Knowledge Base

Articles

Knowledge base articles covering topics such as integration of Marvin Test Solutions products, new functionality, and frequently asked questions. Articles cover PXI Instruments, ATEasy software, LabView integration, etc. and should be a first stop for anyone with questions.

Next Generation Armament Test

This white paper explores the challenges facing today's armament maintainer as new weapon systems enter service, and shows how innovative solutions are changing the armament test paradigm.

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Showing 1 - 10 of 266 Items | 1 2 3 4 5 > | View All
Q200333

May 29, 2020

Appending Multiple Digital Test Patterns to Reduce Test Time

The following article describes how to streamline a digital application by merging digital test patterns into one compressed file that can be loaded once and accessed for each digital test. The examples provided use the GtDio6x and ATEasy software packages to program and control PXI GX5960 series or the GX5296 digital IO boards. Read more...

Q200330

May 7, 2020

Translating STIL, WGL, VCD, EVCD and Teradyne ATP files to DIO/DIO6x Files

DioEasy-FIT and GtDio6x-FIT (File Import Toolkit) allows test engineers to easily import STIL, WGL, VCD, EVCD simulation and Teradyne ATP files to DIO or DIO6x files which are used by MTS digital I/O cards. The FIT when coupled with Marvin’s DIOEasy/GTDIO6x vector development / waveform display tools brings a powerful desktop tool set for debugging and developing digital test vectors for all MTS digital instruments without hardware. This article describes how to use the FIT converter tool to convert files. Read more...

Q200064

May 6, 2020

Installing and Using ATEasy Network License

How to install the ATEasy License Server and how to setup ATEasy clients to use the license server Read more...

Q200331

May 1, 2020

How to Create a Support Incident, Request an RMA or Instrument Calibration

Procedure to create a support incident using MTS’s M@GIC online support for the purposes of requesting calibration on your MTS instruments or to request an RMA. Read more...

Q200026

Mar 16, 2020

ATEasy Licensing Q&A

This article provides information about ATEasy licenses, including license types and subscription options. Read more...

Q200328

Feb 11, 2020
White Paper

White Paper: Next Generation Armament Test

This white paper explores the challenges facing today's armament maintainer as new weapon systems enter service, and shows how innovative solutions are changing the armament test paradigm. Read more...

Q200323

Oct 16, 2019

Countering Cybersecurity and Counterfeit Material Threats in Test Systems

This paper explores the ATE cybersecurity issue from the perspective of the test development environment, including the use of test executives, and the challenges associated with minimizing impact to data integrity and access to control, as well as the potential impact on the UUT from substandard counterfeit parts and those embedded with malware. Read more...

Q200260

Oct 10, 2019
White Paper

White Paper: Solving Functional Test Obsolescence

This paper provides an overview of how MTS' GENASYS functional test system can successfully address both current and future test needs that are presently supported by legacy functional test platforms. Read more...

Q200322

Sep 12, 2019

Presentation: User Programmable FPGAs for ATE - Trends and Applications

FPGAs are an increasingly popular choice for automated test systems, providing the basis for custom modular instrumentation that is user-reprogrammable to address changing test requirements. Read more...

Q200325

Sep 5, 2019

The PXI Standard – A Summary of Updates and Enhancements to the PXI Specifications

This paper reviews the specific details and rationale associated with the revisions made to seven of the specifications which are maintained by the PXI Systems Alliance (PXISA). Read more...

Showing 1 - 10 of 266 Items | 1 2 3 4 5 > | View All