Test Connections - September 2019 - Newsletter

September 2019 - NewsletterFocus OnSolution SpotlightProduct HighlightIn the NewsDid You Know?

Welcome to our 3rd quarter newsletter for 2019. In this issue you’ll find stories about O-Level maintenance from the maintainer’s perspective, our GENASYS high-performance mixed-signal test platform, and an innovative production test solution for mmWave beamforming devices for 5G applications that supports test frequencies up to 50 GHz.

The MTS team has been spanning the globe in recent months, and the pace continues as we participate in shows in the US, Europe, Asia, and the Middle East in the next quarter. I hope you’ll take a look at our trade show calendar for opportunities to meet with us to discuss your test challenges and learn how we can deliver solutions that meet and exceed your most demanding requirements.

As always, you can count on MTS for innovative solutions that make test easy, and of course, our unrivalled long-term support.

Stephen T. Sargeant
CEO

We hope you enjoy this month's issue of Test Connections which includes new product updates and news events.

Please send your comments or suggestions regarding this newsletter to marketing@MarvinTest.com.

O-Level Maintenance – Challenges and Solutions

Smart weapon systems are tested at the flightline (O-Level) to ensure readiness and safe operation of the installed armament and munitions. The MTS-3060A SmartCan™ delivers comprehensive test capability and robust cybersecurity features for maintenance and sustainment of Smart and legacy weapon systems.

5G Test Solution for Beamforming ICs

Production testing of mmWave devices presents a significant challenge. With the development of 5G NR, beamforming is becoming a common method for implementing phased arrays and mmWave antennas. The new TS-960e-5G wwWave/5G Production Test System supports test frequencies up to 50GHz in a compact form factor.

GENASYS High Performance Mixed-Signal Test Platform

For both legacy and next generation test requirements, the PXI architecture offers a robust set of capabilities for performance mixed-signal test applications. The PXI-based GENASYS High-Performance Mixed-Signal Test Platform addresses the test requirements of mil/aero and other mission-critical products that require comprehensive, performance functional testing.

Newsworthy Happenings at Marvin Test Solutions

Industry conference and trade show news

Trade publication news

Recent press releases

Looking to generate test applications faster? Open-architecture-based ATEasy is the answer. Download your no-cost 30-day trial today! Download your 30 day FREE TRIAL!

The PXI standard has been continually upgraded to address evolving test requirements.

Read on to learn more.

Read the blog post here.

Countering Cybersecurity and Counterfeit Material Threats in Test Systems

Click here to learn more.

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O-Level Maintenance - Challenges and Solutions

Overview Maintenance and sustainment of mission-critical military systems takes place on multiple levels, depending on the activity and the processes required. For example, at the Organizational level, (aka O-Level), Smart weapon systems are tested at the flightline to ensure readiness and safe operation of the installed armament and munitions. O-Level test may include scheduled inspection as well as troubleshooting or evaluation of issues/discrepancies that occur between scheduled maintenance activities.
The Challenge of O-Level Test O-Level testing presents unique challenges, including the logistical issues of weight, size, and transportability. Legacy testers originally deployed to support earlier generations of aircraft are still in use today and may require multiple large transit cases, making them difficult to store and transport to the flightline. An additional challenge is the lack of comprehensive test capability to support Smart, MIL-STD-1760-based systems. Many of the test sets currently in use are designed to perform only one test, or to support only one aircraft platform. Maintainers are tasked with using these large, heavy, and inadequate legacy test sets to support the increasingly complex Smart weapon systems in use on 4th and 5th generation aircraft. Although the basic tests (stray voltage, continuity) performed by the legacy test sets may not detect a problem, they do not have the capability required to fully test or communicate with the aircraft’s digital communications system, leaving portions of the armament circuitry untested. Undiscovered issues that pose significant risk to mission readiness are a real possibility. Legacy Test Sets As systems become increasingly complex and interconnected, the risks of cyber-intrusion, malware, and data theft become more immediate. Legacy test sets do not have cybersecurity features to protect against these threats and cannot be upgraded to include them. This is a challenge, not of logistics, test time, or test capability, but of system integrity.
Rising to the Challenge – MTS-3060A SmartCan™ To address the logistical, technical, and security challenges of O-Level armament and munitions test, Marvin Test Solutions has developed the MTS-3060A Smart Can™ Universal O-Level Armament Test Set. A successor to the handheld “beercan” tester (originally deployed in the mid-70s and so-called because of its cylindrical shape), the SmartCan is currently in use worldwide to support F-18, F-16, F-15, TA-50, FA-50, F-5, Hawk, and more.
Comprehensive Flightline Test in Your Hand The SmartCan combines system confidence tests and active functional checkouts at the ejector rack breeches, pylon weapons disconnects, and launcher missile interfaces. The combined system confidence and functional tests ensure that all weapon interface signals, including critical release and firing signals, analog signals, 1553 communications, and other 1760 signals are available and are properly functioning at the rack breeches, the launcher missile umbilical interface and/or pylon weapons disconnects. The test set has the capability to emulate the munition, enabling full functionality checks including confirming the presence of safeing and arming voltages and timing, analog signals, 1553 databus communications and all other signals utilized by legacy and MIL-STD-1760 weapons. Fault isolation is provided with the use of the built-in auto-save test reports. MTS-3060A SmartCan™ - Smart Test for Smart Weapons at the Flightline The SmartCan test set kit consists of a rolling case containing the test set itself, adapter cables, breech and self-test adapters, shorting plugs, and spare batteries. The adapter cables, shorting devices, and SmartCan test set all have full self-test capability. In hands-on demonstrations of the SmartCan to F-15 and F-16 maintainers, crews achieved significantly faster test times as compared with their existing test sets, even with minimal training and orientation. With training and experience, a further ~20% reduction in test times would be typical and expected. The SmartCan supports the testing of virtually any Smart weapon interface including JDAM and AIM-120. Importantly, the SmartCan can be loaded with multiple Operational Flight Profiles (OFP) to support multiple blocks and multiple types of aircraft with a single test solution, reducing complexity and test footprint during deployment. The ability to test more, troubleshoot better, and simplify the test process plays a significant role in maintaining fleet readiness within a limited budget. Offering unmatched test capabilities with unrivaled cybersecurity features, the SmartCan can provide support for both current and future generation weapon systems. Visit the MTS-3060A product page to learn more about why the SmartCan is the choice of advanced militaries worldwide, and explore our online KnowledgeBase for informative white papers and articles on the subject of armament and munitions test, including: Next Generation Armament Test Solutions for the Flightline Combat Helicopters and Armament Test Modernizing Legacy Automated Test Sets for DoD Depots Flightline Testing of Laser Guided Munitions F-35 Armament Maintenance and Sustainment Test

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5G Test Solution for Beamforming ICs

Production testing of mmWave devices presents a significant challenge. With the development of 5G NR, beamforming is becoming a common method for implementing phased arrays and mmWave antennas.

Device manufacturers are now developing multi-port beamforming devices with 5, 9, and even 17 mmWave ports, with the focus on providing these devices in volume for the evolving technology of 5G. For production test applications, device vendors are looking for test solutions that can support multi-site, high-performance VNA test capability.

MTS has developed the TS-960e-5G to address the production test requirements of these devices, including:

5G laboratory performance at production test speed

DUT interface compatible with both device handlers and manual device insertion

Support for multi-site test capability

Receiver/tester interface that is reliable and repeatable for performing VNA measurements to 50 GHz

If you attend the International Test Conference in November, please visit our booth to learn more about our range of semiconductor test systems, and check out our poster presentation to learn more about this exciting new test solution.

The poster session takes place on Wed. 11:30 – 1:30 PM, and we look forward to meeting you for our presentation entitled, “Multi-Site DUT to Tester Interfacing for mmWave Devices”.

If you can’t attend, contact us to discuss your test requirements.

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GENASYS High Performance Mixed-Signal Test Platform

The GENASYS Advantage
The PXI-based architecture of the GENASYS High-Performance Mixed-Signal Test Platform addresses the test requirements of mil/aero and other mission-critical products that require comprehensive, performance functional testing prior to final shipment or deployment.

In addition to new product development and production, there are many products in use today that have lifecycles extending into decades, creating a challenge for test organizations that must support these products. The lack of available OEM support for legacy Automated Test Equipment (ATE) systems compels users to consider either replacing or upgrading high-performance legacy ATE systems.

The GENASYS platform provides all of the capabilities needed to address both legacy and future test needs. And with the modularity of the GENASYS systems and subsystems, end users have the option to configure these systems with moderate to high pin counts and with a wide range of instrumentation. The GENASYS platform has wide applicability for both factory and depot applications – solving both the legacy and future test needs for high value, mission critical products.

Complete Systems and Subsystems
Available as a complete system or as a subsystem, Marvin Test Solutions’ PXI- based, GENASYS platform offers high performance mixed signal test capabilities to support both legacy and next generation factory and depot test needs.
GENASYS systems include comprehensive development and deployment software:

ATEasy® test executive and test development software suite

Instrument drivers

SwitchEasy which simplifies the programming of the switching subsystem

L200 driver to assist with the migration of L200 and L300 programs

For applications that require the importing of LASAR .tap files, optional DtifEasy can be used to import and execute LASAR-based digital vector files for go / no-go, fault dictionary, and guided probe applications.

GENASYS systems are available in single-bay (TS-321 Series Aerospace Test System) and 2-bay (TS-323 Series Satellite Test System) configurations, and feature a PXI-based architecture, offering a compact footprint, expandability, and flexibility for addressing a wide range of current and future functional test needs.

Key features of the GENASYS architecture include:

A modular, hybrid switching subsystem for digital and mixed-signal test applications

Scalable architecture supporting up to 4500 interface test points

Subsystem configurations that support the integration of GENASYS switching, high performance digital, and PXI instrumentation in one compact chassis

To learn more about how GENASYS can address your legacy test needs, register to download the white paper, "Solving Functional Test Obsolescence".

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Newsworthy Happenings at Marvin Test Solutions

Connect With Us!

Connect with MTS on social media (LinkedIn, Twitter, and Facebook) to learn more about how We Make Test Easy™, and visit our YouTube channel to view our latest videos.

Recent Trade Shows

Our busy trade show calendar brings us the opportunity to meet with customers around the globe to demonstrate our customer-focused test solutions for military, aerospace, and manufacturing applications. We truly enjoy this interaction, and we appreciate the chance to discuss your most demanding test challenges.

At this year's AUTOTESTCON, We were pleased to contribute to the conference with three technical papers, as well as the opening keynote, which was presented by MTS CEO Stephen T. Sargeant, Major General, USAF (Ret.). If you were not able to attend, the technical papers and a transcript of the keynote are now available for download:

Keynote: Key Trends in Automated Test for Warfighters

Countering Cybersecurity and Counterfeit Material Threats in Test Systems

Addressing ATE Instrument Obsolescence with Form/Fit/Function Compatible Solutions - A Case Study

The PXI Standard - A Summary of The PXI Standard – A Summary of Updates and Enhancements to the PXI Specification

We look forward to seeing you at the upcoming shows and events listed below. To arrange a meeting, contact Jessica at: JessicaD@MarvinTest.com

Upcoming Trade Shows, Conferences and Events

Logistics Officer Association Symposium, Cox Convention Center, Oklahoma City, OK
Oct 8 - 11, 2019

The Logistics Officer Association (LOA) Symposium is the year's premier event dedicated to enabling interactive exchanges among logistics, acquisition and technology professionals from across the Department of Defense, defense industry and academia. Find us in booth 605.

Seoul ADEX, Seoul Airport, South Korea
Oct 15 - 20, 2019

Seoul ADEX features indoor and outdoor exhibitions of aircraft, ground and naval weapons and equipment, as well as seminars, conferences, and exciting flying displays. Please visit us in the USA Partnership Pavilion.

Global Defence Helicopter, Maritim Conference Center, Dresden, Germany
Oct 29 - 31, 2019

Global Defence Helicopter (formerly Combat Helicopter) is the premier international gathering for armed forces and industry, providing the tri-services community with the unique opportunity to gain a clear understanding of future requirements and capabilities for next generation, multi-role rotary platforms.

International Test Conference (ITC), Marriott Washington Wardman Park, Washington, D.C.
Nov 12 - 14, 2019

International Test Conference, the cornerstone of TestWeek™ events, is the world’s premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. Visit us in booth 309 and plan to attend our Wednesday poster session: Multi-Site DUT to Tester Interfacing for mmWave Devices.

Productronica, Messe München, Munich, Germany
Nov 12 - 15, 2019

Co-located with SEMICON Europa, Productronica is the world's leading trade fair for electronics development and production. Find us co-exhibiting with MAC Panel in booth 429, Hall 1.

Dubai Airshow, Dubai Airshow Site, DWC
Nov 17 - 21, 2019

The Dubai Airshow began life in 1986 as Arab Air. Since then the show has grown and evolved to become one of the largest and most important aerospace events in the world. Please visit us in the USA Partnership Pavilion, booth 1473.

Recent Articles

EDN Network - Jul 26, 2019
Marvin Test, Rohde team up on 5G IC tester

Evaluation Engineering - Jul 18, 2019
Special Report: Mil/Aero Test

TEMCOM - Jul 1, 2019
Marvin Test Solutions presents its test solutions at Semicon West 2019

ACTUTEM (French) - Jun 18, 2019
Marvin Test Solutions propose les plateformes PXI de test préconfigurées de la série TS-700

TEMCOM - Jun 18, 2019
Marvin Test solutions offers the pre-configured PXI functional test platforms of the TS-700 series

ACTUTEM (French) - May 29, 2019
Marvin Test Solutions expose ses solutions à l’édition 2019 du salon du Bourget

TEMCOM - May 16, 2019
Marvin Test Solutions, test facilitator for 30 years

Electronic Product Design & Test - May 1, 2019
Leveraging industry standards for FPGA PXI modules

Evaluation Engineering - Apr 29, 2019
Special Report: Cybersecurity

Evaluation Engineering - Apr 29, 2019
Special Report: Modular Instruments

Press Releases

Jul 17, 2019 Marvin Test Solutions Completes A-10/C Test Set Deliveries to Hill AFB Ahead of Schedule

Feb 5, 2019 Marvin Test Solutions Expands GENASYS Platform Offerings

Jan 7, 2019 Marvin Test Solutions Advances Flightline Test

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The PXI Standard has been Continually Upgraded to Address Evolving Test Requirements

The PXI Standard
Since its first release in 1998, the PXI standard has been continually upgraded, taking advantage of the ever-evolving capabilities of card modular architectures. The specification, which was initially based on the PCI standard, has been continually updated as both hardware and software technologies / standards have evolved over time. The latest updates to the PXI specification demonstrate how the standard is focused on addressing the latest technologies and capabilities via its high performance and compact card modular architecture.

Learn More
To learn more about the latest enhancements to the PXI specification, these resources are available:

White Paper: The PXI Standard – A Summary of Updates and Enhancements to the PXI Specifications

Webinar: Solving Complex Measurement Problems with PXI

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Software ATEasy DIOEasy DtifEasy WaveEasy CalEasy ICEasy All Software Products	Chassis & Controllers Chassis Chassis Controllers and Bus Expanders All Chassis and Controllers Products	Digital I/O Dynamic Digital I/O Instrumentation Static Digital I/O Instrumentation Digital I/O Software and Training ROM Emulator Instrumentation JTAG / BDM Instrumentation All Digital I/O Products	Measurement Digital Multimeter Instrumentation Counter Timer Instrumentation Digitizer Instrumentation A/D Converters, Multi-function Instrumentation All Measurement Products	Stimuli Arbitrary Function Generators Standards Source Instrumentation Multi-function Instrumentation D/A Converters and Precision DC Source Instrumentation All Stimulus Products	FPGA Digital I/O Multi-Function All FPGA Products

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Test Connections - September 2019

O-Level Maintenance – Challenges and Solutions

5G Test Solution for Beamforming ICs

GENASYS High Performance Mixed-Signal Test Platform

Newsworthy Happenings at Marvin Test Solutions

O-Level Maintenance - Challenges and Solutions

5G Test Solution for Beamforming ICs

GENASYS High Performance Mixed-Signal Test Platform

Newsworthy Happenings at Marvin Test Solutions

The PXI Standard has been Continually Upgraded to Address Evolving Test Requirements

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Product Lines

Resources

About Marvin Test Solutions

Contact Us

Aircraft

Weapons Systems

Maintenance Levels

GENASYS

GENASYS Benchtop

GENASYS Semi

GENASYS

GENASYS Benchtop

Commercial

Military

GENASYS Rugged

Test Connections - September 2019

O-Level Maintenance – Challenges and Solutions

5G Test Solution for Beamforming ICs

GENASYS High Performance Mixed-Signal Test Platform

Newsworthy Happenings at Marvin Test Solutions

O-Level Maintenance - Challenges and Solutions

5G Test Solution for Beamforming ICs

GENASYS High Performance Mixed-Signal Test Platform

Newsworthy Happenings at Marvin Test Solutions

The PXI Standard has been Continually Upgraded to Address Evolving Test Requirements

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Resources

About Marvin Test Solutions

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