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At this year's Productronica 2009 tradeshow, which is being held at the New Munich Trade Fair Center, Geotest will be showcasing PXI test systems and hardware / software products for functional test. You can see Geotest products at the Pruftechnik Schneider & Koch booth, located in Hall A1, booth 459.  
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New additions to our product line include the GX3500, a user programmable PXI FPGA card for digital and mixed signal test applications. We will also be showcasing our expanded line of Geotest Basic Automated Test Systems (GBATS), our enhanced 3U PXI digital I/O cards, and DtifEasy - our full-featured LASAR post-processor and test execution software. Make sure to visit the S&K booth # A1:459 for a demonstration and in-depth review of our hardware and software products. Whether you’re looking for system components or a complete system solution, Geotest can help give your next test system project a head start.

Productronica Product Highlights
New PXI Flex DIO FPGA Card
Geotest has just introduced the new GX3500 - a user programmable FPGA card which supports 160 I/O connections for custom digital interface applications. The card employs the Altera Cyclone III FPGA which can support clock rates up to 150 MHz and features over 55,000 logic elements and 2.3 Mb of memory. The GX3500 also supports expansion card assemblies (daughter boards) which can be used to customize the interface to the UUT, unlike other solutions which require bulky add-on boards that reside outside of the module.

Unlike other PXI FPGA cards which require proprietary FPGA design tools, users can employ Altera's free Quartus II Web Edition tool set for creating FPGA designs. Once the user has compiled the FPGA design, the image can be loaded into the FPGA via the PXI bus interface or via an on-board EEROM. The GX3500 offers outstanding value and performance and is supplied with a complete driver set which includes tools for downloading the compiled FPGA code as well as providing register read and write functionality.

Geotest Basic Automated Test System (GBATS) Platform Now Offered in Additional Configurations
Based on Geotest's GX7102A PXI chassis, the GBATS modular test platform features a preconfigured, compact, 3U / 6U system that includes all of the required functionality needed to support the development and deployment of functional test applications including a system self-test and a high pin count tester interface.

Building on the initial market acceptance of the GBATS TS-775 for military avionics applications and the TS-720 for functional test / boundary scan applications, four new market focused GBATS test systems are now available. And like all GBATS systems, these new offerings can be expanded or re-configured with little or no customization by simply selecting from a list of standard GBATS instrument options. The four new GBATS systems include the:

    TS-710 - Targeted for basic functional test applications, the TS-710 offers users a low-cost, preconfigured test platform that can be used for basic analog and digital test. 
    TS-730 - Configured for mixed signal applications, the TS-730 offers performance analog and digital test capabilities. Targeting A to D and D to A devices and modules, the TS-730 offers a cost-effective, ready to test platform. 
    TS-750 - Configured for digital test applications for the component or card level, the TS-750 can support up to 128 digital I/O channels with test rates to 200 MHz. Like the other GBATS platforms, the preconfigured TS-750 is supplied with user power and a 6.5 digit DMM as well as a self-test program and fixture. 
    TS-770 - Based on the TS-775, the TS-770 is configured to support commercial avionics products for both box or card level applications. The platform includes a 16 channel, ARINC-429 bus interface module as well as user power, switching, a DMM, and a 3-channel, programmable 32 volt source. 

All GBATS platforms are available with Geotest's ATEasy software, which provides an integrated and complete test executive and test development environment, allowing users to quickly develop and easily maintain test applications.
Geotest Debuts LASAR-based Digital Test Solution DtifEasy
Geotest has developed a full-featured tool set - DtifEasy, for importing, converting, and executing IEEE-1445 compliant digital test vectors generated by a LASAR simulation. DtifEasy includes LASAR post-processor, run-time, and diagnostic test environments for supporting go/no-go, fault dictionary and guided probe functionality. All four IEEE-1445 file types - UUT model group, Stimulus and Response group, Fault Dictionary group, and Probe group are supported by DtifEasy.
Overall control and execution of the .tap file conversion process, UUT configuration, and execution of go/no-go and probing sequences is provided by the ATEasy test development / execution environment which is included with the DtifEasy product. DtifEasy supports Geotest's 3U PXI GX529x series of dynamic digital instrumentation and the 6U PXI GX5055, 50 MHz digital instrument. Both of these instrument families support a digital logic probe for guided probe diagnostics. DtifEasy's other features include:
    Guided probe tools which offer both textual and UUT image probing aides, guided probe tree display, and repeat / skip probes simplifying the diagnosis of UUT faults 
    Open architecture supports interfaces for programming languages including CVI, LabView, VB, and C/C++ 
  Available with preconfigured Geotest digital subsystems and digital test systems
The DtifEasy conversion tools in conjunction with Geotest digital instrumentation / systems offers a low cost and superior solution for those users needing to migrate existing LASAR based applications (with .tap files) from a legacy platform to a new test platform. Similarly, by re-simulating UUTs using LASAR, DtifEasy offers users a cost-effective method to re-host UUTs on lower cost, PXI-based, digital functional test platforms.

LASAR is a Teradyne tradename
Geotest Expands the GX5290 Family with the Low-Cost GX5291
Responding to the need for a low-cost, performance digital instrument, Geotest has introduced the GX5291 product, which offers 32 channels of digital I/O, with 32 Mb of vector memory per channel. The card supports 1.5 V, 1.8 V, 2.5 V, 3.3 V, and 5 V TTL/LVTTL logic families and supports a maximum vector rate of 50 or 100 MHz.

Designed to support cost sensitive, performance digital test applications with low to moderate channel count, the GX5291 shares all of the features found on other GX5290 products such as per pin and per vector direction control and supports up to 32 channels for one digital domain.
Geotest Expands Capabilities and Performance for the GX5280 and GX5290 Series Digital I/O Cards GX5290 Series
Geotest has expanded the capabilities and performance of their 3U PXI dynamic digital I/O cards. Both the GX5280 and GX5290 series cards now offer enhanced digital vector load and unload performance with the fastest vector load / unload times in the industry.
These enhanced products provide more than a 2-to-1 reduction in vector load / unload times when compared to competitive offerings - resulting in reduced execution time and faster throughput for digital test applications. Additionally, Geotest has upgraded the GX5290 series products by incorporating real time compare - providing users with a fast-test method for testing digital devices which requires deep test vectors. Current GX5280 and GX5290 products are field upgradable to support these new features by downloading and installing new firmware as well as upgrading to the current DIO driver support package.
To learn more about Geotest products please visit

Productronica Schedule
Tuesday, November 10 - Thursday, November 12
9 am to 6 pm
Friday, November 13
9 am to 5 pm

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