PXI-Based, Advanced Switching Architecture for Functional Test

Knowledge Base Article # Q200295

Read Prior Article Read Next Article
Summary This white paper describes the advantages of leveraging the 6U PXI architecture and employing advanced signal routing topologies to create modular, high performance switching subsystems.
Virtually all ATE systems employ a switching subsystem in order to route test system resources to multiple test points on the UUT. The challenge for any switching subsystem is multi-dimensional and involves many considerations / trade-offs including footprint, performance, flexibility, maintainability, and reliability. Additionally, if the application needs to address legacy test needs, there can be the additional challenge to support not only current and future switching requirements, but also legacy test requirements. Many of today’s functional test systems employ the PXI architecture which offers modularity and flexibility. However when combining switching and instrumentation, test engineers can be challenged to create a system that combines all of the switching and instrumentation capabilities in one compact platform.

DownloadDownload the white paper
Article Date 5/24/2016
Keywords PXI, switching, 6U, GX7017, GX7016, GENASYS, ATEasy

0 ratings | 0 out of 5
Read Prior Article Read Next Article