Knowledge Base

Articles

Knowledge base articles covering topics such as integration of Marvin Test Solutions products, new functionality, and frequently asked questions. Articles cover PXI Instruments, ATEasy software, LabView integration, etc. and should be a first stop for anyone with questions.

Next Generation Armament Test - A Former USAF Armament Maintainer's Perspective

This white paper explores the challenges facing today's armament maintainer as new weapon systems enter service, and shows how innovative solutions are changing the armament test paradigm.

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Showing 1 - 10 of 270 Items | 1 2 3 4 5 > | View All
Q200336

Jun 29, 2020

How to access the JTAG port on GX3500 and GX3700 series cards

This article will show you how to access the JTAG port on Marvin Test Solutions' GX3500 series and GX3700 series FPGA cards using Altera's USB Blaster. Read more...

Q200334

Jun 10, 2020

Digital I/O Hardware Handshaking Using GX5280/GX5290 Series

This article demonstrates how to use GX5280/GX5290 Series external events as hardware handshakes to control test pattern execution Read more...

Q200273

Jun 10, 2020

Using HW PXI/PCI Explorer Applet

This article explains the features and benefits of the PXI/PCI Explorer application included in the Marvin Test Solutions HW software package. The HW driver is provided with all MTS driver software packages and used by the driver DLLs to access the hardware.. Read more...

Q200335

Jun 5, 2020

Adding TCP/IP-based LAN buffer Peek and Flush to ATEasy WinSock Functions

This article will show a simple ATEasy example showing how to peek and flush WinSock buffer data Read more...

Q200333

May 29, 2020

Appending Multiple Digital Test Patterns to Reduce Test Time

The following article describes how to streamline a digital application by merging digital test patterns into one compressed file that can be loaded once and accessed for each digital test. The examples provided use the GtDio6x and ATEasy software packages to program and control PXI GX5960 series or the GX5296 digital IO boards. Read more...

Q200331

May 1, 2020

How to Create a Support Incident, Request an RMA or Instrument Calibration

Procedure to create a support incident using MTS’s M@GIC online support for the purposes of requesting calibration on your MTS instruments or to request an RMA. Read more...

Q200330

Apr 3, 2020

Translating STIL, WGL, VCD, EVCD and Teradyne ATP files to DIO/DIO6x Files

DioEasy-FIT and GtDio6x-FIT (File Import Toolkit) allows test engineers to easily import STIL, WGL, VCD, EVCD simulation and Teradyne ATP files to DIO or DIO6x files which are used by MTS digital I/O cards. The FIT when coupled with Marvin’s DIOEasy/GTDIO6x vector development / waveform display tools brings a powerful desktop tool set for debugging and developing digital test vectors for all MTS digital instruments without hardware. This article describes how to use the FIT converter tool to convert files. Read more...

Q200026

Mar 16, 2020

ATEasy Licensing Q&A

This article provides information about ATEasy licenses, including license types and subscription options. Read more...

Q200328

Feb 11, 2020
White Paper

White Paper: Next Generation Armament Test - A Former USAF Armament Maintainer's Perspective

This white paper explores the challenges facing today's armament maintainer as new weapon systems enter service, and shows how innovative solutions are changing the armament test paradigm. Read more...

Q200323

Oct 16, 2019

Countering Cybersecurity and Counterfeit Material Threats in Test Systems

This paper explores the ATE cybersecurity issue from the perspective of the test development environment, including the use of test executives, and the challenges associated with minimizing impact to data integrity and access to control, as well as the potential impact on the UUT from substandard counterfeit parts and those embedded with malware. Read more...

Showing 1 - 10 of 270 Items | 1 2 3 4 5 > | View All

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