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GENASYS Matrix Switch Interface Module, 32 x16

  • 32 x 16 matrix GENASYS switch card
  • Provides access to internal 16 wire switching bus
  • Rear I/O module provides access to the J5 bus


A component of the GENASYS switching subsystem, the GX6032 switch card is one of several different switch cards which can be installed in the GX7016 chassis and provides instrument access to the GX7016's internal, 16-wire bus. The GX7016 switching subsystem offers a new level of high performance, high density switching for board and system level functional test. Based on the 6U PXI architecture, the GX7016 incorporates a modular switch matrix and multiplexer architecture which supports up to 4608 multiplexed, hybrid I/O pins. Up to 128 external resources can be connected to any of the test system’s receiver I/O pins via a high performance, internal 16 wire matrix bus. The GX7016 chassis incorporates the MAC Panel 6U SCOUT receiver with each switch card providing a “cable-less” connection to the receiver connectors, – eliminating the need for cable harnesses and the associated reliability issues that come with cabled solutions. The result is a system interconnect design that is cost effective, reliable, and maintainable.


The modular architecture of the GX7016 allows the switching subsystem to support a wide range of configurations and capabilities. Input analog signal routing is supported by the GX6032, a matrix switch module which is located on the rear of the chassis. This module is configured as 32 x 16 matrix and supports up to 32 inputs which can be connected to the GX7016’s internal 16 wire bus. Up to (4) of these modules can be supported by the system.


For end to end to signal routing, Marvin Test Solutions’ SwitchEasy is used to control and manage overall signal switching. SwitchEasy provides end to end signal routing by having the user simply define the resource and receiver pin or UUT connections, simplifying overall application development and deployment time.


  • GENASYS switching subsystem
  • Automated system test applications
  • High I/O count, mixed-signal test applications