We hope you enjoy this month's issue of Test Connections which includes new product updates and news events. Please send your comments or suggestions regarding this newsletter to marketing@MarvinTest.com. AUTOTESTCON 2013: ATS Innovation in the Era of Challenging Budgets The 49th annual AUTOTESTCON conference takes place September 16 – 19 in Chicago, Illinois and targets ATE leaders, commercial and government attendees to explore the latest technologies supporting the production and maintenance of mil-aero products and systems for the military and aerospace organizations. Visit Marvin Test Solutions (formerly Geotest-Marvin Test Systems) in Booth 307 to view our full range of innovative test solutions. Read more Upgrading the AN/TSM-205 – Hellfire Flightline Test Set Initially developed in 1992 and based on the ISA form-factor, the AN/TSM-205 has become the U.S. Army’s standard field tester for supporting Hellfire Launcher used on a variety of helicopter platforms. On-going technology and product enhancements, led Marvin Test Solutions to develop the AN/TSM-205B which is based on the PXI architecture and builds on the success and capabilities of the AN/TSM-205.   Read more Marvin Test Solutions Introduces New Products At the AUTOTESTCON 2013 show, Marvin Test Solutions will be introducing several new products: ATEasy 9.0 – Test Executive and Software Development Suite 21 slot, PXI Express chassis 100 MHz, multi – time set PXI digital I/O card ICEasy semiconductor test library Read more Upcoming Events Get details about tradeshows and other current news about Marvin Test Solutions and our distributors. We hope to see you at one of the upcoming events. Read more

Looking to generate test applications faster? Open-architecture-based ATEasy is the answer. Download your no-cost 30-day trial today! Marvin Test Solutions has recently released several software packages for its products. Read on to learn more. Read the blog post here. Interested in understanding how you can use an XML File to Load Test Parameters into an ATEasy Program? Extensible Markup Language (XML) is a textual data format with strong support via Unicode.Click here to learn more. Would you like to receive the Test Connections Newsletters on a regular basis? You can sign up at any time. Can't find what you're looking for? We'll build it for you. We also customize and adapt standard catalog products to meet your specific needs. Click here to request more information.

AUTOTESTCON 2013:  ATS Innovation in the Era of Challenging Budgets

Despite the impact of Sequestration on government and military budgets, there is an on-going focus by all the services to ensure that the U.S. military continues to be the strongest and best in the world to protect and defend U.S. national interests. AUTOTESTCON's show theme and technical program are focused on how ATE innovations can provide cost effective and innovative test solutions for both future and current armament, avionics, and communication systems.
This year at AUTOTESTCON, Marvin Test Solutions will be featuring a range of test solutions that demonstrate our continuing commitment to delivering systems that provide outstanding value and performance for our military and aerospace customers. Visit us in booth 307 to see an array of products supporting operational, intermediate, and depot level test including the MTS-3060 SmartCan™ an innovative universal O-level test set that addresses the armament test gap for 4th and 5th generation fighter aircraft.
Attend our Technical Presentations Marvin Test Solutions’ CEO, Steve Sargeant, Major General USAF (ret) will be a panelist in Wednesday’s executive plenary “Automatic Testing for the Next Decade - Keeping Pace with the New Military” and will address “Bridging the Armament Test Gap”. Session time: Wednesday, September 18th; 8:00 AM Additionally, Marvin Test Solutions’ staff will be presenting two papers at this year’s conference: "Incorporating Optical Test Capabilities into a Depot Test Platform" by Mike Dewey, Sr. Product Marketing Manager & Lowell Parsons, Sr. Program Manager Session time: Tuesday, September 17th; A1 session, 2:00 PM – 3:30 PM "Instrument, Hardware and Software Simulation in a Test System" by Ron Yazma, VP of Software Engineering Session time: Thursday, September 19th; A8 session, 10:45 AM – 12:15 PM For more information about the technical program at AUTOTESTCON, please review AUTOTESTCON's program guide or email Lori Lai.

Upgrading the AN/TSM-205 – Hellfire Flightline Test Set

The AN/TSM-205B is latest generation tester in the AN/TSM-205 family and offers state-of-the-art portable test capability for the Hellfire and Longbow systems - combining the capabilities of an I-Level test set in a compact, rugged, flightlline qualified enclosure. The test system performs parametric functional tests on the integrated Hellfire and Longbow systems as installed on the aircraft and can test the entire fire control system from the cockpit switches to the launch rails.  Additionally, the AN/TSM-205B is capable of performing a full functional, parametric test on the M310 and M299 launchers as well as on the launchers’ electronic assembly (LEA) with a test time improvement of 65% for a full launcher test compared to legacy AN/TSM-205 test sets. The result is a test platform that offers test capabilities for both flightline as well as I-level test, providing cost-effective and simplified armament logistics.

Enhanced AN/TSM-205B Capabilities
Included with the AN/TSM-205B System is the Hellfire Missile simulator (MT3045) which provides additional system test capabilities.  The MT3045 can be used as a stand-alone missile simulator and is configured by its front switch panel.  The unit receives its power via the launcher when mounted directly on the aircraft.  Alternatively, the MT3045 can be used in Missile Simulation mode.  This mode is similar to the stand-alone mode, except that control of the MT3045 is provided via the AN/TSM-205B which can display real time measurements and activity of signals being received by up to two missile rails.  The monitored signals are defined by a setup screen on the 205B tester.  Besides providing a complete automated test of the launcher system, the automated mode also provides the ability to inject faults related to Laser codes and Missile BIT.  The AN/TSM-205B and MT3045 offer a powerful flightline test solution for verifying the flight-readiness for complex airborne armament.

Stop by our booth to see the AN/TSM-205B and our other PXI-based, flightline test sets.
Click here to learn more about the AN/TSM-205B.

AN / TSM 205B & MT3045

AN/TSM 205B User Interface

Marvin Test Solutions Introduces New Products

ATEasy 9.0 ATEasy 9.0 is the latest release of Marvin Test Solutions’ test executive and software development suite. A product that was initially released in 1991, ATEasy 9.0 is backward compatible with previous releases – preserving a customer’s investment in existing TPS’.  One of the many new features of ATEasy is the UUT / tester simulation mode which allows users to fully simulate their test program without system hardware or the UUT. Unlike other hardware simulation methods, ATEasy offers a comprehensive simulation environment including measurement values as well as program flow based on simulated interaction with the tester and UUT.
21 slot, 3UPXI Express Chassis – GX7200 Always an innovator in the PXI product space, Marvin Test Solutions has introduced a new 21 slot, PXI Express chassis, which offers the most PXI slots in the industry. Featuring a single slot controller and a 4x4 lane configuration, the GX7200 can support backplane data rates up to 8 GB/s and peer to peer communication. With a generous combination of PXI-1, PXI hybrid, and PXI express slots, the GX7200 is the ideal platform for users that want to migrate to a PXI express system and yet preserve their investment in PXI-1 modules. Like other MTS PXI chassis, the GX7200 supports Smart features which includes per slot temperature monitoring and power supply monitoring.
Timing per Pin 3U PXI digital I/O card – GX5296 Marvin Test Solutions’ newest digital card, the GX5296 represents a new level of performance in the world of PXI digital test. Incorporating the advanced features found in proprietary semiconductor ATE and high-end board test systems, the 32-channel, GX5296 offers timing per pin, multiple time sets, data formatting, and an advanced sequencer – providing users with the capability emulate and test complex digital busses for system, board or device applications.  Offering 1.25 ns edge placement resolution per pin and a PMU per pin, the GX5296 has the ability to perform DC and AC parametric testing for both digital and mixed-signal devices. And when combined with Marvin Test Solutions’ TS-900 semiconductor test system, the GX5296 offers users the flexibility to test a range of devices including digital, SoC and SiP devices.
ICEasy Semiconductor Test Library Marvin Test Solutions’ new ICEasy test library adds significant new capabilities to the TS-900 platform. Easily incorporated into the TS-900’s software framework (ATEasy), ICEasy simplifies the creation and execution of standard device tests as well as offering  interactive tools for plotting I-V characteristics and performing  two-dimensional Shmoo plots. Make sure you stop by our booth at the International Test Conference show which is being held in Anaheim, CA, September 10th - 12th, where we will be demonstrating the TS-900 and ICEasy. To learn more about the TS-900 and the ICEasy tools, click here.

Upcoming Events

Marvin Test Solutions will be exhibiting at several events during the months of September and October. Please stop and see us if you are attending any of these events.

International Test Conference, September 10^th – 12^th
Anaheim, CA
Booth 311
The International Test Conference offers the latest in semiconductor test. From Tutorials to Panels, to Keynote Speakers, to Exhibits, to Parties and ending with Workshops, ITC is the best place to be to increase your test knowledge, and to establish or re-establish your ties to others working in test.

AUTOTESTCON, September 16^th – 19^th
Schaumburg, IL
Booth 307
IEEE AUTOTESTCON is the United States’ largest conference focused on automatic test systems for US military systems, and has been held annually since 1965. The Conference, whose general theme is The Support Systems Technology Conference, is held in varying cities around the US each fall. Administered by a standing Board of Directors, the Conference typically presents over 120- quality application-focused papers with over 250 Exhibits, all focused precisely on the current issues facing military automated test.  

Electrotest Expo, September 19^th
The Shuttleworth Collection, Old Warden, Nr Bigglewades, Beds, UK
Marvin Test Solutions will be participating at the upcoming ElectroTestExpo show on September 19th, 2013. We invite you to join T&M and ATE professionals for a series of PCB debug and test presentations. During the event, you can learn about the "Integration of Software Technologies into a Test System", which will be presented by Victor Fernandes, Marvin Test Solutions’ European Sales Manager.

Air Armament Symposium, October 8^th – 9^th
Fort Walton Beach, FL
Booth 54 and 55
For the 36th year, the Air Armament Center is partnering with the National Defense Industrial Association to host its annual Air Armament Symposium in Fort Walton Beach, FL. The symposium, a two-day forum for both industry and government personnel, and offers the opportunity to exchange information, recognize acquisition challenges and better understand warfighter requirements.

Semicon Europe, October 8^th – 10^th
Dresden, Germany
Booth 1407
SEMICON Europa is the place to see the leading companies, technologies, and people driving the future of micro- and nanoelectronics design and manufacturing. SEMICON Europa exhibitors are the suppliers to and partners of Europe’s leading microelectronics companies. From silicon to system - and everything in between and beyond - SEMICON Europa showcases the biggest and brightest names in microelectronics manufacturing.

WEPTAC, October 20^th – 23^rd
Tucson, AZ
Warfighters from throughout the United States will gather in Tucson, AZ for the 32nd annual Weapons and Tactics Conference (WEPTAC).

AUSA, October 21^st – 23^rd
Washington, D.C.
Booth 3639
Held every October in Washington, D.C., the AUSA ( Association of United States Army) Annual Meeting is the largest land power exposition and professional development forum in North America. The Annual Meeting consists of informative presentations, panel discussions on pertinent military and national security subjects, workshops and important AUSA business meetings.

Silicon Valley Test Workshop, October 29^th
Santa Clara, CA
Booth 20
The Silicon Valley Test Workshop is the only workshop on Semiconductor test that is based in San Jose, California. The SV Test Workshop event focuses on all aspects associated with wafer and packaged die characterization, debug, final test and failure analysis. Additionally, there will be PXI workshop and exhibition the same day, which focuses exclusively on the world’s most popular modular Test, Measurement and Automation platform.   Conceived and organized by a group of Test professionals, the workshop offers Design, Test & Production managers and engineers a convenient venue in which they can find out about the latest developments in PXI from the industry’s leading experts.

Channel Partners

• Marvin test solutions signs distributorship with Aero Precision
  Marvin Test Solutions is pleased to announce a new worldwide partnership agreement with Aero Precision, a Greenwich AeroGroup company, for the marketing, distribution and resale of its military test systems.
  “Our solutions have demonstrated reliability and performance for nearly two decades,” said Major General, USAF (Ret.) and Chief Executive Officer of Marvin Test Solutions Steve Sargeant. “Partnering with Aero Precision will provide enhanced marketing and distribution capabilities for our military systems used daily worldwide. We believe this relationship will provide our customers with increased mission readiness and operational efficiency. ”

• Marvin Test Solutions welcomes two new sales organizations
  Sun Force which is located in the Southeast U.S.  and  Telexus Ltd located in the U.K. join Marvin Test Solutions' sales channel organization and will be representing its line of PXI products, systems and software.

Recently Updated Software

Marvin Test Solutions has recently released the following software:

• GXDMM, Version 1.4
  The GXDMM driver which supports the GX2065 DMM has been updated with the following capabilities:
  - Added Auto Zero control for Firmware version B.B.0 and newer.
  - Fixed GxDmmMeasure behavior when in continuous trigger mode to automatically switch to software trigger mode.
  - Improved calibration calculations.
  - Improved Signametrics compatability.
  - Updated HW 4.7.0 to include registry and folder changes from Geotest to Marvin Test Solutions.
  - Updated documentation to reflect new company name.

• GTDEMO, Version 1.0
  The GtDemo software package supports the GT98901 demo board and  can be used as part of the ATEasy training package.

• HW, Version 4.7.0
  The hardware access driver has recently been updated with the following capabilities:
  - Support for USBTMC filter installation.
  - Support for Windows 8,  x64 machine.
  - Company name updated from Geotest to Marvin Test Solutions.
  - Fixed issues related to Windows 7/8 security updates.
  - Updated documentation and copyright information to reflect the new company name.

• ATEasy 8.0, Build 148c
  This version of ATEasy 8.0 includes updates to the IDE, run time, file management, drivers and the test executive.
  Click here to access the ATEasy readme.txt file for detailed information about this release.

      

• GtDIO, Version 5.0.64.3
  The GTIO driver which supports all MTS dynamic digital cards (except the GX5960) has been updated with the following capabilities:
  - Ability to import STIL files.
  - Driver updates to fix truncating number of steps and calibration license for the GX5295 and GX5055.
  - Fixed Panel error messages for GX5280 and GX5055
  - Driver update allows system memory resources to be used more efficiently.
  - GX5280 updates:
      * Fixed HALT or ARM command  - generates  an error when clock frequency is less then 500Hz
      * Setting number of steps in a DIO file to less than 16K generates an error (fixed).
      * Occasionally running a short loop (number of loop steps less than 256 (vector steps) will produce the wrong output (fixed)
  - GX529 updates:
      * First voltage measurement taken right after calling HALT will give a wrong value (fixed).
      * Calling DioHalt will set all outputs to tri-state(fixed).
      * Added support to DioReadIOPinsValidity API.
      * Setting one channel mode will disable all channel outputs (fixed).
  - DIOEasy updates:
      * DIOEasy hangs when filling Gx5055 DIO file direction and clicking the “End” button (fixed).
  - DIOEasy-FIT updates:
      * Installing a new license reports that the license was installed successfully, but trying to import a WGL file will ask
        for a license (fixed).
      * Vcd/eVcd file import does not work when the file contains a TimeScale setting of 1ns and the import cycle setting
         is 10ns (fixed).

• GtDio6x, Version 1.3
  The GtDio6x driver which supports the GX5960 digital subsystem has been updated with the following capabilities:
  - Revised GtDio6x Panel GUI.
  - Improved User Guide with added Theory of Operations chapter and revised Specifications.
  - Addition of C# example and interface files.
  - Addition of GtDio6xSetChannelTest and GtDio6xGetChannelTest functions.
  - Revised parameters stepclock.
  - Revised timing mode constants.
  - Revised System Clock source constants.
  - Updated documentation and copyright information to reflect the new company name.

          
You can access all recent updates here.