Welcome to our first issue of Test Connections for 2017. If you are a first time recipient, welcome! And, if you have been following us through our newsletters for a while, welcome back!
Q-1 is proving to be both challenging and successful, as we expand our offerings for our military, aerospace and manufacturing customers. In fact, in all areas there are some exciting developments, including enhancements we are offering to legacy semiconductor test sets.
Many of you have expressed great interest in our advanced test solutions that make test easyTM from the factory to the flightline and to the depot for military and aerospace customers. The same excitement is being exhibited in the production arena for our manufacturing customers.
Our suite of solutions supporting armament test - including the MTS-3060 SmartCan™ Universal O-Level Armament Test Set - has been featured and a big attraction at many recent trade shows and events. If you were not able to attend, we invite you to explore our web site or contact us to learn more.
With a great 2016 behind us, we look forward to working with you in 2017, delivering innovative test solutions and offering unrivaled long-term support.
We hope you enjoy this month's issue of Test Connections which includes new product updates and news events.
Please send your comments or suggestions regarding this newsletter to marketing@MarvinTest.com.
TS-217A Universal Armament Test Set |
Marvin Test Solutions has recently upgraded the TS-217, a Universal Armament Test Set which supports a variety of launchers, pylons, and bomb racks as well as suspension and release equipment, providing full parametric test and troubleshooting capabilities. |  |  Read more
Trade In Your Legacy Test System! |
Trade in your legacy Teradyne L2xx or L3xx, GenRad 275x, Schlumberger S790, or VXI-based system and get a discount of up to $500,000 on a new GENASYS single-bay or two-bay system with enhanced capability and PXI flexibility. |  |
Read more
User Programmable FPGAs |
Field Programmable Gate Arrays (FPGAs) are an integral part of today’s electronic products. Marvin Test Solutions’ FPGA products offer users the flexibility to create high-performance, customized PXI instrumentation for both digital and mixed-signal applications. | 
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TS-217A Universal Armament Test SetA Complete Test Solution
Marvin Test Solutions has recently upgraded the TS-217, a Universal Armament Test Set which supports a variety of missile launchers, pylons, and bomb racks as well as suspension and release equipment. The TS-217A provides full parametric test and troubleshooting capabilities. The TS-217A features upgraded instrumentation, a new mass termination interface and enhanced test capabilities, providing a complete test solution for I-level or Depot level test.
Marvin Test Solutions’ TS-217A Universal Armament Test Set supports I-Level test for a variety of armament systems on F-16, F-15, A-10, and F/A-18 aircraft, including:
- AMRAAM Launchers (LAU-115, LAU-116, LAU-127, LAU-128, LAU-129)
- Maverick Launchers (LAU-117, LAU-188)
- Sidewinder Launchers (LAU-7)
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I-Level and Depot Level Test
In the depot level configuration, the system also supports testing of subassemblies at the LRU level.
Providing full parametric test with troubleshooting capabilities, the TS-217A is a complete solution designed to ensure mission readiness for these complex systems.
To ensure flexibility and support both current and evolving test requirements, the TS-217A is based on the PXI platform and includes:
- ATEasy® Test Development and Test Executive software suite
- BIT, Self-Test and Automated Calibration
- Automatic Data Collection
- Optional Optical Bench with Laser Detector Assembly and Solid State Target Simulator
Optional TS-217A Optical Bench
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Trade In Your Legacy Test System!
Thinking your legacy test system is worthless?
Think again!
Now, your legacy Teradyne L2xx or L3xx, GenRad 275x, Schlumberger S790, or VXI-based ATE system can be worth up to $500,000 when you buy a new GENASYS single-bay or two-bay system between 7/1/17 and 6/30/18. Contact us for more details on this limited-time program.
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The Ideal Legacy ATE Replacement Solution
Maintaining test systems with extended life cycles is a constant challenge for test engineers. When the entire legacy system is no longer supportable through the replacement of individual components, the GENASYS platform provides complete system replacement to achieve equivalent or better capability.
Marvin Test Solutions’ GENASYS mixed-signal test platform is an ideal solution for replacement of legacy testers such as the Teradyne L200/L300, GenRad 2750, Schlumberger S790, or VXI- based functional test systems.
Based on the PXI standard, the GENASYS platform provides high-performance digital / mixed-signal test capabilities either as a system or subsystem for both legacy and next generation factory and depot test needs.
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| A Comprehensive Suite of Solutions |
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GENASYS systems are available in single-bay (TS-321 Series) and 2-bay (TS-323 Series) configurations as well as switching and switching/digital subsystems, and feature a PXI-based architecture, offering a compact footprint, expandability, and flexibility for addressing a wide range of current and future functional test needs.
Key features of the GENASYS architecture include:
- A modular, hybrid switching subsystem for digital and mixed-signal test applications
- Scalable architecture supporting up to 4500 interface test points
- Subsystem configurations that support the integration of GENASYS switching, high performance digital, and PXI instrumentation in one compact chassis
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GENASYS systems include comprehensive development and deployment software:
- ATEasy® test executive and test development software suite
- SwitchEasy which simplifies the programming of the switching subsystem
- L200 driver to assist with the migration of L200 and L300 programs
For applications that require the importing of LASAR .tap files, Marvin Test Solutions’ optional
DtifEasy can be used to import and execute LASAR-based digital vector files for go / no-go, fault dictionary, and guided probe applications.
To learn more about how GENASYS can address your legacy test needs, visit our web site to browse our
Knowledge Base and to download the white papers, "
Solving Functional Test Obsolescence" and
Addressing Legacy ATE System Requirements with PXI.
User Programmable FPGAs
Field Programmable Gate Arrays (FPGAs) are an integral part of today’s electronic products. Marvin Test Solutions’ FPGA products offer users the flexibility to create high-performance, customized PXI instrumentation for both digital and mixed-signal applications.
To a large degree, FPGAs have replaced custom and semi-custom ASICs – allowing the creation of high performance products without requiring the high investment / design costs associated with ASICs. The low investment / high performance attributes of FPGAs make these devices ideal for creating advanced instrumentation and more specifically, card modular PXI products that offer both performance and high functionality.
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FPGA Technology - A Key Enabler for PXI Products
The advanced technologies available to PXI vendors have been the catalyst for creating card modular products with capabilities and performance that rival and even surpass traditional "box" instrument capabilities. The explosive growth of FPGA technology and highly integrated mixed signal ICs has resulted in the availability of advanced digital instrumentation as well as user programmable FPGA products. For example, today’s advanced PXI digital instrumentation offers both PMU and digital test functionality in a single 3U PXI module (Figure 1), providing the capabilities to cost-effectively test semiconductor devices as well as providing the basis for a complete semiconductor test system (Figure 2) which can support up to 512 digital test channels in a compact, bench top configuration. Similarly, FPGAs have enabled the creation of very high channel count, 3U PXI products (figure 3) that support 64 arbitrary waveform channels, providing users with the ability to simulate high channel count sensors for system test applications.
| | | | | Figure 1: Digital Instrument with PMU | | Figure 2: PXI Semiconductor Test System | | Figure 3: 64-Channel AWG |
FGPA Technology for Test Engineers
FPGA technology has also found its way into the hands of test engineers. FPGA - based cPCI products have been available for a number of years and typically have been used by design engineers as part of an embedded system design. However, the design tools for these products and the integration of these products into an overall system has been complex and time-consuming, limiting their adoption within the test engineering domain. However, today’s user programmable FPGA cards are allowing test engineers to create their own custom instruments without the complexities normally associated with FPGA design and integration.
Marvin Test Solutions offers a range of user programmable FPGA products that employ Altera FPGAs. All of these products employ a base board / user-defined daughter board architecture (Figure 4), allowing users to create their own custom analog or digital interface circuitry.
Figure 4: PXIe FPGA Card with Base Board and Daughter Card
As shown in Figure 4, users can create their own custom circuitry or 3U PXI / PXIe instrument by designing a custom expansion board for their specific application without resorting to bulky, external interface boards. And since the daughter board and associated front panel connections are integral to the board’s design, users have the freedom to choose multi-pin or coaxial connections, depending on the application. Alternatively, the user can elect to use the supplied generic expansion board which provides access to the FPGA’s I/O via (4) 68 pin SCSI 3 interfaces located at the front panel of the card.
To simplify the overall design and integration process, MTS’ PXI FPGA cards also offer the following features and capabilities supporting full PXI functionality:
- On-board 80 MHz oscillator for use as an FPGA timing reference
- Access to the 10 MHz PXI clock and the 100 MHz PXIe clock (for PXIe FPGA version)
- Access to all PXI trigger and local bus signals
Programming and integration of PXI FPGA cards has also been simplified by partitioning the user FPGA separate from the PCI interface - eliminating the need for the user to incorporate the PCI interface as part of his or her overall FPGA design. As Shown Figure 5, all MTS FPGA cards employ this partitioned architecture.
Figure 5: FPGA PXI Architecture
For the design of the FPGA, users can employ Altera's free Quartus II Web Edition tool set which supports all of MTS’ FPGA cards. And for more complex designs, users can employ Altera’s Quartus II subscription edition software. Both schematic entry and VHDL methods are supported. Once the FPGA design is compiled, the configuration file can be loaded into the FPGA via the PXI bus interface or via an on-board 16MB EEPROM - providing users with an easy way to incrementally design / test / modify their FPGA code. In addition, all MTS FPGA cards are supplied with both an API and an interactive UI, facilitating loading of the compiled design. Additionally, predefined registers are used to provide control and monitoring of the user FPGA’s functions - simplifying overall development and deployment of the design. The result is a user FPGA card that is easy to develop while offering the flexibility and performance associated with FPGA-based designs coupled with the standardization and open architecture of the PXI platform.
Today’s user programmable FPGAs offer test engineers the flexibility to design specialized and complex test instrumentation. With simplified design tools and instrument architectures, it is now possible to create custom instrumentation and designs that can address a range of application specific digital and analog test applications.
For product information and data sheets, please visit our web site.
To learn more about uses and advantages of FPGAs, visit Marvin Test Solutions' online Knowledge Base to download informative articles and white papers that address FPGA technology.
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Newsworthy Happenings at Marvin Test Solutions
Connect With Us
Connect with MTS on social media (LinkedIn, Twitter, and Facebook) to learn more about how we make test easyTM, and visit our YouTube channel to view our latest video: Making Electronic Test Easy
Recent Trade Shows
Our busy trade show calendar has brought us some exciting opportunities to connect with customers all over the world and learn more about the test challenges they are facing. This interaction is key to our goal of making test easy by understanding our customers’ requirements and delivering the solutions and support they need to ensure mission success.
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Upcoming Trade Shows and Events
Marvin Test Solutions will be attending or exhibiting at the following shows and events.
To arrange a meeting, contact: Donna01@MarvinTest.com
CTMA Annual Partners Meeting
April 3 - 5, Hill AFB, Utah
AFA ACC Langley Airpower Symposium
April 12 - 14, Langley AFB
AAAA Army Aviation Mission Solutions Summit
April 26 - 28, Gaylord Opryland, Nashville, TN
AMRAAM Air to Air International Users’ Review 2017
May 1 - 5, Dallas, TX
Special Operations Forces Industry Conference
May 15 - 18, Tampa Convention Center, FL
Paris Airshow
June 19 - 25, Salon de Bourget, Paris
Trade Publication News
Evaluation Engineering October 17, 2016
Test Software Special Report: Driving Your Instruments' Out-of-the-Box Experience
Evaluation Engineering October 17, 2016
Industry Happenings: AUTOTESTCON Balances ATE Cost, Performance, and Resiliency
Military & Aerospace Electronics November 1, 2016
Time to Invest in Test and Measurement Tools
Evaluation Engineering November 28, 2016
Communications Test Special Report: Tackling Challenges in the Time and Frequency Domains
ACTUTEM (French) December 13, 2016
L’architecture de commutation PXI GENASYS de Marvin Test Solutions vise à simplifier le développement des systèmes de test
ElectroniqueS (French) January, 2017
Le test et la mesure accompagnent les evolutions en aeronautique et en defense
Evaluation Engineering January, 2017
Switching Systems Special Report: High or Low Density Matters
Press Releases
January 9, 2017 MTS-209 Selected to Support Thailand T-50 Aircraft
Marvin Test Solutions’ MTS-209 Common Armament Test Set has been selected by Korea Aerospace Industries (KAI) as part of the support package for a group of T-50 aircraft purchased by the Thai Air Force in 2015 and slated to complete delivery over the next 24 months. The new aircraft will replace aging L-39 Albatros trainers. Read more >>
February 7, 2017 Marvin Test Solutions Highlights Advanced Armament Test at Aero India 2017
Marvin Test Solutions (MTS), Inc joined Marvin Engineering Corp (MEC) to represent The Marvin Group at Aero India 2017, February 14 - 18 at Air Force Station Yelahanka, Bengaluru, India. MTS showcased the MTS-209 Common Armament and the MTS-3060 SmartCan™ Universal O-Level Armament Test Sets, both currently deployed worldwide to support legacy and next generation aircraft armament and munitions test requirements. Read more >>
February 15, 2017 Marvin Test Solutions Features Advanced Armament Test Solutions at Avalon 2017
Marvin Test Solutions, Inc. (MTS) joined its distributor Aero Precision as a returning co-exhibitor, showcasing a range of mil/aero support equipment that ensures mission readiness from the flightline to the depot at the Australian International Aerospace & Defence Exposition (Avalon 2017), February 28 - March 5 at Avalon Airport, Geelong, Victoria, Australia.
Read more >>
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ATEasy 10 Beta 3
A beta version of ATEasy 10 is now available for users to evaluate and test drive.
New Features
Features available with this beta vesion of ATEasy 10 include:
- New text editor for Edit/View in text format
- Inclusion of line numbers with the code editor
- New IDE commands and options
- Ability to embed the run-time inside ATEasy's built executable
- Abilty to remove external libraries for simpler deployment
- Test Log templates with dynamic features
- New internal library functions
- Additional drivers and examples
- Backward compatibility with v9
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The latest information about ATEasy 10 can be found in ATEasy10ReadMe.txt
Download the ATEasy 10 Beta 3: ATEasy10.0 build 155.3 beta
We always like to hear from you regarding the new ideas and features you would like to see in ATEasy!
Please submit your request or feedback using our Web Support Module.
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