PXI–Based Semiconductor Test Systems: Advanced Test Capabilities and Features

Knowledge Base Article # Q200285

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Summary The next generation of PXI digital instrumentation offers the capabilities and test features normally only found in proprietary ATE semiconductor systems. This paper provides and overview of how new, advanced PXI digital subsystems can address semiconductor test solutions such as the TS-900, can now offer a broader range of test capabilities for digital, mixed-signal and RF test applications.
The next generation of PXI digital instrumentation offers the capabilities and test features normally only found in proprietary ATE semiconductor systems. With the advent of these new, advanced digital subsystems, PXI–based semiconductor test solutions such as the TS-900, can now offer a broader range of test capabilities and features for digital, mixed-signal and RF test applications. Offering comparable features and performance to proprietary or “big iron” ATE, today’s PXI systems offer compelling test solutions for verification, focused production, and failure analysis applications. With a wide offering of software tools, an intuitive software development / test executive environment (ATEasy), and the open architecture of PXI, PXI platforms like the TS-900 offer a cost effective, performance ATE solution.

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Article Date 8/3/2015 10:27:10 AM     Updated: 10/13/2015 7:48:02 AM
Keywords PXI; semiconductor; test; system; ATE; digital; instrumentation; TS-900; series; TS-960, GX5296; GX5295;

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