Flightline Test In Your Hand
Chassis Controllers and Bus Expanders
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We are entering a very exciting time for us as we will be exhibiting at a number of tradeshows beginning the second week of September through mid-November. Marvin Test Solutions will be out in force at major tradeshows including the Air Force Association, Dubai Airshow, and Autotestcon.Steve Sargeant, CEO
We hope you enjoy this month's issue of Test Connections which includes new product updates and news events.
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F-16 (multiple blocks)F-15TA-50 and FA-50F-5BAE HawkUAV’s
Today’s semiconductor vendors are increasingly moving to open architecture, PXI –based solutions to provide them with cost effective, compact footprint, and flexible test solutions. MEMS suppliers in particular, are looking to PXI-based solutions as being well-suited for addressing their need for cost effective test solutions.
Using the GX5295’s Real-Time Compare function, log the first failure on each channel if/when they occur. The failed channel is correlated to specific site failures.For future failure analysis, record the test pattern step where each channel’s first-failure occurred.Suppress all further real-time compare operations for a channel, after the first failure.Enable or disable first-failure logging on a channel-by-channel basis.Support complete test execution, without pause or interruption, regardless of the number of channel failures.Report all failed channels with a single register read, avoiding the time-consuming operation of up-loading and post processing the full pattern buffer to identify failed channels.Maintain existing real-time compare capability.Support the LabVIEW programming environment
Channel error latch with a feed-back loop to the real-time compare mask circuit.Selection logic to enable the Record-First-Failure (RFF) mode or the standard Real-Time Compare mode (RTC).A Channel-Disable register to globally and selectively disable real-time compare per channel when operating in the RFF mode.New API functions added to the GX5295 DLL to control the new RFF featuresAn upgraded GtDio Panel application which provides interactive control and display of results for the RFF functionsLabVIEW wrappers for the new RFF functions which were added to the GX5295’s DLL.
Free, web-downloadable FPGA design software from AlteraSupports Verilog, VHDL, and graphical Schematic DesignAccess to all PXI bus resources for card synchronization and clock referenceSupports both analog and digital test capability
Key features of the A to D channels include the following:Configurable as 8 Differential or 16 Single-ended inputs250 KS/s sample rate with eight channel operation or 1MS/s time-interleaved dual channel operationProgrammable measurement range for improved accuracy, accepts input signals up to ± 13.6 VADC FIFO capable of storing 2K samples
Key features of the D to A channels include:8 channels, supporting 1 MS/s simultaneous sampling± 10 V output range6 V/us slew rate
See us at upcoming industry conferences and tradeshow events New and recent YouTube videosTrade publication news
Marvin Test Solutions, a vertically-integrated aerospace test and measurement company, has created and delivered innovative, reliable test systems for factory,
depot, intermediate, and flightline use since 1988. Our expertise delivering aerospace precision underpins our manufacturing solutions, enabling us to quickly
meet customers’ requirements with high-performance products and custom turnkey systems, backed by excellent long-term customer support.