Test Connections - November 2011 - Newsletter

November 2011 - Newsletter

We hope you enjoy this month's issue of Test Connections which includes new product updates and news events.

Please send your comments or suggestions regarding this newsletter to marketing@MarvinTest.com.

PXI for Semiconductor Test: Capabilties and Benefits

Semiconductor manufacturers are constantly looking for ways to lower their cost of test. Read on to learn how Geotest's TS-900 PXI Test System can help manufacturers lower their test costs and raise their test efficiency.

Characterizing Devices with PXI Instrumentation

Characterizing the DC parameters of digital and mixed signal devices has largely been a task best done on large, proprietary ATE. Geotest's GX5295 PXI digital instrument with its PMU per pin now makes it possible to perform this task quickly and cost effectively. Read how you can use the GX5295 for device characterization testing.

Geotest's New High Performance PXI and PXI Express FPGA Cards Offer Users Flexibilty, Performance and Choice

Geotest has recently introduced two new high performance FPGA cards(GX3700 / GX3700e) using the Altera Stratix III devices. Read how you can take advantage of these new high performance FPGA cards for both the PXI and PXI Express archtectures.

Newsworthy Happenings

Join Geotest at productronica in Munich, Germany, Nov. 15 - 18. Find out more about productronica and other news events including new product introductions.

Looking to generate test applications faster? Open-architecture-based ATEasy is the answer. Download your no-cost 30-day trial today! Download your 30 day FREE TRIAL!

The GTX2200 Timer Counters include a gate function for frequency and time measurement. Read how this function works when making frequency / time measurements.

Read on to learn more.

Read the blog post here.

Waveform Generation Language (WGL) files are a common file format used to describe test vectors for semiconductor devices. Read how Geotest software tools can be used to translate the WGL format to Geotest digital format.

Click here to learn more.

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Software ATEasy DIOEasy DtifEasy WaveEasy CalEasy ICEasy All Software Products	Chassis & Controllers Chassis Chassis Controllers and Bus Expanders All Chassis and Controllers Products	Digital I/O Dynamic Digital I/O Instrumentation Static Digital I/O Instrumentation Digital I/O Software and Training ROM Emulator Instrumentation JTAG / BDM Instrumentation All Digital I/O Products	Measurement Digital Multimeter Instrumentation Counter Timer Instrumentation Digitizer Instrumentation A/D Converters, Multi-function Instrumentation All Measurement Products	Stimuli Arbitrary Function Generators Standards Source Instrumentation Multi-function Instrumentation D/A Converters and Precision DC Source Instrumentation All Stimulus Products	FPGA Digital I/O Multi-Function All FPGA Products

Switching 3U PXI 6U PXI GENASYS Matrix Multiplexer RF High Current High Density General Purpose All Switching Products	SMUs & Power Supplies Power Supply Mainframe and Modules Instrumentation Precision DC Source Instrumentation All SMUs & Power Supplies Products	Bus Interfaces Bus Expanders GPIB MIL-STD-1553 ARINC 429 Comm All Bus Interfaces Products	GPIB Instrumentation Replacements Wavetek Replacements HP Replacements All GPIB Instrumentation Replacements Products	PXI Instruments Chassis and Controllers Digital I/O Measurement Stimuli FPGA Cards Switching Power Supplies Bus Interfaces All PXI Instruments Products	Legacy GTXI Chassis, Controllers and Instrumentation Digital I/O Stimuli Switching Power Supplies All Legacy Products	Military Missile Launchers All Military Products

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Test Connections - November 2011

PXI for Semiconductor Test: Capabilties and Benefits

Characterizing Devices with PXI Instrumentation

Geotest's New High Performance PXI and PXI Express FPGA Cards Offer Users Flexibilty, Performance and Choice

Newsworthy Happenings

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Product Lines

Resources

About Marvin Test Solutions

Contact Us

Aircraft

Weapons Systems

Maintenance Levels

GENASYS

GENASYS Benchtop

GENASYS Semi

GENASYS

GENASYS Benchtop

Commercial

Military

GENASYS Rugged

Test Connections - November 2011

PXI for Semiconductor Test: Capabilties and Benefits

Characterizing Devices with PXI Instrumentation

Geotest's New High Performance PXI and PXI Express FPGA Cards Offer Users Flexibilty, Performance and Choice

Newsworthy Happenings

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