Test Connections - July 2011

July 2011 - Newsletter

We hope you enjoy this month's issue of Test Connections which includes new product updates and news events.

Please send your comments or suggestions regarding this newsletter to marketing@MarvinTest.com.

Get "Big Iron" Semiconductor Test System Benefits with the New TS-900


Geotest has introduced the TS-900, an integrated PXI-based test system that is targeted for semiconductor OEMs, fabless semiconductor vendors and packaging / test vendors needing a low cost, configurable test system. Learn how this full-featured system provides cost-effective and flexible functionality.
New TS-900
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PXI-based Semiconductor Test Solution Offers Significant Advantage


Geotest's Digital Test Instrument is highlighted in a Test and Measurement World July article. Learn how PXI can offer significant benefits for semiconductor test applications.
Solution Spotlight
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New High Performance FPGA Products and Semiconductor Quick Start Packages


Geotest expands its FlexDIO FPGA product line and adds bundled Quick Start Packages for semiconductor test applications. Learn how these new offerings will simplify your test solution development and deployment.
New High Performance Products
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Newsworthy Happenings & Events


Check out the latest news and events from Geotest, at home and around the world, and look for Geotest in Booth #6075 at Semicon West, July 12-14.
2011 Semicon West
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Looking to generate test applications faster? Open-architecture-based ATEasy is the answer. Download your no-cost 30-day trial today!
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The PXI-Express standard is approaching its sixth anniversary, so we thought it might be appropriate to review the standard and how it compares to PXI-1.
Read on to learn more.
Read the blog post here.
As multi-core processors become more prevalent, users seek to take advantage of the performance these processors offer by performing tasks in parallel.

Click here to learn more.
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