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Knowledge base articles covering topics such as integration of Marvin Test Solutions products, new functionality, and frequently asked questions. Articles cover PXI Instruments, ATEasy software, LabView integration, etc. and should be a first stop for anyone with questions.

Metal-Oxide (MOX) Gas Sensor Testing

The application of MEMS technology has allowed Metal Oxide (MOX) Gas Sensors to be mass-produced at the wafer level with silicon wafer manufacturing offering cost reduction and scalability to large volumes. This white paper discusses how a semiconductor manufacturer...

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Q200313

Aug 13, 2018

Metal-Oxide (MOX) Gas Sensor Testing

This application note discusses how a semiconductor manufacturer of Gas Sensors employed a focused test solution that provided the required accuracy, accommodated very large site counts, and matched the over-all throughput performance of high performance semiconductor test systems at a much lower cost. Read more...

Q200312

Jul 23, 2018

Consolidating Test Resources for Avionics Production Test

The manufacturing and test of avionics products for military and commercial aircraft presents a unique set of requirements and challenges. A common test platform and consolidation of test resources facilitates development and long-term support of complex, high-value assemblies. Read more...

Q20026

Jul 2, 2018

ATEasy Licensing Q&A

Provide information about ATEasy licensing Read more...

Q200314

Jun 14, 2018

Trendar / Fluke 3050B Digital Subsystem Replacement

This technical brief offers a notional implementation for replacing the Trendar / Fluke 3050B digital subsystem with a PXI-based, MTS digital subsystem. Read more...

Q200315

Jun 4, 2018
White Paper

White Paper: Metal-Oxide (MOX) Gas Sensor Testing

The application of MEMS technology has allowed Metal Oxide (MOX) Gas Sensors to be mass-produced at the wafer level with silicon wafer manufacturing offering cost reduction and scalability to large volumes. This white paper discusses how a semiconductor manufacturer of Gas Sensors employed a focused test solution that provided the required accuracy, accommodated very large site counts, and matched the over-all throughput performance of high performance semiconductor test systems at a much lower cost. Read more...

Q200239

Feb 1, 2018

Synchronizing Resource for Multiple UUT Testing

ATEasy offers test programmers the ability to write test programs to test multiple UUTs in Sequential or Parallel. This article presents the synchronization classes and synchronization events used to facilitate multi-UUT test programs. Read more...

Q200311

Dec 18, 2017

Active Power Management for Digital Functional Test Systems

Describes how to implement an active power management system for digital functional test that minimizes power dissipation without sacrificing system performance. Read more...

Q200308

Sep 22, 2017
White Paper

White Paper: Implementing Digital Interfaces with User Programmable FPGAs

This paper will provide an overview of present day digital test interface requirements with a focus on serial digital interfaces which have become increasingly common for the control and monitoring of electronic modules and systems. Read more...

Q200306

Apr 26, 2017

How to Convert C++ Driver Example to LabWindows/CVI

This Knowledge base will give guidance on how to convert Marvin Test Solutions C++ Driver Example to LabWindows/CVI. Read more...

Q200307

Apr 25, 2017

Migrating from ATEasy 2.x to ATEasy 9.0

This article will go over the details of migration from ATEasy 2.x to ATEasy 9.0. During the process or migration the differences between the two will be discussed. Read more...

Showing 1 - 10 of 255 Items | 1 2 3 4 5 > | View All