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TS-321 Series

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High Performance Mixed Signal Test Platform

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Semiconductor Production Test Platform DC - mm Wave 100 MHz Vector Rates TS-900e Series	Semiconductor Production Test Platform DC - mm Wave 125 MHz Vector Rates TS-960e Series	Semiconductor Upgrade / Expansion RF, Analog, Digital MTEK Series
GENASYS Semi Semiconductor Test Platform

Aerospace Test System
TS-321 Series

Automotive Test System
TS-322 Series

Satellite Test System
TS-323 Series

Core Test System TS-705	Base Analog/Digital Core Test System TS-710
Core Test System with Boundary Scan TS-720	Mixed Signal Test System TS-730
Digital Test System TS-750	Commercial Avionics Test System TS-770
Military Avionics Test System TS-775

GENASYS

High Performance Mixed Signal Test Platform

GENASYS Benchtop

Compact / Portable Test Platform

Rugged Field Test Set
MTS-207

SmartCan Universal Hand-held Test Set
MTS-3060C SmartCan

Portable PXI Chassis
GX7600

SmartCan Universal Armament Test Set 3060A SmartCan	Maverick Field Test Set MTS-206A
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F-35 Armament Test Set MTS-235A	Laser Source Simulator MTS-1888
Common Armament Test Set MTS-209	Hellfire Missile Simulator MT3045

Rugged Field Test Set
MTS-207

Hellfire / Longbow Test Set
AN-TSM-205

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MTS-206A

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MTS-209

F-35 Armament Test Set
MTS-235A

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Results for 'TS 900 Series'

Results for 'TS 900 Series'

Showing 1 - 11 of 11 Items

New Product

TS-900e-5G

TS-900e-5G

53 GHz VNA RF test performance

mmWave / 5G PXIe Production Test System

New Product

TS-900e-5G Series

TS-900e-5G Series

53 GHz VNA RF test performance

mmWave 5G PXIe Semiconductor Test System, 64 Dynamic Digital I/O Channels with per Pin PMU

TS-900e

TS-900e

Integrated semiconductor test platform - open architecture

Digital Test System configured with 64 Dynamic 100 MHz Digital I/O channels with per pin PMU, 64 Static Digital channels, +/- 20 V, 4 ch. user supply, and a receiver interface. System also includes system self test, ATEasy software license, monitor, keyboard, mouse, ICEasy and DIOEasy.

TS-900e Series

TS-900e Series

Integrated semiconductor test platform - open architecture

PXI Semiconductor Test System configured with 64 Dynamic Digital I/O Channels with Per Pin PMU, 64 Static Digital channels, 0-20V, 2A User Supply, and Receiver Interface. System includes System Self Test, ATEasy Software License, ICEasy and DIOEasy

TS-900e-OM

TS-900e-OM

Integrated semiconductor test platform - open architecture

TS-900 Test System Configured with 64 Dynamic 100 MHz Digital I/O Channels with per pin PMU, 64 Static Digital Channels, 0-20 V, 2 A User Supply, and a Receiver Interface. System also Include System Self Test, ATEasy Software License, ICEasy, DIOEasy, Monitor, Keyboard, and Mouse with Manipulator and Slide Receiver.

TS-900e-SR

TS-900e-SR

Integrated semiconductor test platform - open architecture

TS-900 Test System Configured with 64 Dynamic 100 MHz Digital I/O Channels with per pin PMU, 64 Static Digital Channels, +/- 20 V, 4 ch. user supply, and a Receiver Interface. System also Includes System Self Test, ATEasy Software License, ICEasy, DIOEasy, Monitor, Keyboard, and Mouse with Slide Receiver, manipulator ready.

TS-900eS

TS-900eS

Integrated semiconductor test platform - open architecture

Digital Test System, Slave configuration, Configured with 64 Dynamic 100 MHz Digital I/O Channels with per pin PMU, 64 Static Digital Channels, +/- 20 V, 4 ch. user supplyy, and a Receiver Interface. System also Includes System Self Test, ATEasy Software License, ICEasy, and DIOEasy.

TS-900eS-OM

TS-900eS-OM

Integrated semiconductor test platform - open architecture

Digital Test System, Slave configuration, Configured with 64 Dynamic 100 MHz Digital I/O Channels with per pin PMU, 64 Static Digital Channels, 0-20 V, 2 A User Supply, and a Receiver Interface. System also Includes System Self Test, ATEasy Software License, ICEasy, DIOEasy, and Slide Receiver.

New Product

GX7950 Series

GX7950 Series

Intel® mini-PC featuring 11th Generation Core Processor

mini-Computer Controller Series, Intel i7 Core Processor, 16 GB DDR4

GT5900

GT5900

Hosts any two of the GT5150 I/O modules

I/O Module Carrier (allows one or two GT59X0 I/O Modules to be used with GT25/50-DIO)

ICEasy Test Suite

ICEasy Test Suite

Comprehensive suite of software tools for semiconductor test applications

ICEasy Test Suite

Showing 1 - 11 of 11 Items

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About Marvin Test Solutions

Marvin Test Solutions, a vertically-integrated aerospace test and measurement company, has created and delivered innovative, reliable test systems for factory, depot, intermediate, and flightline use since 1988. Our expertise delivering aerospace precision underpins our manufacturing solutions, enabling us to quickly meet customers’ requirements with high-performance products and custom turnkey systems, backed by excellent long-term customer support.

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