New Product
MTEK Series

Semiconductor Test System Expansion / Upgrades

  • Capability enhancements / upgrades for current and legacy semiconductor test systems
  • PXI-based, cost-effective, open-architecture add-on solution
  • Compatible with legacy test platforms including Teradyne, LTX/Credence, and Verigy
  • Easily add performance: RF, digital, and analog capabilities

DESCRIPTION

The MTEK (Marvin Test Expansion Kit) Series is a cost-effective, PXI-based test solution that offers modern instrumentation with advanced specifications - extending the life and capabilities of legacy ATE. Based on Marvin Test Solutions' portfolio of PXI chassis and instrumentation, the MTEK Series can be readily integrated with a legacy ATE platform, providing advanced digital, analog or RF test capabilities. Based on the open architecture of PXI, the MTEK system offers a flexible and scalable solution which can be specifically configured to address a range of test needs for both packaged and wafer test applications. Designed to support both engineering and high volume production installations, the MTEK Series is the ideal low-cost solution for extending the life cycle of legacy semiconductor ATE systems.

FEATURES

The MTEK Series core platform includes a 9-slot, PXI Express chassis and a MXI interface which provides the control interface to the host ATE system.

8 peripheral slots are available for supporting PXI and PXI Express instrumentation. Availble PXI instrumentation offers analog and digital capabilities including:
  • 6.5 Digital DMM
  • Performance Digital I/O with PMU per pin
  • 200 MS/s AWG
  • 70 MS/s Digitizer
  • RF generator & analyzer
  • Time Measurement Unit (TMU)

The MTEK's compact form factor simplifies mechanical integration with the legacy test system and users have the option to interface the MTEK's resources via the DUT's load board or the tester's receiver interface.

SOFTWARE

The MTEK system is supplied with Windows® compatible instrument drivers and virtual instrument panels, which provides interactive control and monitoring of the instruments from a window that displays the instrument’s current settings and status. In addition, digital instrumentation is supplied with graphical vector development / waveform display tools and as an option, a file import tool is available for importing and converting STIL, WGL, VCD, eVCD and ATP file formats.