Welcome to the first edition of Test Connections for 2021! We join you in looking forward to a year of new possibilities and growth. Inside this edition you’ll find stories about our compact and capable integrated test solutions for 5G mmWave device production test that are now installed on multiple factory floors in the US. In addition, we’ll show how our Marvin Test Expansion Kit (MTEK) adds new capabilities to existing semiconductor ATE at a fraction of the price of recapitalizing older systems. Next, we’ll highlight our GX5295 Dynamic Digital I/O PXI module which offers both high performance digital and analog test capabilities making this card the ideal choice for high throughput, mixed-signal component test applications.
Interested in O-Level armament test? Check the "Did You Know?" section for insights into the broad capabilities and latest enhancements to our MTS-3060 SmartCan™, including a new Universal Launcher Cable and new adapters that make armament test easy on the flightline.
We begin the year hopeful that live, in-person events will make a comeback in 2021. We look forward to meeting with you soon either on the show floor, at your facility, or in ours to discuss your unique test challenges and explore solutions to ensure your success by living up to our motto – We Make Test Easy™.
The entire Marvin Test Solutions Team joins me wishing you health, happiness, and success in 2021!
Best regards,
Stephen T. Sargeant
Major General, USAF (Ret.)
CEO
We hope you enjoy this month's issue of Test Connections which includes new product updates and news events.
Please send your comments or suggestions regarding this newsletter to marketing@MarvinTest.com.
Proven Performance for 5G mmWave Production Test | | | | | Marvin Test Solutions looks forward to 2021 as a year of growth for our 5G mmWave semiconductor test line, after a solid start in 2020. Our 5G mmWave test solutions are currently installed on the production floors of multiple device manufacturers in the US | |
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GX5295 Dynamic Digital I/O PXI Card | | | | | The GX5295 offers outstanding digital test capabilities and channel density in a compact 3U PXI form factor. Offering both performance digital and analog test capabilities, the GX5295 provides a cost-effective, tester per pin architecture - the ideal choice for high throughput, mixed-signal component test applications. | |
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SmartCanTM is the test set for the 21st century armament maintainer.
Read on
to learn more.
Multisite Digital Test System DesignClick here
to learn more.
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