Marvin Test Solutions, Inc.

PXI 3U

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GX1632e

32 Channels

3U PXIe 32 Channel AWG / D to A

PXI 3U

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GX1632e-M

32 Channels

PXIe Analog Output / Arbitrary Waveform Generator Card (Ruggedized and Conformally Coated)

PXIe 3U

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GX3116e

16 Independent DPS Channels

16 Channel Device Power Supply (DPS)

PXI 3U

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GX3756

(56) Channel TTL Digital I/O card

PXI FPGA 56 Channel TTL I/O Card

PXI 3U

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GX3756 Series

(56) Channel TTL Digital I/O card

PXI FPGA Card with 56 Channel TTL Digital I/O Daughter Card

PXI 3U

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GX3756-M

(56) Channel TTL Digital I/O card

PXI FPGA 56 Channel TTL I/O Card - Rugggedized, Extended Temp

PXI 6U

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GX6188

High density 6U matrix switch card incorporates GENASYS switching architecture

GENASYS High Density Matrix Switch Card, 104 x 8 x 8

PXI 6U

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GX6188 Series

High density 6U matrix switch card incorporates GENASYS switching architecture

GENASYS 104 x 8 x 8 High Density Matrix Switch Card

PXI 6U

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GX6188-M

High density 6U matrix switch card incorporates GENASYS switching architecture

GENASYS High Density Matrix Switch Card, 104 x 8 x 8, Ruggedized

PXI 6U

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GX6864

(4) 75 Ohm, 16 x 2 RF Multiplexers, compatible with GENASYS switching subsystem (GX7016/GX7017)

GENASYS 75 Ohm RF Multiplexer Switch Card, (4) 2 x 16 Multiplexers

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MTS-3060A AIM-120

Active test / simulation for AIM-120 AMRAAM missile systems

Universal O-Level Armament Tester for AIM-120 Systems

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MTS-3060A SmartCan

Active test/simulation for all currently deployed weapons systems' communications interfaces including legacy and "smart" weapons

SmartCan Gen2, Universal O-Level Aircraft Armament Tester for Smart & Legacy Weapons Systems

PXIe 3U

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TS-960e

High-performance digital, mixed-signal, and RF semiconductor test capabilities

PXIe Semiconductor Test System with Timing per Pin Digital Subsystem

PXIe 3U

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TS-960e Series

High-performance digital, mixed-signal, and RF semiconductor test capabilities

PXIe Semiconductor Test System, 64 Dynamic Digital I/O Channels with per Pin Timing & PMU, 64 Static Digital channels, 0-20V, 2A User Supply; Includes System Self Test & ATEasy Software License, manipulator ready

PXIe 3U

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TS-960e-5G

mmWave Device Production Test and Characterization

mmWave / 5G PXIe Semiconductor Test System, 64 Dynamic Digital I/O Channels with per Pin PMU

PXIe 3U

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TS-960e-OM

High-performance digital, mixed-signal, and RF semiconductor test capabilities

PXIe Semiconductor Test System with Timing per Pin Digital Subsystem & manipulator

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