GX2065 DAQ Function
The
GX2065 DMM features an isolated, 3MS/s, 16 bit digitizer. For general purpose data acquisition functions, the digitizer or DAQ offers users the flexibility to measure signals that may have a high common mode component or are not referenced to Earth ground.
The GX2065’s DAQ function is capable of capturing up to 8192 Voltage or Current measurements into its memory. The DAQ function uses a 3MHz sampling clock and a clock divider with a maximum value of 255, allowing a range of sampling frequencies (3Mhz to 11.76KHz).
To use the GX2065’s DAQ functionality, you can follow these steps to setup and acquire data:
1. | Set the DMM’s desired function by calling GxDmmSetFunction, and passing in VAC_AC, VAC_DC, IAC_AC, or IAC_DC (Voltage or Current). The function must be one of four "AC" functions in order to use the DAQ. |
2. | Set the desired range by calling GxDmmSetRange. |
3. | Call GxDmmSetACClockDivider and pass in the clock divider value (1 to 256). |
4. | Call GxDmmSetTriggerMode and pass in GXDMM_TRIGGER_ARRAY along with the number of samples you would like to capture (1 to 8192). This will initiate the capture process. |
5. | Monitor the status of the capture by calling GxDmmGetReadArrayStatus. This function will return the finished state of the capture and the number of samples currently captured. |
6. | When the capture process has completed, call GxDmmReadArray to retrieve the samples. The function will return an array of samples as well as an array of time stamps. Each sample is accompanied by a time stamp in nano seconds. |
The following is C code example for capturing 1000 samples of voltage at a sampling rate of 1.5MHz:
SHORT nHandle, nStatus;
//Measurement array
DOUBLE adMeasurements[1000];
//64 Bit Time Stamps
DDWORD addwTimeStamps[1000];
BOOL bFinished=FALSE;
//Initialize DMM
GxDmmInitialize(nSlot, &nHandle, &nStatus);
//Set Function to AC, AC coupled for DAQ functionality
GxDmmSetFunction(nHandle, GXDMM_FUNCTION_VAC_AC_CPL, &nStatus);
//Set Range to 10 Volts
GxDmmSetRange(nHandle, GXDMM_RANGE_10V, &nStatus);
//Divide DAQ 3Mhz clock by 2 to get 1.5Mhz sampling clock
GxDmmSetACClockDivider(nHandle, 2, &nStatus);
//Start capture of 1000 samples
GxDmmSetTriggerMode(nHandle, GXDMM_TRIGGER_ARRAY, 1000, &nStatus);
//Wait until capture complete
while(!bFinished)
GxDmmGetReadArrayStatus(nHandle, &bFinished, &dwSampleCount, &nStatus);
//Read back measurements and timestamps
GxDmmReadArray(nHandle, adMeasurements, addwTimeStamps, 1000, &nStatus);
To learn more about the GX2065
click here.
Exciting New Products From Geotest-Marvin Test Systems
GX1649 AWG Offers Industry Leading Channel Density and Features
The new
GX1649 features 64 channels with each channel capable of operating as an arbitrary waveform generator or as a precision DC source. Each channel features an output voltage range of ±15 volts, making it ideal for use in applications requiring multi-stimulus inputs.
Key features of the GX1649 include:
- 64, 16 bit D to A channels with DC or Arbitrary Waveform Generator capability
- ±15 volt output addresses a wide range of applications
- 625 KS/s sample rate (64 channel configuration) with on-board memory (256 Kb samples for 16 channels)
GX1120 ARB and Function Generator Features 250 MS/s Capability
The new
GX1120 is a two channel, 250 MS/s Arb and function generator. The GX1120 supports both arbitrary waveform and direct digital synthesis (DDS) modes of operation providing outstanding flexibility for generating custom or periodic waveforms.
Key features include:
- 250 MS/s sample rate or 400 MS/s rate (combined channel mode)
- 16 bit vertical resolution
- Configurable AWG or DDS mode on a per channel basis
GENASYS Functional Test Platform Offers Cost-Effective Digital and Mixed-Signal Test Capabilities for Depot and Legacy Test Applications
The
TS-323 GENASYS platform is a PXI based test system which is designed to address a broad range of mil-aero and mission-critical products that require performance functional testing. The GENASYS offers best in class digital test capabilities which can effectively address the test needs associated with legacy ATE systems including the Teradyne L200/L300, and VXI-based digital systems.
Key features include:
- High performance GX5960 digital subsystem
- Comprehensive tools for migrating LASAR based programs
- Multiple receiver options: L300, GX2270, VP90, MacPanel Scout
New ATEasy Education / Demo Kit Offers Users a Low-Cost Solution for Training and Academia
Have you been looking for a low cost demo unit for ATE training applications? Geotest-Marvin Test Systems has the answer. Our new
ATEasy Education / Demo kit consists of a low cost PCB assembly that supports a full range of SCPI commands via a USB port. When combined with ATEasy’s "Getting Started" training course, the user has a simple and low-cost UUT which supports a variety of analog and digital measurement functionality. The board is totally self-contained and requires only a USB connection to a PC.
Upcoming Events
Geotest-Marvin Test Systems and our channel partners will be participating in a number of national and international tradeshows and events. Come visit us if you’re attending these shows:
Mittaus & Testaus,
August 29th - 30th Malminkartano, Helsinki, FinlandBooth B-7Mittaus & Testaus is the Test and Measurement event organized by the AEL and 3T-Journal held in Helsinki, Finland. This event is intended for automation, electronics, electrical power, computer and communications equipment for measurement, testing and maintenance professionals. Please visit our distributor Profelec Oy at
Booth B-7.
Silicon Valley Test Workshop,
August 29thSanta Clara, CaliforniaThe Silicon Valley Test Workshop focuses on all the aspects associated with wafer and packaged die characterization, debug, final test and failure analysis. The conference explores the use of test techniques and methods to improve the accuracy and reduce the time to bring a product to volume production for RF, analog, mixed signal and digital devices. Attendees will see hardware and DUT interfaces, test stimulus and measurement systems, probe cards, ATE boards, calibration methods, test sockets, and more.
Geotest-Marvin Test Systems will be showcasing the PXI-based, TS-900 Semiconductor Test System.
Michael Dewey, Geotest's Sr. Product Marketing Manager, will be presenting a paper, "A PXI Tsunami in Semiconductor ATE."
SEMICON West Taiwan,
September 5th - 7thTaipei City, Taiwan R.O.C Booth 834Taiwan has established itself as a global center of semiconductor manufacturing excellence, boasting the most advanced and competitive supply chain in the world. Please visit Geotest-Marvin Test Systems’ distributor, SE Technologies Corporation, at SEMICON Taiwan where attendees can see our PXI-based TS-900 Semiconductor Test System and interact with Taiwan's biggest and most important device maker and supply chain companies.
AUTOTESTCON,
September 11th - 13th Anaheim, California Booth 601Geotest-Marvin Test Systems will be exhibiting at the 48th edition of the Systems Readiness Technology Conference that is commonly known as AUTOTESTCON. This major conference and exposition provides focus on the maintenance aspects of systems readiness and providing Mission Assurance through Advanced ATE. IEEE AUTOTESTCON is the world’s premier conference that brings together the military/aerospace automatic test industry and government/military acquirers and users to share new technologies, discuss innovative applications, and exhibit products and services.
International Test & Evaluation Annual Symposium,
September 17th - 20th Huntington Beach, CaliforniaBooth 111The International Test and Evaluation Association (ITEA) symposium gathers annually to advance the exchange of technical, programmatic, and acquisition information among the test and evaluation community. Attendees will learn and share with others from industry, government, and academia, who are involved with the development and application of the policies and techniques used to assess effectiveness, reliability, interoperability, and safety of existing, legacy, and future technology-based weapon and non-weapon systems and products throughout their lifecycle.
ElectroTest Expo,
September 19th North Queensferry, UKGeotest-Marvin Test Systems will be participating in the 3rd annual ElectroTest Expo. This PCB debug and test event held in the Kingdom of Fife, UK will showcase the latest bench-top ATE, PXI systems, Oscilloscopes, Logic Analyzers, and more. Come visit us if you're attending this event.
PXI-2012 Roadshow, September 24th, 26th, and 28thGermanyIndustry leaders of PXI automated test technology have teamed up to bring PXI solutions closer to users and decision makers around Europe. Prüftechnik Schneider & Koch, Geotest-Marvin Test Systems, JTAG Technologies, Pickering, VX Instruments, Aeroflex and MIC Mass Interface Connections, and others will participate in a series of seminars and product exhibitions focused on research and development, production, quality control and PXI architectures. The one-day seminars will be held on three dates in September.
Seminar dates: - Monday, September 24th, Augsburg
- Wednesday, September 26th, Wuppertal
- Friday, September 28th, Dresden
Seminars are free and registration is required. For more information on dates, locations, and agenda registration, please send an e-mail to
pxi-roadshow@prueftechnik-sk.deThe PXI Show,
October 9thNorthamptonshire, UKSilverstone Wing, International Media Centre Visit Geotest-Marvin Test Systems at the PXI Show. This one-day event will focus exclusively on the modular Test & Measurement platform. A consortium of T&M professionals are hosting this event, and will offer test managers and engineers a unique opportunity to experience a range of PXI products currently available from the industry's leading vendors.
The exhibition hall will showcase a wide variety of PXI products from over 15 global T&M companies, while the auditorium will feature a varied program of technical presentations covering many different aspects of PXI system development and implementation. A complimentary buffet lunch will be provided for all attendees and a selection of beverages will be available throughout the day. Please register
here.
In the News
Geotest-Marvin Test Systems Welcomes CoreTest Technologies Ltd. | Geotest-Marvin Test Systems has named CoreTest Technologies as their newest distributor to provide sales support for the TS-900 Semiconductor Test product line in the UK and Ireland. CoreTest Technologies has extensive experience supporting products for semiconductor and PCB test in many market sectors including: semiconductor manufacturing, automotive electronics, consumer electronics, medical electronics, aerospace, and military & defense. |
Chris Rogalski, CEO of CoreTest Technologies Ltd. said, “CoreTest is proud to have been selected as the UK and Ireland distribution channel for the TS-900. The product line complements our extensive range of semiconductor test equipment perfectly. TS-900 uses Geotest's semiconductor test instrumentation which can be augmented by industry standard PXI instruments to test most device types, providing a low cost, configurable test platform for characterization or full production test of devices when interfaced to a handler or prober. CoreTest Technologies was selected due to our relationships with the semiconductor and defense / aerospace markets. We look forward to a long successful association with Geotest”. CoreTest Technologies can be reached at +44 (0)2032 878703,
http://www.coretest.co.uk.
Semicon West recapIn early July, Geotest-Marvin Test Systems exhibited at the Semicon West show in San Francisco, CA. The show was well attended. We featured our TS-900 Semiconductor Test System as well as our new
TS-900-OM model which combines our
TS-900 with the Reid-Ashman manipulator for automated handler applications. We would like to thank all of you that visited us at the show as well as our partners Robson Technology and Reid-Ashman for their support.
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