Knowledge Base

Articles

Knowledge base articles covering topics such as integration of Marvin Test Solutions products, new functionality, and frequently asked questions. Articles cover PXI Instruments, ATEasy software, LabView integration, etc. and should be a first stop for anyone with questions.

Leveraging Industry Standards for User Programmable FPGA Instrumentation

This paper discusses the use of industry standard design tools, the proper use of intellectual property (IP), and the use/adoption of standardized FPGA interfaces such as the ANSI/VITA 57 standard.

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Q200320

Sep 25, 2018
White Paper

White Paper: Leveraging Industry Standards for User Programmable FPGA Instrumentation

This paper discusses the use of industry standard design tools, the proper use of intellectual property (IP), and the use/adoption of standardized FPGA interfaces such as the ANSI/VITA 57 standard. Read more...

Q200319

Sep 25, 2018
White Paper

White Paper: Next Generation Armament Test Solutions for the Flightline

This paper provides an overview of flightline armament testers and presents key features of a next generation flightline tester that is capable of supporting multiple aircraft platforms and weapon systems as well as being upgradeable for future test needs. Read more...

Q200318

Sep 20, 2018

Presentation: User Programmable FPGA PXI Instrumentation for Functional Test – Applications and Best Practices

This presentation will provide an overview of best practices associated with the design and programming of FPGAs. Read more...

Q200313

Aug 13, 2018

Metal-Oxide (MOX) Gas Sensor Testing

This application note discusses how a semiconductor manufacturer of Gas Sensors employed a focused test solution that provided the required accuracy, accommodated very large site counts, and matched the over-all throughput performance of high performance semiconductor test systems at a much lower cost. Read more...

Q200312

Jul 23, 2018

Consolidating Test Resources for Avionics Production Test

The manufacturing and test of avionics products for military and commercial aircraft presents a unique set of requirements and challenges. A common test platform and consolidation of test resources facilitates development and long-term support of complex, high-value assemblies. Read more...

Q20026

Jul 2, 2018

ATEasy Licensing Q&A

Provide information about ATEasy licensing Read more...

Q200314

Jun 14, 2018

Trendar / Fluke 3050B Digital Subsystem Replacement

This technical brief offers a notional implementation for replacing the Trendar / Fluke 3050B digital subsystem with a PXI-based, MTS digital subsystem. Read more...

Q200315

Jun 4, 2018
White Paper

White Paper: Metal-Oxide (MOX) Gas Sensor Testing

The application of MEMS technology has allowed Metal Oxide (MOX) Gas Sensors to be mass-produced at the wafer level with silicon wafer manufacturing offering cost reduction and scalability to large volumes. This white paper discusses how a semiconductor manufacturer of Gas Sensors employed a focused test solution that provided the required accuracy, accommodated very large site counts, and matched the over-all throughput performance of high performance semiconductor test systems at a much lower cost. Read more...

Q200239

Feb 1, 2018

Synchronizing Resource for Multiple UUT Testing

ATEasy offers test programmers the ability to write test programs to test multiple UUTs in Sequential or Parallel. This article presents the synchronization classes and synchronization events used to facilitate multi-UUT test programs. Read more...

Q200311

Dec 18, 2017

Active Power Management for Digital Functional Test Systems

Describes how to implement an active power management system for digital functional test that minimizes power dissipation without sacrificing system performance. Read more...

Showing 1 - 10 of 258 Items | 1 2 3 4 5 > | View All