Overcoming 5G mmWave Semiconductor Production Test Challenges

Knowledge Base Article # Q200343

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Summary This white paper explores the challenges involved with transitioning 5G mmWave semiconductor device test from the laboratory to the production floor.
  
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Beamformer integrated circuits are the key to unlocking the low latency and increased bandwidth performance promised by 5G networks, and they play a critical role in other applications areas as well including radar, imaging and remote sensing. Multiple beamforming devices are integrated into an RF front end as part of the antenna assembly, which is then programmed to form the desired overall radiation pattern. Importantly, the ability to steer the RF signal by shifting the phase of the output is essential for accurate and repeatable signal transmission and reception.

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Article Date 7/12/2021 , 7/27/2021
Keywords 5G, mmWave, semiconductor, device test, production, TS-900e-5G, digital subsystem, power, modular, RF,


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