Geotest Releases World’s Fastest PCI Dynamic Digital I/O
Geotest Releases World's Fastest PCI Dynamic Digital I/O
Irvine, CA (March 27, 2002) - Geotest-Marvin Test Systems, Inc., a global supplier of electronic test equipment for aerospace, semiconductors, telecom, medical, industrial and military applications, recently announced the release of the GC5050, a PCI-based high-speed dynamic digital I/O card with a built-in Algorithmic Sequencer.
Modeled after Geotest's award-winning GT50-DIO, the GC5050 provides all the features of high-speed dynamic digital testers normally seen only in large-scale functional test systems. The GC5050 may be combined with other PC instruments to form a mixed-signal test system. Features include: - 32-bit bidirectional pins
- 3 MB to 12 MB on-board memory
- Programmable clock rates from 750 Hz to 50 MHz (60 MHz optional)
- Multiple I/O options include TTL, PECL, LVDS and programmable levels
- Algorithmic Sequencer with Jump, Loop, Pause, and UUT Synchronization commands
- PCI-bus architecture provides fast loading and readback of test vectors
Availability and Pricing: Production shipments of the GC5050 are scheduled to start in April 2002. Starting price for the product is under $7,400.
For More Information:
To receive more information the GC5050, or Geotest PXI and PC-based test products, contact Geotest at:
About Geotest - A subsidiary of the Marvin Group (Inglewood, CA) Geotest -Marvin Test Systems, Inc. is a global supplier of PXI and PC-based test products, systems, and solutions. Geotest's products and systems are used worldwide in thousands of aerospace, semiconductors, communications, medical, industrial, and military test applications.
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About Geotest - A subsidiary of the Marvin Group (Inglewood, CA) Geotest
- Marvin Test Systems, Inc. is a global supplier of PXI and PC-based test products,
systems, and solutions. Geotest's products and systems are used worldwide in thousands
of aerospace, semiconductors, communications, medical, industrial, and military
test applications.