Welcome to our first issue of Test Connections for 2015. With a successful 2014 behind us, we look forward to working with you in 2015, supplying innovative test solutions and unrivaled long term support.
Steve Sargeant, CEO
We hope you enjoy this month's issue of Test Connections which includes new product updates and news events.
Please send your comments or suggestions regarding this newsletter to marketing@MarvinTest.com.
Transform Your Test Capabilities with Marvin Test Solutions’ Products and Services | | | | As a vertically integrated serospace company designing innovative functional test systems and solutions, Marvin Test Solutions is uniquely positioned to offer a range of aerospace quality, functional test solutions for flightline, depot, and manufacturing test applications.
Learn more about how Marvin Test Solutions can transform your test needs with innovative solutions, products, and unrivaled long term support. | 
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Field and Flightline Testing of MIL-STD-1760 Systems | | | | Military Standard 1760 (MIL-STD-1760) was created over three decades ago to simplify the integration of Carriage Stores on military aircraft. Carriage Stores range from "smart" weapons such as JDAM to Intelligence, Surveillance, and Reconnaissance (ISR) Pods such as LANTIRN.
MIL-STD-1760 builds on the venerable MIL-STD-1553 communications interface and includes many additional power, discrete, and analog signals as well as providing a communications protocol. To ensure these weapons systems are "mission ready", testing of the 1760 interface is essential. | 
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GX5296: High Performance Digital Subsystem | | | | | Marvin Test Solutions’ TS-900 Semiconductor Test System has new expanded capabilities with the introduction of the GX5296 PXI digital subsystem. The GX5296 leverages the features and capabilities of multiple Marvin Test Solutions products, delivering unrivaled timing, density, memory, and parametric measurement capabilities for digital test applications. | 
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Marvin Test Solutions has recently released updated drivers and software for the following instruments and products. Read on
to learn more.
Learn how to access a Rational DOORS Web service from ATEasy.
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Transform Your Test Capabilities with Marvin Test Solutions’ Product and Services
Since 1988, Marvin Test Solutions has been singularly focused on supplying functional test solutions for mission critical, high value products and systems with the goal to "Make Test Easy". To highlight how we are making test easy, we have assembled a collection of white papers that address a range of test topics including:
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"Addressing Legacy and Future Test Needs for Mission Critical Modules and Systems Using the PXI Platform"
Beginning in the late 1960s, proprietary ATE systems were deployed by a wide range of customers for the functional test and verification of high value, mission critical products including board & box level avionics, depot level test & repair of armament and avionics electronics, and communications / satellite subsystems. These test systems are now obsolete, however the products (and their derivatives) originally tested on these platforms are still in use and need to be maintained. Consequently, there is an on-going need to either maintain these obsolete systems or migrate the applications and the legacy system’s capabilities to a modern test platform. This paper provides and overview of how the PXI architecture, and associated instrumentation and software can provide the basis for a modern functional test platform that can effectively support both legacy ATE functionality as well as future functional test needs.
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"A Portable, Engineering-Design Partnership to Replace Obsolete Test Systems"
To address the need to replace obsolete support equipment for the USAF’s A-10 aircraft, the USAF's 309th Software Maintenance Group (SMXG) at Hill Air Force Base developed the PATS (Portable Automated Test Set)-70 which supports the testing of various A-10/C systems on the flightline. Based on Marvin Test Solutions' MTS-207 COTS platform, a state-of-the-art, ruggedized, portable PXI-based test system designed for flightline, back shop, and airborne applications; this paper provides and overview of how the MTS-207 provided the USAF with the necessary flexibility to add specific test instrumentation to support the A-10/C's flightline test needs.
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"Instrument, Hardware and Software Simulation in a Test System"
This paper reviews the requirements and methods associated with executing a test program application in simulation mode. Simulation involves the execution of an application with a subset of instrumentation or without any instrumentation and with or without the Unit Under Test (UUT). When operating In simulation mode, some of the instruments or the UUT may not exist, which requires that the simulation environment filter and mask out errors as well as be able to return different values for various application states. This paper details how simulation is implemented and supported by the ATEasy software development environment. | 
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"Instrument Certification as part of a Modular Test platform Architecture"
The use of PXI modular test systems for depot, intermediate, and factory test applications has increased dramatically in the last two decades. The flexibility and configurability associated with PXI has also created new challenges for the calibration and certification of these systems. This paper reviews how the use of an in-system standards module can form the basis for implementing a system level re-certification strategy. By employing a standards module within the system, recertification logistics and maintenance can be simplified, resulting in extended system up time and offering test managers added flexibility for supporting in-house certification of the system and system components.
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To access the complete set of white papers, click here.
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Field and Flightline Testing of MIL-STD-1760 Systems
MIL-STD-1760 defines the electrical interface between the aircraft and the Carriage Stores as well as the mechanical and communication protocol aspects of the interface.
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The intent of MIL-STD-1760 (also known as just "1760") was to simplify the integration of new weapons onto existing platforms. Prior to the introduction of 1760, the integration cost of a new weapon system was over $100 million dollars (in 1980 dollars). With 1760, integration costs shrank to under $25 million which was a significant improvement.
As with all good inventions, there’s always a "but" and 1760 was no exception. Most field and flightline test sets for armament were deployed over three decades ago and as such, were not suitable to test the "smart" interface of MIL-STD-1760. And unlike legacy systems, the aircraft is expecting to have a carriage store present in order to keep the interface active. Immediately after powering up the 1760 interface, the aircraft sends a MIL-STD-1553 transmission that can be translated to "who’s out there".
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The aircraft is expecting an answer within 150 msec and this response needs to include the identification of the Carriage Store or at least a message that says "I’m busy". In case of the "busy" message, the aircraft expects the identification response within 500 msec of power up. If there’s no response from the carriage store, the aircraft shuts down the interface and it is no longer powered or operating.
Legacy field and flightline test sets cannot communicate with the aircraft as they do not include the ability to test a 1760 interface. As a result, they can only perform some limited testing of the interface during the first 150 msec after power up. However, since they can’t even respond with an "I’m busy" answer, the interface will be shut down 150 msec after power is applied and from that point forward, the test set is testing a dormant interface. Since one of the main functions of flightline armament test sets is to check for stray voltage and functionality, it is clear that neither can be achieved unless the aircraft "believes" that there’s a real 1760 carriage store present and active.
In order to effectively test the interface, the test set not only needs to support the MIL-STD-1760 interface but it also needs to be able to identify itself as a real carriage store that will be recognized by the aircraft as part of its standard configuration. Since this is not easily achieved, many users revert to the use of the real carriage store when testing is needed although using a real carriage store as a test set has its complications too. Stores such as JDAM cannot just be connected to the interface. Because the store’s Inertial Measurement Unit (IMU) needs to be aligned, the store will need to move before it can be aligned prior to testing the interface. This means that the aircraft needs to be taxied around the base until such alignment is achieved which also means that a pilot is now needed to run the test. Obviously, having a pilot taxi the aircraft around the air base to test the 1760 interface is not a preferred method although it is being used occasionally. Alternatively, maintainers have attempted to use other tools, such as a ruggedized laptop with a MIL-STD-1553 interface configured as a weapon. However, this solution is also inadequate since it does not support the testing of power, analog, or discrete signals associated with the 1760 interface.
Full featured and complete testing of the 1760 interface is key to ensuring mission readiness. Recognizing this need for a next generation fligthline test solution, Marvin Test Solutions (MTS) developed the MTS-3060 SmartCan. As a universal flightline armament test set the SmartCan is capable of testing all legacy and "smart" interfaces used on military aircraft.
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Most military aircraft today are capable of carrying JDAM and for that reason, MTS elected to implement JDAM support with the SmartCan. Upon power up, the SmartCan will identify itself as a JDAM and test the entire interface while the aircraft is communicating with the "JDAM". Additionally, since some wing stations (such as the wingtip) cannot be used with JDAM, MTS also implemented support for testing the AIM-120 AMRAAM interface. With the SmartCan, the aircraft does not need to be moved anywhere and the 1760 interface can be tested thoroughly without moving the aircraft. |  |
The compact and handheld MTS-3060 SmartCan™ operates from four commercial AA batteries and weighs less than 2 Kg, making it ideal for flightline test applications. With its full-featured MIL-STD-1553 interface, the SmartCan can support the testing of virtually any "smart weapon" interface including JDAM and AIM-120. Additionally, it can load / test AC and DC power lines, provide video for testing the 1760’s analog signals, and check for the functionality and presence of stray voltage on the Release Consent line.
To learn more about the SmartCan, click here.
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GX5296: High Performance Digital Subsystem
Compact Footprint and High-Performance Digital Test
The GX5296 digital subsystem which is available with the TS-960 test system, delivers high-performance digital test capabilities and is ideal for addressing verification, focused production, and failure analysis test needs - or for replacing legacy test systems. The GX5296 builds on the successful GX5295 digital subsystem with enhanced timing performance and features. Featuring 32, 125 MHz digital I/O channels and occupying only a single PXI 3U slot, up to 512 high performance digital channels can be supported in a TS-960 test system. Additionally, the GX5296 features flexible timing and high-resolution edge placement, providing no-compromise digital and mixed-signal test capabilities as well as the flexibility to test and characterize a device’s DC and AC performance.
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Dynamic Timing per Pin and Flexible Edge Placement
The GX5296 represents a new, advanced, generation of PXI digital test instrumentation. Unlike other 3U PXI digital I/O subsystems which employ a "singular" timing system, the GX5296 offers dynamic timing per pin and flexible data formatting, providing test capabilities that are comparable to "big iron" ATE systems. A cycle based, digital subsystem, the GX5296 utilizes a programmable master clock to drive and sense output/input data. However, unlike other PXI digital subsystems, the GX5296 employs a dynamic timing interpolator, allowing the user to position drive / sense test vectors anywhere within a test step with 1 ns of resolution - not just on the vector clock’s edge boundary. This flexibility allows users to precisely create vector timing without resulting to work-arounds such as over- sampling, a technique which employs the use of multiple vectors in order to achieve even moderate edge placement resolution. In addition, the ability to "dynamically" program a pin’s timing vastly simplifies the creation / execution of timing Shmoo plots and validation / characterization of a device’s AC parametrics. Performing these tests with an instrument that supports only "static" timing per pin requires much longer test times and in some cases, the instrument’s capabilities may just not be adequate for the application.
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The GX5296’s timing generator supports 4 timing phases and windows (drive and sense timing). Each phase and window is comprised of two timing edges - assert / de-assert and an open window / close window respectively. Using the GX5296’s timing generator, these edges can be programmed with a resolution of 1ns, providing the needed flexibility and functionality for AC parametric test and complex bus emulation. These four time sets are available for mapping edge timing to each channel and additionally, these four time sets can have up to 64 unique time set value combinations which can be changed on the fly, for each sequence step. With this timing flexibility and edge resolution, the GX5296 can easily emulate and validate complex bus cycles as well as validate a device’s timing.
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The table below provides a comparison of the GX5296’s timing engine features versus a singular timing engine architecture.
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Learn more about the
GX5296 and
TS-960 Test System.
Upcoming Events:
AAAA Army Aviation Summit , March 29th - 31st, 2015Nashville, TNBooth 1506Marvin Test Solutions will be exhibiting at the 2015 Army Aviation Mission Solutions Summit.
AUSA ILW Global Force Symposium, March 31st - April 2nd, 2015
Huntsville, AL
Booth 831 Marvin Test Solutions will be exhibiting with the Marvin Group at AUSA’s ILW Global Force Symposium and Exposition, which will be held at the Von Braun Center 700 Monroe Street ,Huntsville, AL.
31st Space Symposium, April 13th - 16th, 2015
Colorado Springs, CO
Booth 1427 Marvin Test Solutions will be exhibiting at the 31
st Space Symposium, which is the premier global, commercial, civil, military and newspace conference.
LAAD Defense & Security, April 14th - 17th, 2015
Rio de Janeiro, Brazil
Booth 560a Marvin Test Solutions will be co-exhibiting with our representative Aero Precision at booth 560a. The show will take place in Rio de Janeiro, Brazil.
Technical PXI Day, April 15th, 2015
SAINT QUENTIN en YVELINES, France Marvin Test Solutions will be exhibiting at the PXI Day event on April 15.
National Electronics Week - PXI Show, April 21st - 22nd, 2015
Birmingham NEC, UK
Booth 722 Marvin Test Solutions will be exhibiting at the National Electronics Week, PXI show in Birmingham NEC, UK.
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Featured Articles:
Marvin Test Solutions’ products and people were recently featured in the following publications:
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Marvin Test Solutions has recently released updated drivers and software for the following instruments and products:
- GtDio6x.exe, Ver. 2.0 driver package for the GX5960 and GX5296 digital instruments
- GxSw.exe, Ver. 3.5 driver package for GX6xxx switch caRds and GX7016 switching subsystem.
- GtLinux.tar, Ver 1.6, Driver Package for Linux. Includes support for GxAo, GxChassis, GxCnt, GxDmm, GxFpga, GxPdo, GxPio, GxPres, GxPs, GxPxi and GxSw boards
- GxDmm.exe, Ver 2.3, Driver package for the GX2065 DMM
- GtWave.exe, Ver 1.3, WaveEasy software, supports GX1110 and GX1120 instruments
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