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Summary
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The application of MEMS technology has allowed Metal Oxide (MOX) Gas Sensors to be mass-produced at the wafer level with silicon wafer manufacturing offering cost reduction and scalability to large volumes.
This white paper discusses how a semiconductor manufacturer of Gas Sensors employed a focused test solution that provided the required accuracy, accommodated very large site counts, and matched the over-all throughput performance of high performance semiconductor test systems at a much lower cost.
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The application of MEMS technology has allowed Metal Oxide (MOX) Gas Sensors to be mass-produced at the wafer level with silicon wafer manufacturing offering cost reduction and scalability to large volumes.
This white paper discusses how a semiconductor manufacturer of Gas Sensors employed a focused test solution that provided the required accuracy, accommodated very large site counts, and matched the over-all throughput performance of high performance semiconductor test systems at a much lower cost.
 Download the white paper
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Article Date
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6/4/2018
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Keywords
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MEMS, MOX Gas Sensor, PXI, semiconductor test
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