Integrated Test Solutions

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Endless possibilities from one flexible test platform

The GENASYS family of integrated test solutions delivers exceptional measurement performance and flexibility across a broad spectrum of applications including semiconductor device, avionics, satellite, smart weapon and high reliability electronics manufacturing test.

Understanding that one size doesn’t fit all, GENASYS is based on a reconfigurable open system architecture capable of scaling from low channel count benchtop and portable systems to over 4,500 channel multi-bay functional test systems.

Five base configurations have been developed to deliver a level of functionality needed to address typical test requirements for a variety of applications, and each is scalable and configurable to meet your unique test requirements.