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TS-321 Series

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TS-322 Series

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TS-323 Series

Core Test System TS-705	Base Analog/Digital Core Test System TS-710
Core Test System with Boundary Scan TS-720	Mixed Signal Test System TS-730
Digital Test System TS-750	Commercial Avionics Test System TS-770
Military Avionics Test System TS-775

GENASYS

High Performance Mixed Signal Test Platform

GENASYS Benchtop

Compact / Portable Test Platform

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MTS-207

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Results for 'TS 900 OM'

Results for 'TS 900 OM'

Showing 1 - 11 of 11 Items

New Product

TS-900e-5G Series

TS-900e-5G Series

53 GHz VNA RF test performance

mmWave 5G PXIe Semiconductor Test System, 64 Dynamic Digital I/O Channels with per Pin PMU

New Product

TS-960e Series

TS-960e Series

High-performance digital, mixed-signal, and RF semiconductor test capabilities

PXIe Semiconductor Test System, 64 Dynamic Digital I/O Channels with per Pin Timing & PMU, 64 Static Digital channels, 0-20V, 2A User Supply; Includes System Self Test & ATEasy Software License, manipulator ready

TS-900e Series

TS-900e Series

Integrated semiconductor test platform - open architecture

PXI Semiconductor Test System configured with 64 Dynamic Digital I/O Channels with Per Pin PMU, 64 Static Digital channels, 0-20V, 2A User Supply, and Receiver Interface. System includes System Self Test, ATEasy Software License, ICEasy and DIOEasy

TS-900e-OM

TS-900e-OM

Integrated semiconductor test platform - open architecture

TS-900 Test System Configured with 64 Dynamic 100 MHz Digital I/O Channels with per pin PMU, 64 Static Digital Channels, 0-20 V, 2 A User Supply, and a Receiver Interface. System also Include System Self Test, ATEasy Software License, ICEasy, DIOEasy, Monitor, Keyboard, and Mouse with Manipulator and Slide Receiver.

TS-900eS-OM

TS-900eS-OM

Integrated semiconductor test platform - open architecture

Digital Test System, Slave configuration, Configured with 64 Dynamic 100 MHz Digital I/O Channels with per pin PMU, 64 Static Digital Channels, 0-20 V, 2 A User Supply, and a Receiver Interface. System also Includes System Self Test, ATEasy Software License, ICEasy, DIOEasy, and Slide Receiver.

New Product

GX7950 Series

GX7950 Series

Intel® mini-PC (NUC) featuring 11th Generation Core Processor

mini-Computer Controller Series, Intel i7 Core Processor, 16 GB DDR4

GT5900

GT5900

Hosts any two of the GT5150 I/O modules

I/O Module Carrier (allows one or two GT59X0 I/O Modules to be used with GT25/50-DIO)

GT5930

GT5930

Programmable levels and thresholds with tristate control

Programmable I/OLevels and Threshold Module

GT5940 Series

GT5940 Series

PECL to TTL and TTL to PECL

PECL I/O Modules for GT515x Cards

GX91810

GX91810

18 inch harness, 25 pin DSUB , male to male

18 inch harness, 25 pin male / male connectors on each end

ICEasy Test Suite

ICEasy Test Suite

Comprehensive suite of software tools for semiconductor test applications

ICEasy Test Suite

Showing 1 - 11 of 11 Items

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About Marvin Test Solutions

Marvin Test Solutions, a vertically-integrated aerospace test and measurement company, has created and delivered innovative, reliable test systems for factory, depot, intermediate, and flightline use since 1988. Our expertise delivering aerospace precision underpins our manufacturing solutions, enabling us to quickly meet customers’ requirements with high-performance products and custom turnkey systems, backed by excellent long-term customer support.

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