We hope you enjoy this month's issue of Test Connections which includes new product updates and news events. Please send your comments or suggestions regarding this newsletter to marketing@MarvinTest.com. Geotest Introduces New Manipulator Option and Receiver for the TS-900 Semiconductor Test System The TS-900 Semiconductor Test System is now available with a new manipulator option and handler compatible receiver. The Reid-Ashman OM1069 manipulator is designed specifically for the TS-900 and allows precise positioning and flexibility for interfacing to automated probers and device handlers. Read more Using the GX5295's Level Comparators for Fast Go/No- Go Device Testing The GX5295 provides dual input level comparators for fast validation of a semiconductor's DC parameters. Read how you can use this feature to achieve fast DC parametric test capabilities by using the GX5295's limit testing feature instead of a measure / evaluate methodology. Read more Geotest Announces New Products Performance 6.5 Digit PXI DMM Expanded Digital File Format Support for DIOEasy-FIT New Release of CalEasy Geotest is pleased to announce the introduction of several new products including our new 6.5 digit PXI digital multimeter. The GX2065 offers a unique combination of features, resolution, accuracy and speed in a compact, single slot 3U PXI format. Geotest has also updated CalEasy and the DIOEasy file import tool with new software releases. Read more Newsworthy Happenings Geotest and our channel partners hope to see you at one of the upcoming tradeshows and seminars during the months of July and August. Currently, Geotest and our channel partners will be exhibiting at shows around the nation including Semicon West, Autotestcon, Sillicon Valley Test and International Test & Evaluation Annual Symposium in California, and Aircraft Worldwide Review in Utah. Read more

Looking to generate test applications faster? Open-architecture-based ATEasy is the answer. Download your no-cost 30-day trial today! Read on to learn more. Read the blog post here. Geotest’s GX5290 series of digital instrumentation offers the ability to trade I/O vector width for vector depth. The flexibility to reconfigure the instrument's memory is ideal for test needs requiring deep serial vectors such as boundary scan applications or serial communication links.Click here to learn more. Would you like to receive the Test Connections Newsletters on a regular basis? You can sign up at any time. Can't find what you're looking for? We'll build it for you. We also customize and adapt standard catalog products to meet your specific needs. Click here to request more information.

Geotest Introduces New Manipulator Option and Receiver for the TS-900 Semiconductor Test System

The TS-900 Semiconductor Test System is now available with a new manipulator option and handler compatible receiver. The Reid-Ashman OM1069 manipulator is designed specifically for the TS-900 and allows precise positioning and flexibility for interfacing to automated probers and device handlers. The manipulator's spring loaded design allows for easy alignment and docking to handlers – eliminating the need for a complex receiver interface. The TS-900's new handler compatible receiver offers the flexibility to interface to virtually any device handler. In addition, compatibility is maintained with the TS-900's current receiver, allowing users to interchange load boards between the screw down and slide receiver configurations.

Visit us at Semicon West to see how Geotest’s PXI-based TS-900 can offer a cost effective test solution for verification, characterization, failure analysis, pilot production, and focused production test applications. With a wide range of test capabilities for component, SoC and SiP test applications and supporting up to 512, 100 MHz channels with per-pin PMUs, the TS-900 includes a full-featured set of hardware and software capabilities for digital, mixed – signal and RF test applications. Click here to learn more about the TS-900 Semicon West - July 10-12, 2012 San Francisco, California Booth 6444 Click here for your complimentary exposition pass.

Using the GX5295's Level Comparators for Fast Go/No- Go Device Testing

Introduction
In the semiconductor production test world, test time or test throughput is a key attribute for any test system or test solution. Test engineers are constantly faced with providing fast but adequate testing of devices once they enter production test.  The underlying assumption is that the production tests "adequately" evaluate the operation and functionality of the UUT. Special emphasis is given to the word "adequate" because unlike the comprehensive functional and characterization tests that are done for design verification, production testing involves performing a subset of these tests.  Once a design has been verified, it is usually not necessary to functionally test every aspect of each device, or fully characterize the AC and/or DC parameters of each device during the production test cycle. An adequate subset of the functional and parametric tests is selected such that, if the UUT passes these tests, you have high confidence that the component will function correctly in its intended application.

Limit Testing
By limiting the number and scope of the tests performed, test time can be significantly reduced. And, as "time is money", reducing test time can save money, improve test system utilization, and directly impact the profitability of the overall business. However, limiting the number and scope of tests performed during production is not the only way to reduce test time. Limit testing can also be an effective time saver that will improve test time and yield without sacrificing quality. Limit testing is the practice of testing only to a minimum or maximum value to validate device parameters. For example, if a device is specified to provide a minimum 2.5V output under a specified load, it is not necessary to test the device to 2.6V. Nor is it necessary to actually measure the output voltage. So long as the device meets the minimum output threshold (or limit), it is considered within specification.

Testing to a specific limit or threshold, rather than measuring an actual value, can improve test time by utilizing comparators for the limit test, rather than making a measurement. The output of a comparator provides an instantaneous pass/fail indication of whether the parameter meets the minimum (or maximum) allowable value for the parameter being measured. A measurement is not only slower than using a comparator, but also requires that the measured value be evaluated against the pass/fail criteria. Typically this evaluation is performed in software, which is slower than a hardware comparison.

Limit Testing with the GX5295
Geotest's GX5295 can perform both measurements and limit testing. It offers a full-function, Parametric Measurement Unit (PMU) per pin which is capable of forcing voltage or current, and measuring current or voltage, respectively. It also provides a dual-threshold comparator for each pin with programmable minimum and maximum thresholds which can be used to validate whether or not a DC parameter meets an acceptable limit. By providing a dual-threshold comparator per pin, the GX5295 can be programmed with a unique minimum AND maximum limit for EACH pin, and then simply selecting for each pin which comparator output is used for a limit test. The output of the comparator is binary, "0" or "1", "pass" or "fail", "good" or "bad". No measurement is performed and no evaluation of the measured value is needed. Compliance for the measured parameter is known immediately. Additionally, the comparators can operate at the GX5295's maximum vector rate, minimizing the impact on throughput.

A block diagram for one GX5295 channel input is shown below. Each channel can be independently configured to operate in Digital I/O mode (DIO) or Parametric Measurement Unit mode (PMU). The DIO mode is useful for performing standard digital functional test; supporting both Digital Stimulus/Response and Digital Real-Time compare. The PMU mode is useful for making DC measurements or validating DC limits.

In PMU mode, the GX5295 can force a voltage or a current on each channel, and then measure the respective current or voltage. The measured value can also be passed to the PMU comparators for limit testing. Since each channel has fully independent control for the programmed high and low limit values for its comparator, as well as the force value, a complete DC validation of all input pin thresholds and output pin levels can be performed in a single measurement cycle. For bidirectional channels, two cycles would be required. Features and specifications for the GX5295 PMU are provided in the Table below:

Parametric Measurement Unit (PMU) Specifications:

Number of PMUs:	32, one per data channel 4, one per auxiliary channel (for timing / control functions)
Modes:	Force voltage, measure current Force current, measure voltage
Force Voltage Range:	-2 volts to +7 volts
Force Accuracy:	+/- 15 mV
Force Voltage Resolution:	16 bits
Force Current Ranges:	+/- 32 mA FS, +/- 8 mA, +/- 2 mA, +/- 512 uA, +/- 128 uA, +/- 32 uA, +/- 8 uA, +/- 2 uA FS
Force / Measure Current Accuracy:	Hi / Lo Current Limit Accuracy Measure Current Accuracy Current Range +/- 128 uA +/ - 64 uA 32 mA +/- 32 uA +/- 16 uA 8 mA +/- 8 uA +/- 4 uA 2 mA +/- 2 uA +/- 1024 nA 512 uA +/- 500 nA +/- 256 nA 128 uA +/- 128 nA +/- 64 nA 32 uA +/- 32 nA +/- 16 nA 8 uA +/- 20 nA +/- 4 nA 2 uA
Measure Voltage Range:	-2 volts to +7 volts
Measure Voltage Accuracy:	+/- 5 mV (measurement rate > 500 readings/sec +/- 1 mV (measurement rate  < 200 readings / sec
Hi / Lo Voltage Limit Accuracy	+/- 30 mV
High & Low Voltage Clamps:	VCLo: -2 to +5 V VCHi: 0 to +7 V
Voltage Clamp Accuracy:	+/- 100 mV

The DLL API functions for utilizing the GX5295 PMU functions are listed below:

Example – Limit Testing Using the GX5295
An example of a test setup and code for validating the output drive levels of a UUT is provided below. The UUT is a 10-bit full adder. There are 20 input signals mapped to GX5295 channels 0:19; Ain[0:9] and Bin[10:19]. There are 11 output signals, 10 bits for the sum and one bit for the carry. These signals are mapped to GX5295 channels 20:30.

The following test code example using ATEasy shows how to perform limit testing for validating the outputs of the UUT.  Using the GX5295’s limit comparators, verifying that the outputs meet the minimum Hi level of 1.5 volts or the minimum Lo level of 0.5 volts simply requires reading the results contained in the adwHighStates and adwLowStates arrays.

Example: ATEasy Code for limit testing UUT outputs

Summary
Using comparator-based limit testing can substantially improve the test throughput for DC parametric device testing without sacrificing test quality or coverage. Click here to learn more about the GX5295 or visit our knowledge base library for more information about testing semiconductor devices.

Geotest Introduces New Performance 6.5 Digit PXI DMM

Geotest is pleased to announce the introduction of their new 6.5 digit PXI digital multimeter. The GX2065 offers a unique combination of features, resolution, accuracy and speed in a compact, single slot 3U PXI format. Featuring 6-½ digit resolution, 0.005% basic DCV reading accuracy and up to 3,500 reading per second (rps) provides measurements that are accurate, fast and repeatable. All measurement functions including digitizing functions are isolated from the PXI bus – providing the ability to make true differential, floating measurements. An on-board controller performs all necessary DMM and digitizer calculations, minimizing PXI control bus overhead. Key features of the GX2065 include: 300 V DC or AC rms isolation barrier (CAT II) DCV, ACV, 2 & 4 – wire resistance measurements, and current measurements Market leading 3 MHz, 16 bit, isolated input digitizer which allows users to acquire and analyze waveforms. Up to 8192 samples can be stored in the digitizer’s memory Built in analysis and waveform functions include RMS, average, peak to peak, and peak to average Frequency and period measurements to 500 KHz

Instrument Software The GX2065 is supplied with a virtual instrument panel, which includes 32/64-bit Windows and Linux drivers as well as SMX2040 & SMX2060 compatible drivers, allowing customers to easily upgrade existing applications to the GX2065. The virtual panel can be used to interactively adjust and control the instrument from a window that displays the instrument’s current settings and measurements. Interface files are provided to support a variety of programming tools and languages including ATEasy, Microsoft® and Borland® C/C++, Microsoft Visual Basic®, Borland Delphi, and LabVIEW. To learn more about the GX2065 click here.

Geotest Adds New Features to DIOEasy's File Import Tool

Geotest has expanded it's digital software tools by enhancing the DIOEasy-FIT option. Geotest's DIOEasy-FIT option now offers test engineers a software tool set for importing and converting STIL, WGL, and VDC/eVCD files to a Geotest digital instrument file format. DIOEasy-FIT works in conjunction with Geotest's DIOEasy waveform display and editor sofware to provide an efficient tool set for developing, debugging, and executing digital test vectors for all Geotest dynamic digital instruments. When importing a file, the user can specify the clock rate for the digital instrument's step rate. If the specified clock rate is too slow or cannot satisfy the timing constraints defined in the imported file, an error is returned. The generated DIO file supports both stimulus / response and real-time compare (RTC) modes of operation.

To learn more about the DIOEasy-FIT option click here.

Geotest Releases CalEasy1.2

Geotest has just released  CalEasy 1.2 which now offers calibration and verification support for the GX5295 as well as supporting the GX5055 and GX5960 digital instruments. CalEasy offers all of the necessary tools and functions to support in-house calibration including:

• Verification of instrument calibration and operation

• Re-calibration of instruments

• Generation of verification / calibration logs with auto-save and print options

• Generation of new calibration certificates

• Customized calibration certificates

To learm more about CalEasy, click here.

Newsworthy Happenings

Upcoming Events

Geotest and our channel partners will be participating in a number of national and international tradeshows and events. Come visit us if you’re attending these shows:


More than 30,000 Engineers, fab managers, and executives from across the microelectronics industry and around the world will be at Semicon West to discover new technologies, sourcing answers and solutions, and connecting with suppliers and partners.

Visit Geotest at the Semicon West show where we will be showcasing the PXI-based TS-900 Semiconductor Test System and the new manipulator option for automated handler applications.  

Click here for your complimentary exposition pass.

Mittaus & Testaus, August 29^th - 30^th
Malminkartano, Helsinki, Finland
Booth: B-7
Mittaus & Testaus is the Test and Measurement event organized by the AEL and 3T-Journal held in Helsinki, Finland. This event is intended for automation, electronics, electrical power, computer and communications equipment for measurement, testing and maintenance professionals.

Silicon Valley Test Workshop, August 29^th - 30^th
Santa Clara, California
The Silicon Valley Test Workshops focus on all the aspects associated with wafer and packaged die characterization, debug, final test and failure analysis. The conference explores improved use of test techniques and methods to improve the accuracy and reduce the time to bring a product to volume production. This includes RF, Analog and Mixed Signal products along with Digital devices. See hardware and interface of the DUT to the Test Stimulus and Measurement systems including Probe Cards, ATE boards, calibration methods, test sockets, and more.

SEMICON West Taiwan, September 5^th - 7^th
Taipei City, Taiwan R.O.C
Booth: 834
Taiwan has established itself as a global center of semiconductor manufacturing excellence, boasting the most advanced and competitive supply chain in the world. At SEMICON Taiwan 2012, Geotest will reach Taiwan's biggest and most important device maker and supply chain companies.

AUTOTESTCON, September 10^th - 12^th  
Anaheim, California
Booth: 601
This will be the 48th edition of the Systems Readiness Technology Conference that is commonly known as AUTOTESTCON. This major conference and exposition provides focus on the maintenance aspects of systems readiness and providing Mission Assurance through Advanced ATE. IEEE AUTOTESTCON is the world’s premier conference that brings together the military/aerospace automatic test industry and government/military acquirers and users to share new technologies, discuss innovative applications, and exhibit products and services.

International Test & Evaluation Annual Symposium, September 17^th - 20^th
Huntington Beach, California
Booth: 111
The International Test and Evaluation Association (ITEA) symposium gathers annually to advance the exchange of technical, programmatic, and acquisition information among the test and evaluation community. Attendees will learn and share with others from industry, government, and academia, who are involved with the development and application of the policies and techniques used to assess effectiveness, reliability, interoperability, and safety of existing, legacy, and future technology-based weapon and non-weapon systems and products throughout their lifecycle.

In the News

Geotest Welcomes AGM Technical Solutions
AGM Technical Solutions, LLC (www.agmtechsol.com) has joined with Geotest to provide sales support for the TS-900 PXI Semiconductor Test System. "The TS-900 tester fits nicely," says Arno Marcuse, President of AGM Technical Solutions (arno@agmtechsol.com). "With the Geotest TS-900 tester we are able to offer Geotest customers a complete solution including top boards, DUT boards, socketing, custom interfacing and automation. Our sales staff, including the recent addition of Roland Parker in Colorado Springs, offers over 50 years of semiconductor ATE sales experience.” AGM will support customers in Arizona, Colorado, New Mexico and Utah.

Fletcher Technologies Joins Geotest
Fletcher Technologies, Inc. (FTI) has joined Geotest to provide sales and product support for our semiconductor test products in the CT, MA, ME, NH, RI, and VT areas. FTI has offices in Winchester, Massachusetts, and offers test and debug equipment and consumables to the semiconductor and microelectronics industries, colleges, and solar/PV sector. FTI assists engineers and designers in the development and manufacture of semiconductor devices to perform tests associated with design verification, debug (failure analysis), device characterization, qualification, reliability, and final test. For more information about FTI, please call (781) 756-0630, email sales@fletchinc.com, or visit their website www.fletchinc.com.

Geotest adds SE Technologies as TS-900 Sales Representative
Geotest welcomes SE Technologies, who will be providing sales and product support in Taiwan for the TS-900 Semiconductor Test System. Founded by Mr. Jason Wang, a former HP (Agilent) technical manager, SE originated from engineers who understand the needs of engineers. SE’s headquarters are located in Hsin-Chu, also called "Taiwan Silicon Valley", and has branches in Taipei, Taichung and Shanghai. For more information about SE Technologies, please call +886-3-579-9029, email jasonw@se-group.com, or visit their website www.se-group.com.

Geotest Participates in PXI Technology and Applications Conference in Taipei and Shanghai
During the month of May, Geotest participated with other PXI suppliers and integrators at the PXI TAC event, a well-recognized industrial event in the Greater China region. Featuring both applications and PXI technology tracks, PXI TAC offered attendees the opportunity to expand their knowledge about PXI products and their capabilities.  Attendance at both events was excellent with over 600 people attending the Taipei event and over 700 people participating in the Shanghai event.  We would like to thank our distribution partners Skywave Systems Corporation and MTCS Systems Engineering for coordinating and assisting with these two events.

Taipei:




Shanghai:

Trade Publication News

Recent press news about Geotest and our products can be found here:

• Nasa Tech Briefs May 2012:  Listed in OEM Supplier Guide: Test & Measurement Page 33

• Test & Measurement World May 2012: TS-900 PXI Semiconductor Test System Ad Page 23

• Electronique May 2012: Geotest Rolls Out PXI for Semiconductor Test with TS-900
  (Mike Dewey & Victor Fernandez)  Page 68

• Electronique May 2012:  TS-900 PXI Semiconductor Test System Ad Page 79

• Electronics Manufacture & Test May 2012: PXI Column (Loofie Gutterman),
  PXI for Semiconductor Test ( Mike Dewey) & TS-900 Ad

• Evaluation Engineering June 2012: TS-900 Semiconductor Test System Ad , Back Cover

• Electroniknet.de June 25 issue: GX2065 product announcement, click here to view.

Don't Miss Geotest's PXI for Semiconductor Test Seminars

Semiconductor test engineers and other professionals involved in test and validation participated in Geotest's PXI for Semiconductor Test Seminars around the nation in May and June. Each seminar included a PXI overview, Semiconductor test with PXI – instrumentation and systems, hands-on test demonstration, and applications using PXI.

If you missed these seminars, and would like to participate in upcoming events let us know at info@geotestinc.com or +1 (888) 837-8297, +1 (949) 263-2222.

Click here to request a PXI for Semiconductor Test seminar in your area.