level test | J9 | Volt | 1.600 | 4.350 | Pass |
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| 009 | test 3_4A2 : J9 (H20_RES_OUT) output clock TTL low level test | J9 | Volt | 0.800 | 0.030 | Pass |
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| # | Name | Pin | Unit | Tolerence | Value | Result | Status |
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| 010 | test 3_4B : J9 (H20_RES_OUT) frequency test | J9 | MHZ | +/ -0.100 | 20.720 | 20.710 | Pass |
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| 011 | test 3_5 : J7 (HCD_RES_OUT) output clock delay test | J7 | uSec | +/ -0.150 | 1.500 | 1.460 | Pass |
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| 012 | test 3_6 : J9 (H20_RES_OUT) output clock delay test | J9 | nSec | +/ -70.000 | 720.000 | 707.000 | Pass |
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| # | Name | Pin | Unit | Min | Max | Result | Status |
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| 001 | test 4_1A : Sy0 duration(with bus-ci = 00 H) | P1-1 | 0.000 | 0.000 | 0.000 | Pass |
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| # | Name | Pin | Unit | Tolerence | Value | Result | Status |
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| 002 | test 4_2A : Sy0 duration(with bus-ci = 01 H) | P1-1 | uSec | +/ -0.100 | 1.496 | 1.482 | Pass |
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| 003 | test 4_2B: Sy0 delay from SYGENE(with bus-ci = 01 H) | P1-1 | uSec | +/ -0.050 | 0.190 | 0.204 | Pass |
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| # | Name | Pin | Unit | Min | Max | Result | Status |
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| 004 | test 4_3A : Sy0 duration(with bus-ci = 02 H) | P1-1 | uSec | 0.000 | 0.000 | 0.000 | Pass |
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| # | Name | Pin | Unit | Tolerence | Value | Result | Status |
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| 005 | test 4_4A : Sy0 duration(with bus-ci = 03 H) | P1-1 | uSec | +/ -0.100 | 75.336 | 75.431 | Pass |
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| 006 | test 4_4B: Sy0 delay from SYGENE(with bus-ci = 03 H) | P1-1 | uSec | +/ -0.050 | 0.190 | 0.236 | Pass |
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| # | Name | Pin | Unit | Min | Max | Result | Status |
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| 007 | test 4_5A : Sy0 duration(with bus-ci = 04 H) | P1-1 | uSec | 0.000 | 0.000 | 0.000 | Pass |
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| # | Name | Pin | Unit | Tolerence | Value | Result | Status |
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| 008 | test 4_6A : Sy0 duration(with bus-ci = 05 H) | P1-1 | uSec | +/ -0.100 | 98.336 | 98.350 | Pass |
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| 009 | test 4_6B: Sy0 delay from SYGENE(with bus-ci = 05 H) | P1-1 | uSec | +/ -0.050 | 0.190 | 0.212 | Pass |
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| # | Name | Pin | Unit | Min | Max | Result | Status |
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| 010 | test 4_7A: Sy0 duration(with bus-ci = 06 H) | P1-1 | uSec | 0.000 | 0.000 | 0.000 | Pass |
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| # | Name | Pin | Unit | Tolerence | Value | Result | Status |
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| 011 | test 4_8A : Sy0 duration(with bus-ci = 07 H) | P1-1 | uSec | +/ -0.100 | 75.336 | 75.350 | Pass |
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| 012 | test 4_8B : Sy0 delay from SYGENE(with bus-ci = 07 H) | P1-1 | uSec | +/ -0.050 | 0.190 | 0.211 | Pass |
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| # | Name | Pin | - | Value | - | Result | Status |
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| 001 | test 5_1 : J35 output external phase test (ci=07,without accumulation) | J35 | - | "Correct" | - | "Correct" | Pass |
| 002 | test 5_2 : J35 output external phase test (ci=07,with accumulation) | J35 | - | "Correct" | - | "Correct" | Pass |
| 003 | test 5_3 : J35 output external phase test (ci=06,without accumulation) | J35 | - | "Correct" | - | "Correct" | Pass |
| 004 | test 5_4 : J35 output external phase test (ci=06,with accumulation) | J35 | - | "Correct" | - | "Correct" | Pass |
| # | Name | Pin | Unit | Tolerence | Value | Result | Status |
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| 001 | test 6_1A : J1 output signal DURATION test (with bus-ci = 00 H) | J1 | uSec | +/ -0.100 | 1.000 | 0.942 | Pass |
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| 002 | test 6_1B : J1 output signal DELAY test (with bus-ci = 00 H) | J1 | uSec | +/ -0.050 | 1.380 | 1.404 | Pass |
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| 003 | test 6_2A : J1 output signal DURATION test (with bus-ci = 01 H) | J1 | uSec | +/ -0.100 | 1.700 | 1.705 | Pass |
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| 004 | test 6_2B : J1 output signal DELAY test (with bus-ci = 01 H) | J1 | uSec | +/ -0.050 | 5.650 | 5.653 | Pass |
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| 005 | test 6_3A : J1 output signal DURATION test (with bus-ci = 02 H) | J1 | uSec | +/ -0.100 | 3.090 | 3.073 | Pass |
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| 006 | test 6_3B : J1 output signal DELAY test (with bus-ci = 02 H) | J1 | uSec | +/ -0.050 | 1.380 | 1.419 | Pass |
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| 007 | test 6_4A : J1 output signal DURATION test (with bus-ci = 03 H) | J1 | uSec | +/ -0.200 | 75.600 | 75.566 | Pass |
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| 008 | test 6_4B : J1 output signal DELAY test (with bus-ci = 03 H) | J1 | uSec | +/ -0.050 | 5.650 | 5.672 | Pass |
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| 009 | test 6_5A: J1 output signal DURATION test (with bus-ci = 04 H) | J1 | uSec | +/ -0.200 | 74.900 | 74.893 | Pass |
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| 010 | test 6_5B: J1 output signal DELAY test (with bus-ci = 04 H) | J1 | uSec | +/ -0.050 | 1.380 | 1.407 | Pass |
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| 011 | test 6_6A : J1 output signal DURATION test (with bus-ci = 05 H) | J1 | uSec | +/ -0.200 | 98.600 | 98.599 | Pass |
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| 012 | test 6_6B : J1 output signal DELAY test (with bus-ci = 05 H) | J1 | uSec | +/ -0.050 | 5.650 | 5.667 | Pass |
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| 013 | test 6_7A : J1 output signal DURATION test (with bus-ci = 06 H) | J1 | uSec | +/ -0.200 | 97.900 | 97.869 | Pass |
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| 014 | test 6_7B : J1 output signal DELAY test (with bus-ci = 06 H) | J1 | uSec | +/ -0.050 | 1.380 | 1.397 | Pass |
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| 015 | test 6_8A : J1 output signal DURATION test (with bus-ci = 07 H) | J1 | uSec | +/ -0.200 | 75.600 | 75.621 | Pass |
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| 016 | test 6_8B : J1 output signal DELAY test (with bus-ci = 07 H) | J1 | uSec | +/ -0.050 | 5.650 | 5.691 | Pass |
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| # | Name | Pin | Unit | Tolerence | Value | Result | Status |
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| 001 | test 7_1 : J1 output power level (with bus-ci = 00 H) | J1 | dBm | +/ -0.500 | 10.000 | 10.301 | Pass |
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| 002 | test 7_2 : J1 output power level (with bus-ci = 01 H) | J1 | dBm | +/ -0.500 | 10.000 | 10.281 | Pass |
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| 003 | test 7_3 : J1 output power level (with bus-ci = 02 H) | J1 | dBm | +/ -0.500 | 10.000 | 10.024 | Pass |
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| 004 | test 7_4 : J1 output power level (with bus-ci = 03 H) | J1 | dBm | +/ -0.500 | 10.000 | 10.102 | Pass |
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| 005 | test 7_5 : J1 output power level (with bus-ci = 04 H) | J1 | dBm | +/ -0.500 | 10.000 | 10.156 | Pass |
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| 006 | test 7_6 : J1 output power level (with bus-ci = 05 H) | J1 | dBm | +/ -0.500 | 10.000 | 10.149 | Pass |
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| 007 | test 7_7 : J1 output power level (with bus-ci = 06 H) | J1 | dBm | +/ -0.500 | 10.000 | 10.129 | Pass |
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| 008 | test 7_8 : J1 output power level (with bus-ci = 07 H) | J1 | dBm | +/ -0.500 | 10.000 | 10.086 | Pass |
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| # | Name | Pin | - | Value | - | Result | Status |
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| 001 | test 8_1 : J1 output signal (with bus-ci = 00 H) | J1 | - | "Correct" | - | "Correct" | Pass |
| 002 | test 8_2 : J1 output signal (with bus-ci = 01 H) | J1 | - | "Correct" | - | "Correct" | Pass |
| 003 | test 8_3 : J1 output signal (with bus-ci = 02 H) | J1 | - | "Correct" | - | "Correct" | Pass |
| 004 | test 8_4 : J1 output signal (with bus-ci = 03 H) | J1 | - | "Correct" | - | "Correct" | Pass |
| 005 | test 8_5 : J1 output signal (with bus-ci = 04 H) | J1 | - | "Correct" | - | "Correct" | Pass |
| 006 | test 8_6 : J1 output signal (with bus-ci = 05 H) | J1 | - | "Correct" | - | "Correct" | Pass |
| 007 | test 8_7A : J1 output signal (with bus-ci = 06 H) | J1 | - | "Correct" | - | "Correct" | Pass |
| # | Name | Pin | Unit | Tolerence | Value | Result | Status |
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| 008 | test 8_7B : J1 output signal 0.3dB bandwidth(with bus-ci = 06 H) | J1 | MHZ | +/ -0.150 | 1.500 | 1.519 | Pass |
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| # | Name | Pin | - | Value | - | Result | Status |
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| 009 | test 8_8A : J1 output signal (with bus-ci = 07 H) | J1 | - | "Correct" | - | "Correct" | Pass |
| # | Name | Pin | Unit | Min | Max | Result | Status |
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| 010 | test 8_8B : J1 output signal parasites strip test (with bus-ci = 07 H) | J1 | dBc | 70.000 | 70.158 | Pass |
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| # | Name | Pin | Unit | Min | Max | Result | Status |
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| 001 | test 9_1 : Geldti static test TTL high | P1-5 | Volt | 1.600 | 2.473 | Pass |
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| 002 | test 9_1 : Geldti static test TTL low | P1-5 | Volt | 0.800 | 0.127 | Pass |
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| 003 | test 9_2A : Correct Agen static test | P1-8 | Volt | 2.000 | 2.968 | Pass |
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| 004 | test 9_2B : Correct Pgen static test | P1-7 | Volt | 0.800 | 0.270 | Pass |
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| 005 | test 9_3A : False Agen static test | P1-8 | Volt | 0.800 | 0.223 | Pass |
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| 006 | test 9_3B : False Pgen static test | P1-7 | Volt | 2.000 | 2.998 | Pass |
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| # | Test Name | Pin | Result | Status |
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| 001 | Final operation | - | - | - |