SemiEasy Semiconductor Production Test User Interface and Features

Knowledge Base Article # Q200357

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Summary SemiEasy is a drop-in user interface designed to provide common semiconductor test features without requiring extensive configuration.
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SemiEasy is a drop-in software drivers that includes a suite of add-on features to the ATEasy Test Executive designed to streamline the transition from test development to production test.  It is intended to be added to a finished test program but can be used in the test engineering lifecycle from the beginning of test design through test closure as it augments ATEasy test design features rather than replacing them.

SemiEasy Main Features

  • Simplified user interface for Production Testing  ATEasy's default log output displays test numbers, names, limits and results for each test performed on the device-under-test (DUT).  This information is most valuable when developing the test program, but is not useful in a Production environment where the goal is to quickly evaluate DUT performance, bin the device, record findings, and ready the next DUT for testing.  SemiEasy displays information useful for bulk testing such as average test times, parts per lot, and binning results for the current lot.  The SemiEasy User Interface is examined in greater detail later in this article.
  • STDF Automated Logging  SemiEasy's UI is modelled after STDF's record fields and provides recognizable elements to users who are familiar with STDF record format.  To improve efficiency, test results are recorded quickly during test execution and append to the file when the die is changed or the test head is moving.
  • Handler Integration  SemiEasy includes access points at the beginning and end of each program run to let the user inject automated handler instructions to prepare the next die for testing and to bin dispositioned dies.
  • ICEasy programming interface  ICEasy driver provides a way to operate the instrument in order to write tests an easy to use programming interface. The ICEasy contains commands to map pins,  simplified commands to operate DIO, SMU SWITCH and the VNA instruments, pre-defined tests (e.g., continuity, force current/voltage-measure voltage/current, etc.).
ICEasy IDD Test Example:
ICEasy IDD Test

SemiEasy User Interface Features

SemiEasy User Interface

  • Simple interfaceThe features most important for Production test are prominent immediately after program launch.  Features which are useful in development such as Loop on Test and Pause on Failure are available through the Test Executive menu.  Test results information is maintained in separate tabs provided for quick analysis.
  • Test Statistics  At a glance job statistics such as record information, test time statistics, STDF file location, and job status.
  • Binning Information  Sortable binning information which updates as parts complete testing.
  • Job Information  Test Program auto-fills Job Information (Handler type, Operators, IDs, image of the DUT, etc.) after the first job is completed.  Future jobs require minimal or no configuration.

SemiEasy and other System Drivers

The source for SemiEasy (SemiEasy.drv) is stored in the SemiEasy.drv and is distributed with ATEasy.  It takes advantage of the STDF automated logging driver for the recording of test data (STDF.drv) as well as the Handler interface driver (Handler.drv) which can be used to initialize an automated test handler, wait for a ready signal from the handler and inform the handler of binning information when testing has concluded.  The SemiEasy driver also operates as an add-on to the Test Executive (TestExec.drv) allowing users to leverage Test Executive features if they require it for test applications.  All of these drivers must be included to use SemiEasy.

To add these drivers to your system:
  • Right click on the System Drivers sub-module and select Insert Driver command.
  • Select the SemiEasy.drv, TestExec.drv, STDF.drv or SemiEasyHandler.drv file from ATEasy Drivers folder and select Open in the Insert dialog to insert.
TS-960e-5G Workspace Project

Handler Interface Driver

The handler adapter provides locations within the SemiEasy job cycle where optional code can be executed.  The purpose of this is to provide a means for communication with an automated test handler which will load, unload and bin DUTs. At the beginning of the job SemiHandlerInitialize() will be called once to establish communication with the handler.  When the test program starts, SemiEasy makes a call to SemiHandlerGetSites() to both notify the handler that test execution software is ready to begin testing and to get information about available test sites.  This command should return a status of 0 when the handler has loaded the DUT or an error code if the handler is unable to comply.  Error code are reported to the test operator.  After the test execution has completed, SemiEasy makes a call to SemiHandlerSetBins() to notify the handler that testing has completed and to inform the handler of any relevant binning information.
When a physical handler is being used to place and bin parts, SemiEasy should be set to run continuously by selecting Repeat Run.  In this mode, SemiEasy will automatically contact the handler when it is ready for the next part and execution is determined by a ‘ready to start’ signal.

By default, and for cases where a physical handler does not exist, SemiEasy will use the provided SemiEasyHandlerManual.dll which receives API calls and generates positive responses but does not attempt communication or impede the test execution is any way.  When using this manual control driver, the operate will have to set up and activate each test run by manually interacting with the control buttons. You can replace the handler DLL with you actual handle. SemiEasy comes with few drivers (along with their source code, for example Epson NS6000).

The following diagram provide overview of the handler interface architecture:

Flow chart of Handler function calls

For more information on the SemiEasy Handler Adapter, visit the SemiEasy chapter in the TS-9xx-5G User's Guide.

Related Documents
TS-900e-5G/TS-960e-5G User's Guide
KB Article #Q200356 - Multi-site Production Test Development in ATEasy
Article Date 4/12/2024
Keywords ATEasy, TS, TS960, TS900, SemiEasy, Semiconductor

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