Marvin Test Solutions Press Releases and News

Geotest Releases ATEasy Version 7.0

Geotest Releases ATEasy Version 7.0

Irvine, Calif. (August 22, 2008) – Geotest-Marvin Test Systems, Inc., has announced the release of a new version of its award-winning test development software and test executive, ATEasy.  Designed specifically for the development and deployment of Test and Measurement applications, ATEasy 7.0 features numerous enhancements to the test development, run-time and test executive environments, including the ability to create libraries (DLLs) for use with external languages or by ATEasy drivers, enhanced debugging tools for the development of multi-threaded test applications, and Test Executive support for external test executable programs.

"With this latest version, ATEasy continues to be the most user-friendly and feature-rich software package available on the market," said Ron Yazma, vice president of software development. "Packed with new features while maintaining backward compatibility, ATEasy 7.0 includes a host of improvements for enriched functionality and versatility. And as the most cost-effective solution of its kind on the market, test engineers can realize significant reductions in their development time and integration costs with ATEasy."

Additional enhancements to Version 7.0 include support for ATML test results and test description; USB interface support; batch-build capability; enhanced usability including "back", "forward", "history navigation”, and auto recover features; MHT file support and more.

For More Information: To learn more about ATEasy 7.0 or receive information on Geotest products and services, contact Geotest at:


Marvin Test Solutions, Inc.
Phones: 1-888-837-8297, 949-263-2222   Fax: 949-263-1203
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(949) 263-2222

About Geotest - A subsidiary of the Marvin Group (Inglewood, CA) Geotest - Marvin Test Systems, Inc. is a global supplier of PXI and PC-based test products, systems, and solutions. Geotest's products and systems are used worldwide in thousands of aerospace, semiconductors, communications, medical, industrial, and military test applications.