PXI - Based Semiconductor Test Systems: Advanced Test Capabilities and Features
PXI-Based Semiconductor Test Systems

The ongoing challenge for today’s semiconductor test engineers is to identify and create new test solutions that can offer significantly lower test costs as well as address the need for configurable, open-architecture, flexible test solutions that can provide comparable features to proprietary ATE platforms.

In particular, for test requirements with low to moderate volumes, e.g., pilot production, verification, and focused production test applications, the need for flexible and cost effective ATE solutions is particularly acute. For these applications, test engineers historically have relied upon legacy test systems which have a low acquisition cost but high operating costs or in-house designed, rack and stack solutions.

With timing per pin, PMU per pin, and advanced software tools, the advancements in PXI-based semiconductor test system solutions can offer test engineers the flexibility and performance for both current and future test needs.

Marvin Test Solutions’ TS-960e PXI Express Semiconductor Test System provides high-performance digital, mixed-signal, and RF test capabilities in a compact, single chassis footprint featuring timing per pin architecture with sub-nanosecond edge placement & 64 time sets. Available with Keysight Technologies’ comprehensive portfolio of PXIe RF instrumentation for addressing a wide range of RF applications, the TS-960e offers users an application ready test system which can be upgraded or reconfigured in the field if needed.

The TS-960e is part of Marvin Test Solutions’ suite of semiconductor test solutions which includes:
  • TS-900 Series PXI-based integrated semiconductor test platform
  • TS-960 Series PXI Semiconductor Test System with Timing per Pin Digital Subsystem
  • MTEK (Marvin Test Expansion Kit) Tester Upgrade Solution for Legacy Test Systems including Eagle, Teradyne, LTX, Credence, ASL 1000, Sentry
  • ICEasy Semiconductor Test Software Suite

To learn more about MTS’ PXI-based solutions for semiconductor test, please register to download our white paper, "PXI-Based Semiconductor Test Systems: Advanced Test Capabilities and Features", and visit our YouTube channel to view the video "Making Semiconductor Test Easy."

Download "PXI–Based Semiconductor Test Systems: Advanced Test Capabilities and Features"

PXI–Based Semiconductor Test Systems: Advanced Test Capabilities and Features
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