New Product
TS-960e Series

Semiconductor Test System

  • High-performance digital, mixed-signal, and RF semiconductor test capabilities
  • Compact, single chassis footprint
  • Industry leading digital subsystem offers timing per pin architecture with sub-nanosecond edge placement & 64 time sets for no-compromise digital test capability
  • Available with Keysight Technologies’ comprehensive portfolio of PXIe RF instrumentation for addressing a wide range of RF & mmWave applications
  • Integrated platform includes ATEasy® test executive / test development software and comprehensive software tools for test development, debug, and file translation
  • Bench top and integrated manipulator configurations

Order TS-960e Series and Related Products

To order call 1-888-837-8297 or order on-line via the form below. Prices are specified for USA destination orders. Prices are noted in USD. Import duties, taxes, and charges are not included in the item price.
 

TS-960e Series

Product Description Price. Qty
TS-960e
TS-960e
PXIe Semiconductor Test System with Timing per Pin Digital Subsystem
View required/recommended products
Call for Pricing
TS-960e-OM
TS-960e-OM
PXIe Semiconductor Test System with Timing per Pin Digital Subsystem & manipulator
View required/recommended products
Call for Pricing

Options

Product Description Price, Qty
TS-960-OPT64
64 Additional Dynamic 125 MHz Digital I/O channels with timing & PMU per pin
Call for Pricing