Test Connections - March 2016 - Newsletter | Marvin Test Solutions, Inc.

March 2016 - NewsletterFocus OnSolution SpotlightProduct HighlightIn the NewsDid You Know?

Dear Chris R.

Welcome to our first issue of Test Connections for 2016. With a successful 2015 behind us, we look forward to working with you in 2016, delivering innovative test solutions and offering unrivaled long term support.

Steve Sargeant, CEO

We hope you enjoy this month's issue of Test Connections which includes new product updates and news events.

Please send your comments or suggestions regarding this newsletter to marketing@MarvinTest.com.

Marvin Test Solutions Debuts with the Marvin Group at
the Singapore Air Show

In February, the Marvin Group and MTS made its exhibition debut at the Singapore Airshow, a major international tradeshow which attracts major military and commercial aerospace suppliers from around the world.

Advanced Digital Testing Using PXI Instrumentation

As the performance and feature set of PXI instruments continues to improve, their capabilities begin to approach those of traditional, dedicated semiconductor test systems. This offers the opportunity to create low-cost, small-footprint test systems based on PXI instrumentation which can replace “Big Iron” testers for specific, targeted applications. Learn how a PXI test system was used as a proof-of-concept case study to demonstrate the replacement of a Teradyne UltraFlex tester for multi-site IC test applications.

GX7017 GENASYS Subsystem - PXI-Based, High Performance,
High Density Switching Architecture

Marvin Test Solutions has recently introduced a new addition to the GENASYS product line, the GX7017 switching subsystem which is based on the PXI architecture and offers an advanced, high performance, switching architecture for mixed-signal test applications within a single, compact chassis.

Newsworthy Happenings at Marvin Test Solutions

See us at upcoming industry conferences and tradeshow events

Trade publication news

Recent Press Releases

Looking to generate test applications faster? Open-architecture-based ATEasy is the answer. Download your no-cost 30-day trial today! Download your 30 day FREE TRIAL!

Marvin Test Solutions offers a comprehensive test solution for supporting the Maverick Missile for both field and intermediate level test needs.
Read on to learn more.

Read the blog post here.

“Integrating Verifide’s Data Storage and Analysis Tools with ATEasy”

ATEasy’s capabilities include the ability to develop and log test data easily. By integrating 3rd party software tools with ATEasy, users are able to easily manage and analyze this test data in a production environment.
Click here to learn more.

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Marvin Test Solutions Debuts with the Marvin Group at the Singapore Air Show

In February, the Marvin Group and MTS made their exhibition debut at the Singapore Airshow, a major international tradeshow attracting major military and commercial aerospace suppliers from around the world. One of the largest and most successful air shows in the world, the 2016 show featured over 500 exhibitors. During the show, MTS featured its advanced flightline test solutions for armament in addition to highlighting MEC’s carriage suspension products. Featured products on display at the show included:

MTS-3060 SmartCan™, a high-performance portable handheld test set that brings previously unavailable trouble-shooting capabilities, such as full-functionality testing of the 1760 bus to the flightline, along with smart weapon emulation. The SmartCan now has expanded capabilities that include full-functional testing of the AIM-120 AMRAAM missile. The AMRAAM air-to-air missile remains one of the premier medium range missiles carried by U.S. and allied tactical aircraft, and previously, no suitable hand held flightline test set supported MILSTD 1760 functional testing beyond stray voltage and continuity of circuit. The ability to test the AMRAAM’s MILSTD 1760 connectivity to the aircraft enhances mission effectiveness and aircrew confidence, especially in situations where live-firing is required. This new AMRAAM test capability has been deployed internationally on Block 15 and 50 F-16’s and has been demonstrated domestically on the F-15. The MTS-3060 SmartCan™ has already seen foreign military sales (FMS) on several aircraft platforms and most recently, additional sales have been made to an Asian country for multiple Smartcans.

MTS-207, a state-of-the-art portable PXI platform for field testing and data acquisition systems. Its proven architecture has been deployed worldwide on multiple programs including the MTS-206 Maverick Missile system flight line tester, the MTS-209 Common Armament Test Set, the AN/TSM-205B Hellfire System test Set, and many more. It combines the capabilities of the versatile and powerful PXI architecture in a compact, ultra-rugged, flight-line qualified enclosure. The MTS-207 is ideal for test and data acquisition applications requiring operation under harsh environmental conditions including flight-line, back-shop, or airborne applications.

During the show MTS announced that its MTS-3060 SmartCan™ has been adopted by yet another country in Asia to support flightline armament test of the F-16, TA-50, and Hawk aircraft; reinforcing the value and capabilities of the SmartCan for supporting multiple aircraft with a common test solution.

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Advanced Digital Testing Using PXI Instrumentation

Device Under Test The target device was a WiFi IC, with 802.11n and Bluetooth capabilities. Upon reviewing the target IC specifications, a set of resource requirements to test the IC were identified and matched to instruments available in the PXI form-factor. The Device Under Test (DUT) required four power supplies, and the power supplies had to be sequenced in a specific order when powering up the DUT. Further, while the IDD for the DUT was very low, when the DUT was initialized, the inrush current could exceed 1A on one of the supplies. The power requirement mandated that programmable power supplies be used, and that the 1A of in-rush current be accommodated. On initial power-up, the DUT is in a low-power idle state whereby communication is possible. There are two communication ports on the DUT, a JTAG port and a Scan port. The JTAG port is used to configure and initialize the DUT, and perform an initial structural test of the IO. The Scan port is used to configure the DUT for operation and complete the structural IO test. Additional functional tests are also implemented using the Scan port to control the DUT. Since the DUT was already being tested on an UltraFlex system, the DUT had a proven set of test patterns that were available for reuse with the PXI system. Marvin Test Solutions’ file conversion tools were available to convert the ATP files to hardware specific patterns, with the digital test instrumentation meeting the speed, channel density, pattern depth, and timing capabilities required to accurately represent the ATP pattern file parameters. Test System A means to interface to the DUT was required in order to substitute for the IC handler associated with the UltraFlex system. Dedicated DUT boards were designed and cabled to the instrumentation for the demonstration system. The DUT board design was modularized to accommodate easy expansion of the number of test sites and demonstrate multi-site test capabilities. Test System The system design as shown consisted of a GX7100B PXI 3U/6U Combo Smart Chassis. A combination of 3U and 6U PXI slots was required to accommodate the two GX7400A programmable power supplies. Each GX7400A provides two 150W programmable power supplies in three 6U slots.
Four GX5296 PXI modules were chosen as the digital test instruments for the DUT. The GX5296 provides 32 IO channels per card with full PMU per channel capabilities, 64M pattern depth, 125 MHz clock rates, 1nS edge timing resolution, timing per pin, and real-time compare of DUT response data. Using MTS’ GtDio6x-FIT file translation tools, the digital test patterns were translated from the UltraFlex ATP pattern files, and formatted so that the patterns for each DUT would reside on two GX5296 instruments. Expanding the capabilities from testing one DUT to two DUT’s was simply a matter of adding a second set of GX5296 instruments, and cabling from those modules to a second DUT test board.
The software to control loading the translated ATP test patterns, running the analog contact tests, executing the test patterns and reporting test results to the operator was written using the ATEasy development environment, and the test execution was controlled using the integrated Test Executive GUI. Demonstrations were also written using LabVIEW and TestStand to show the overall versatility of using open architecture hardware and software tools for semiconductor test applications. To learn more about the GX5296, click here To learn more about PXI - Based Semiconductor Test Systems: Advanced Test Capabilities and Features, click here.

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GX7017 GENASYS Subsystem - PXI-Based, High Performance, High Density Switching Architecture

The GENASYS GX7017 subsystem employs the same innovative switching architecture associated with the high pin count, GX7016 subsystem. The GX7017 supports the integration of both a high performance, PXI digital and switching subsystem, providing a complete, mixed-signal test solution within a single, compact PXI chassis.

Key features associated with the GX7017 include:

Support for up (9) GENASYS switching modules, offering over 2200 multiplexed, hybrid test connections

Support for up to (8) GX5960 digital modules, supporting up to 256 performance digital channels which can be routed via the GENASYS switch modules

Integrated Scout receiver providing a reliable, cable-less interface

Integrated, high-level switching software - SwitchEasy, providing end to end signal routing

The figure below details that GX7017 and its slot configuration / capabilities. Note that any of the peripheral slots can accept 3U or 6U PXI modules, providing additional flexibility when configuring the overall system.

GX7017 GENASYS Chassis Configuration

GX7017 Chassis with MacPanel Scout Receiver & GENASYS Switch Card

The GX7017 can be configured with any of the GENASYS switch modules, providing analog / digital switching capability for both baseband and RF applications.

GENASYS modules currently available include:

GX6256 – 256 x 16 x 16 mux/matrix card; supports 16 digital and 16 internal analog bus signal resources

GX6192 – 100 MHz, 192 x 16 x 16 mux / matrix card; supports 16 external and 16 internal analog bus resources

GX6864 – 500 MHz, 64 x 16 x 16 mux / matrix card; supports 16 external and 16 internal analog bus resources

Analog signal routing from card to card is supported by an internal 16 wire bus which can also be used for routing analog instrumentation and triggers from an instrument source to the receiver interface. The implementation of this bus is not the typical “tapped bus” configuration which can seriously limit signal bandwidth due to stubbing effects. Instead, a fabric switch topology is employed, providing a controlled, high bandwidth point to point connection for each of the 16 bus wires, regardless of the number of cards installed in the system or the routing of the signal. The figure below details the how this switch router module, which is located on the GENASYS backplane is implemented. Note that for any signal path connection; no more than 6 relays are needed to connect to any of the 9 GENASYS switch cards installed in the GX7017 chassis.

Analog Bus Switch Router, (1 of 16)

The GENASYS switch cards also support signal routing for the digital I/O cards, which provides a high bandwidth signal path as well as hybrid pin capability to each receiver pin, providing “any signal to any pin” signal routing. Additionally, for higher bandwidth applications, the GENASYS architecture offers an HF Matrix / Mux module which supports the routing of signals with bandwidths > 100 MHz. The figure below provides a simplified diagram of the GENASYS switching architecture. Note that up to 32 analog / trigger resources are supported in the base GENASYS configuration via the 32x16 matrix switch module.

All GENASYS systems are delivered with SwitchEasy signal routing software, which provides end to end signal routing and can be easily integrated with ATEasy and other test executive environments. The task of managing GENASYS’ complex signal routing architecture is efficiently performed by SwitchEasy which also prevents erroneous connections or dangerous connections that could damage the system.

Click here to learn more about the GENASYS switching subsystem.
Click here to read the white paper about the GENASYS architecture.

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Newsworthy Happenings at Marvin Test Solutions

Upcoming Events
AUSA Global Force Symposium and Exposition, March 15^th - 17^th, 2016
Von Braun Center, Huntsville, AL
Booth: 1313
Marvin Test Solutions will be exhibiting with Marvin Engineering at the AUSA Global Force Symposium and Exposition. The Association of the United States Army Institute of Land Warfare (AUSA ILW) sponsors an unclassified Global Force symposium for members of industry and the military community.

FIDAE Chile, March 29^th - April 3^rd, 2016
Santiago, Chile
Booth: C27
Marvin Test Solutions will be exhibiting with Marvin Engineering at the International Air & Space Fair. FIDAE is the main aerospace, defense and security exhibition of the American continent. With more than thirty-five years of existence, it gathers the main world's representatives of civil-commercial aviation, defense, aircraft maintenance, airport equipment & services, homeland security and space technology.

Army Aviation Mission Solution Summit , April 28^th - 30^th, 2016
Georgia World Congress Center, Atlanta, GA
Booth: 847
Marvin Test Solutions will be exhibiting at the Army Aviation Mission Solutions Summit which offers the opportunity for the entire Army Aviation Community to gather in one place at one time, focused solely on Army Aviation issues.

Aerospace Electrical Systems Expo, May 24^th - 26^th, 2016
Pasadena Convention Center, Pasadena, CA
Booth: 4027
Marvin Test Solutions will be attending the Aerospace Electrical Systems Expo, which is a dedicated expo and summit representing onboard electrical power and systems in commercial and business aviation; military aircraft, rotary and spacecraft.

Featured Articles / Interviews:

Marvin Test Solutions’ products and people were recently featured in the following publications and online newsletters:

Engineering Component News, Jan 2016, ”Consolidating Test Capabilities For Remotely Piloted Aircraft”

Evaluation Engineering, Dec 2015, ”Being turned-on to switching”

Evaluation Engineering, Feb 2016, ”Marvin Test Solutions touts SmartCan at Singapore Airshow”

Recent Press Releases
“Marvin Test Solutions MTS-3060 SmartCanTM Selected as the Flightline Armament Test Solution for F-16, TA/FA-50, and Hawk”
Singapore - February 16, 2016 - Marvin Test Solutions, a trusted global provider of innovative test solutions for military and aerospace organizations, today announced its MTS-3060 SmartCan™ has been adopted by yet another country in Asia to support flightline armament test of the F-16, TA-50, and Hawk aircraft. Click here to read more.

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Did You Know?

For I-Level test and O-level test of the Maverick missile family, MTS offers the MTS-206 field test set, the MTS-916 modular target simulator, and the MT1888 handheld laser source simulator. These three products offer comprehensive field and intermediate level testing for all variants of the Maverick missile family and provide verification and maintenance of both guidance and electronics modules. The portable, ultra-ruggedized MTS-206-2 performs parametric functional tests on most variants of the Maverick missile and its system components, including the AGM-65 missile (all versions in tactical and training configurations), the AGM-65 missile sections (GCS & CAS, all versions in tactical and training configurations), the LAU-117 and LAU-88 Maverick launchers (all versions), and launcher-missile clusters. The MTS-206-2 also tests all variants of the AGM-114 Hellfire missile. Click here to learn more For I-level testing of the Maverick’s optical guidance components, the MTS-206-2 is combined with the MTS-916 Modular Target Simulator which features state-of-the-art, target simulators for TV, CCD, infrared, and laser guided weapons. The MTS-916 product line is known for its ability to replace multiple obsolete target simulators for the AGM-65 Maverick missile guidance sections and can test the AGM-65E / E2 / L Laser Maverick seeker heads. The MTS-916 family is fully compatible with any Maverick test set using legacy simulators, including the AN/DSM-157 Guided Missile Test Set (GMTS). Click here to learn more
For O-level or flightline test, MTS’ MT1888 laser source simulator offers maintainers a quick and easy pre-flight test method to verify that optical guidance system is active and able to track a laser source. The MT1888 product family is made up of state-of-the-art, handheld Laser Source/Spot Simulators (LSS) which can be easily used in the field to test seeker functionality on all NATO specification laser guided munitions, including the AGM-114 Hellfire and Hellfire II missiles and AGM-65E laser guided Maverick missile.
The combination of all three products - the MT1888, MTS-916 and MTS-206-2 offers maintainers a comprehensive set of flight line and intermediate test capabilities for the Maverick missile family, ensuring a high level of mission readiness and enhanced maintainability.

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Software ATEasy DIOEasy DtifEasy WaveEasy CalEasy ICEasy All Software Products	Chassis & Controllers Chassis Chassis Controllers and Bus Expanders All Chassis and Controllers Products	Digital I/O Dynamic Digital I/O Instrumentation Static Digital I/O Instrumentation Digital I/O Software and Training ROM Emulator Instrumentation JTAG / BDM Instrumentation All Digital I/O Products	Measurement Digital Multimeter Instrumentation Counter Timer Instrumentation Digitizer Instrumentation A/D Converters, Multi-function Instrumentation All Measurement Products	Stimuli Arbitrary Function Generators Standards Source Instrumentation Multi-function Instrumentation D/A Converters and Precision DC Source Instrumentation All Stimulus Products	FPGA Digital I/O Multi-Function All FPGA Products

Switching 3U PXI 6U PXI GENASYS Matrix Multiplexer RF High Current High Density General Purpose All Switching Products	SMUs & Power Supplies Power Supply Mainframe and Modules Instrumentation Precision DC Source Instrumentation All SMUs & Power Supplies Products	Bus Interfaces Bus Expanders GPIB MIL-STD-1553 ARINC 429 Comm All Bus Interfaces Products	GPIB Instrumentation Replacements Wavetek Replacements HP Replacements All GPIB Instrumentation Replacements Products	PXI Instruments Chassis and Controllers Digital I/O Measurement Stimuli FPGA Cards Switching Power Supplies Bus Interfaces All PXI Instruments Products	Legacy GTXI Chassis, Controllers and Instrumentation Digital I/O Stimuli Switching Power Supplies All Legacy Products	Military Missile Launchers All Military Products

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Test Connections - March 2016

Marvin Test Solutions Debuts with the Marvin Group at
the Singapore Air Show

Advanced Digital Testing Using PXI Instrumentation

GX7017 GENASYS Subsystem - PXI-Based, High Performance,
High Density Switching Architecture

Newsworthy Happenings at Marvin Test Solutions

Marvin Test Solutions Debuts with the Marvin Group at the Singapore Air Show

Advanced Digital Testing Using PXI Instrumentation

GX7017 GENASYS Subsystem - PXI-Based, High Performance, High Density Switching Architecture

Newsworthy Happenings at Marvin Test Solutions

Did You Know?

Enter message in space below

Product Lines

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About Marvin Test Solutions

Contact Us

Aircraft

Weapons Systems

Maintenance Levels

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GENASYS Benchtop

GENASYS Semi

GENASYS

GENASYS Benchtop

Commercial

Military

GENASYS Rugged

Test Connections - March 2016

Marvin Test Solutions Debuts with the Marvin Group atthe Singapore Air Show

Advanced Digital Testing Using PXI Instrumentation

GX7017 GENASYS Subsystem - PXI-Based, High Performance, High Density Switching Architecture

Newsworthy Happenings at Marvin Test Solutions

Marvin Test Solutions Debuts with the Marvin Group at the Singapore Air Show

Advanced Digital Testing Using PXI Instrumentation

GX7017 GENASYS Subsystem - PXI-Based, High Performance, High Density Switching Architecture

Newsworthy Happenings at Marvin Test Solutions

Did You Know?

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Product Lines

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About Marvin Test Solutions

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Marvin Test Solutions Debuts with the Marvin Group at
the Singapore Air Show

GX7017 GENASYS Subsystem - PXI-Based, High Performance,
High Density Switching Architecture