We hope you enjoy this month's issue of Test Connections which includes new product updates and news events. Please send your comments or suggestions regarding this newsletter to marketing@MarvinTest.com. Testing Multiple Devices with ATEasy Testing multiple devices or UUTS with one test system allows test engineers to maximize their capital investment in test hardware as well as adding incremental test capacity without investing in additional systems. Read more Addressing a Customer’s Specific Instrumentation Requirements The world of functional test requires many specialized or application specific instruments which may not be easily addressed by employing standard, off the shelf solutions. Geotest's teams of design and systems engineers are skilled in adapting our standard products to meet a customer’s unique test instrumentation requirements. Read more Automated Instrument Verification and Calibration with CalEasy Software CalEasy™ gives users the convenience and cost-reduction benefits of verifying and calibrating Geotest analog and digital instruments in-house. CalEasy is a full-featured, calibration executive software package that performs factory based instrument verification and re-calibration for the GX5055, GX5295, and GX5960 Series (GX5961/GX5964) instruments. Read more Newsworthy Happenings Geotest and our channel partners hope to see you at one of the upcoming tradeshows and seminars during the months of May and June. Currently, Geotest and our channel partners will be attending shows in the UK, Germany, and Israel as well as the PXI TAC shows in Taipei and Shanghai. Read more

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Testing Multiple Devices with ATEasy

Testing multiple devices or UUTS with one test system allows test engineers to maximize their capital investment in test hardware as well as adding incremental test capacity without investing in additional systems. ATEasy 8.0 offers users the ability to test multiple UUTs which includes overall management of test sequencing as well as management of shared test system resources. Using ATEasy’s Multiple UUT test feature, each device can be tested with the same test program or alternatively, each device can be tested with a unique program. When using the Test Executive to control and manage the testing of multiple UUTs, each individual UUT is automatically allocated a separate tab so that each unit has its own log window, test pane and test properties. (Figure 1).


ATEasy and the Test Executive both support the test execution of multiple UUTs in parallel mode, sequential mode or in mixed mode. An application that is configured for Sequential testing will execute a test program on each UUT sequentially, using a single, shared program thread. Applications configured for parallel testing will start testing all devices at the same time and each UUT will execute its test program in its own thread. Additionally, since each UUT can be configured independently, the application can be configured to execute in mixed mode with some UUTs configured to run sequentially and some UUTs configured to run in parallel. When using the Sequential Test mode, ATEasy allows you to define when to switch from one UUT to the next UUT. This point in the application, defined as the switch level, can be performed at the Program level, the Task level, or the Test level. For example, if the switch level is set at the Test level and the system has four UUTs being tested sequentially, ATEasy will run one test on UUT #1 before switching to UUT #2 to continue testing. Each UUT will run one test at a time until all test programs have completed. Note that just before switching UUTs, the module events OnInitSwitchUut and OnEndSwitchUut will be executed. This is the ideal place to insert any set-up code that may be required when adjusting / allocating system resources for the new UUT such as rerouting of a signal using a switch matrix or locking/unlocking a shared resource such as a digital multimeter.

Configuring your Application to Support Multiple UUTs
ATEasy 8.0 offers several customization options for supporting the testing of multiple UUTs:

• Enable / disable the Multiple UUT mode.

• Define or change the number of UUTs being tested.

• Specify the number of UUT tabs to create/run test applications

• Specify the program level for switching from one UUT to another.

• Define a Program/Profile per UUT: When disabled, selecting a program or profile will apply to all UUTs.

• Enable the active UUT display tab

Configuring these options is done via the Test Executive GUI and then opening the Customize | Options dialog page. (Figure 2).

After setting the UUT options listed above as required by your application, you can select a program or a profile using the Select Program Dialog. Depending on the options you set in the Options dialog, you will be able to override and set the UUT count, select one or more program/profiles for your UUTs and select the run mode for each UUT (either parallel or sequential). After configuring the UUT count and the run mode, the Test Executive will update its configuration to represent the changes. The Test Executive will display 'P' on the UUT label table if the UUT is running in parallel mode. To test all UUTs, you select the Start Command from the Run menu or to test a single UUT, select the target UUT tab and select the Start UUT Command.

Configuring Multiple UUT support programmatically is similar to the graphical approach. The System.OnInit event is an excellent place to customize the Test Executive.

The code below demonstrates a programmatic configuration of the multiple UUT option:

Assigning programs/profiles to the UUTs can also be done in the System.OnInit event after the customization code above is executed. In the example below, UUTs 1 and 2 are set to sequential operation and UUTs 3 and 4 are set to parallel operation.

As one can see, ATEasy offers users a variety of methods for testing multiple UUTs. To learn more about ATEasy and its multiple UUT features click HERE. You can also try out the TestExecMultipleUuts example project which is provided with ATEasy to learn more about testing multiple UUTs using ATEasy’s Test Executive.

Addressing a Customer’s Specific Instrumentation Requirements – Geotest’s New GX3348

The world of functional test requires many specialized or application specific instruments which may not be easily addressed by employing standard, off the shelf solutions. Geotest’s team of design and systems engineers are skilled in adapting our standard products to meet a customer’s unique test instrumentation requirements. This flexibility and responsiveness to meeting a customer’s specific requirements for instruments or systems is what sets us apart from other test and measurement suppliers. Geotest recently worked with a military and aerospace customer to deliver the GX3348, a 6U PXI multi-channel DC source. The customer liked the basic features of the Geotest GX1838, a multi-channel DC voltage source which offers a wide voltage range. However, the customer’s application required stimulus and measurement support for a large number of discrete analog I/Os. Consequently, the required instrumentation needed to include a 4x48 matrix, with each channel having measurement capabilities. Additionally, the overall test system configuration dictated that the solution be implemented on a single 6U PXI card. David Manor, Geotest’s VP of Hardware Engineering, managed the overall project and worked with our customer to create the GX3348, based on the existing GX1838 design. From start to finish the complete project was done in 4 months with deliveries to the customer scheduled for May. Key features of the GX3348 include: (2) +/- 20 VDC programmable sources -10 to +32 VDC programmable source 4x48 matrix providing access to sources and signal ground DC measurement on each channel 500 mA output current External source input with amplifier Single slot, 6U PXI format

Automated Instrument Verification and Calibration with CalEasy Software

CalEasy™ gives users the convenience and cost-reduction benefits of verifying and calibrating Geotest analog and digital instruments in-house. CalEasy is a full-featured, calibration executive software package that performs factory based instrument verification and re-calibration for the GX5055, GX5295, and GX5960 Series (GX5961/GX5964) instruments.

CalEasy offers all of the necessary tools and functions to support in-house calibration including: Verification of instrument calibration and operation Re-calibration of instruments Generation of verification / calibration logs with auto-save and print options Generation of new calibration certificates Customized calibration certificates Included with CalEasy is driver support for standards instrumentation as well as support for instrument driver interchangeability – allowing customers to substitute standards instrumentation if needed. CalEasy supports several modes of operation, allowing the customer to customize the verification and/or calibration process. As detailed in Figure 1, both the setup and test modes are selectable via an interactive UI. The specific test execution modes are detailed in Table 1 below. Setup and Test Mode – Figure 1 Execution MODES DESCRIPTION Verify The instrument is verified to its original specification and the result is printed to the test log. No calibration is performed. Verify and Calibrate if Required Instrument verification is performed and if required (verification task fails) the instrument is calibrated. If calibration is successful the instrument’s non-volatile memory is modified with the new calibration values and a calibration certificate is generated. If verification is OK the new calibration date is recorded and a certificate is generated. Calibrate Always No instrument verification is performed. This mode runs the calibration task and generates a certificate upon successful calibration. Test / Execution Modes - Table 1 At the conclusion of the verification and/or calibration process, test logs are generated and saved (optional) . And upon a successful calibration, a new calibration certificate with certificate number (which can be customized by the user) is automatically generated and saved. CalEasy offers users a complete calibration package – providing test engineers the flexibility to recalibrate and verify Geotest instruments without relying upon outside calibration resources. Learn more about CalEasy or contact us.

Newsworthy Happenings

News Geotest welcomes new representatives. Test Equipment Solutions Joins Geotest Geotest has formed a sales relationship with Test Equipment Solutions to support and promote Geotest's complete line of test products and services in Alabama, Florida, and Georgia. Test Equipment Solutions has offices in Georgia and Florida. Geotest Adds Lapp Technologies Lapp Technologies focuses on Test and Failure Analysis equipment for Solar and Semiconductor design and manufacturing environments. They have joined Geotest to provide sales support in the Texas region for the TS-900 Semiconductor Test System. Geotest Welcomes W5 Representing Geotest's complete line of products and services in Southern California, W5 provides customers with solutions for all of their automated test, measurement, simulation and data acquisition needs. Covering Southern California since 1998, W5 brings over 100 years of engineering, sales experience and account knowledge. To find a representative in your area please visit our website. Events During the months of May and June, Geotest and its channel partners will be participating in a number of seminars and tradeshows: Next Generation Semiconductor Test Using PXI – May 15th Santa Clara, CA, June 5th Beaverton, OR, and June 12th Phoenix, AZ Geotest along with RTI and ZTEC Instruments are hosting a free seminar and lunch. Please join us to explore how the PXI platform can offer cost effective test solutions for verification, failure analysis, pilot production, and focused production test applications. For additional information about seminars in your area, please visit the seminar page on our website. Additional seminar locations are being added. If you are interested in hosting a seminar or lunch n learn event, please contact us. Electrotest Expo – May 23rd Trinity Centre Cambridge, UK ElectroTest is the U.K.'s third annual PCB debug and test exhibition for electronics design and test engineers. The expo will showcase products and technologies including benchtop ATE, oscilloscopes, PXI systems, Logic Analysers, and JTAG Boundaryscan Testers and Programmers, to name just a few. SMT Hybrid Packaging Conference – May 8th - 10th Nürnberg, Germany SMT Hybrid Packaging is Europe's leading event on System Integration in Micro Electronics. Meet the industry's leading companies for SMT-Equipment, Components and SMT-Services from 8 - 10 May 2012 in Nüremberg, Germany. Geotest will be exhibiting with our distributor Schneider and Koch at Booth #7-125. New-Tech 2012 – May 22nd - 23rd Tel-Aviv, Israel Geotest looks forward to showcasing our test product portfolio at the New-Tech 2012 exhibition in Israel. We will be exhibiting with our distributor RDT at Booth 25A-26A. PXI Technology and Applications Conference (PXI TAC) – May 23rd Taipei, Taiwan and May 29th Shanghai, China Now in its ninth year, PXI TAC is a well-recognized industrial event in the Greater China region. Featuring both applications and PXI technology tracks, PXI TAC offers attendees the opportunity to expand their knowledge about PXI products and their capabilities. Geotest will be exhibiting at both venues this year and Geotest's Sr. Product Marketing Manager, Mike Dewey, will be available to talk about our PXI – based semiconductor test portfolio as well as introduce several new PXI products. Integrating PXI Solutions – June 7th Kirkland, WA Recent advances in PXI systems and instrumentation now offer manufacturers lower cost test solutions for digital, and mixed signal test applications. Join Geotest for a free seminar and lunch to explore how the PXI platform can offer cost effective test solutions your test applications. For a complete list of future events visit the events page on the Geotest website.

Learn about PXI for Semiconductor Test: Complimentary Seminar and Lunch

Join Geotest along with Robson Technologies (RTI) and ZTEC Instruments for a free seminar and lunch to explore how the PXI platform can offer cost effective test solutions for verification, failure analysis, pilot production, and focused production test applications.   Today’s PXI products and systems now offer the capabilities and performance to support the verification and test of semiconductor devices. Learn how PXI can offer cost effective test solutions for semiconductor test by attending our seminars in California, Oregon, or Arizona.