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Dear Subscriber,
We hope you enjoy this month's issue of Test Connections, filled with valuable
information, news, and updates. Please send your comments to marketing@geotestinc.com.
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PXI for Semiconductor Test: Capabilties and Benefits | | | |
Semiconductor manufacturers are constantly looking for ways to lower their cost of test. Read on to learn how Geotest's TS-900 PXI Test System can help manufacturers lower their test costs and raise their test efficiency. | |
> Read more
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Geotest's New High Performance PXI and PXI Express FPGA Cards Offer Users Flexibilty, Performance and Choice | | | |
Geotest has recently introduced two new high performance FPGA cards(GX3700 / GX3700e) using the Altera Stratix III devices. Read how you can take advantage of these new high performance FPGA cards for both the PXI and PXI Express archtectures. | |
> Read more
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Characterizing Devices with PXI Instrumentation | | | |
Characterizing the DC parameters of digital and mixed signal devices has largely been a task best done on large, proprietary ATE. Geotest's GX5295 PXI digital instrument with its PMU per pin now makes it possible to perform this task quickly and cost effectively. Read how you can use the GX5295 for device characterization testing. | |
> Read more
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Newsworthy Happenings | | | |
Join Geotest at productronica in Munich, Germany, Nov. 15 - 18. Find out more about productronica and other news events including new product introductions. | |
> Read more
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The GTX2200 Timer Counters include a gate function for frequency and time measurement. Read how this function works when making frequency / time measurements.
Read on to learn
more.
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Waveform Generation Language (WGL) files are a common file format used to describe test vectors for semiconductor devices. Read how Geotest software tools can be used to translate the WGL format to Geotest digital format.
Click
here to view the article.
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| Can't find what you're looking for? We'll build it for you. We also customize and adapt
standard catalog products to meet your specific needs.
Click here to request more information.
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