Test Connections - September 2015 - Newsletter

September 2015 - NewsletterFocus OnSolution SpotlightProduct HighlightIn the NewsDid You Know?

We are entering a very exciting time for us as we will be exhibiting at a number of tradeshows beginning the second week of September through mid-November. Marvin Test Solutions will be out in force at major tradeshows including the Air Force Association, Dubai Airshow, and Autotestcon.
Steve Sargeant, CEO

We hope you enjoy this month's issue of Test Connections which includes new product updates and news events.

Please send your comments or suggestions regarding this newsletter to marketing@MarvinTest.com.

Marvin Test Solutions Expands MTS-3060 SmartCan™ Capabilities

Marvin Test Solutions continues to add new capabilities and platform support for its MTS-3060 SmartCan™. The innovative SmartCan represents the next generation in advanced flightline armament test and provides the functionality needed to support multiple types of weapon systems and aircraft.

Expanding Digital Test Capabilities with a Multi-Site Test Feature

Test engineers are constantly challenged to do more with their test resources. One method to improve overall test throughput and test resource utilization is to implement a multi-site test strategy for testing semiconductor or board level products. Working with a major supplier of MEMs devices, Marvin Test Solutions has recently updated the GX5295 digital instrument’s features to easily support the testing of multiple MEMs devices using a single, 32 channel digital instrument, without resorting to complex multi-threading test programs and multiple instrument test system configurations.

GX3788

Marvin Test Solutions has recently expanded its user programmable FPGA product line with the addition of the GX3788, which adds analog measurement and stimulus capabilities to the GX3700 FPGA family of PXI modules. Learn more about the GX3788’s digital and analog test features and how they can be customized for your specific multi-function test needs.

Newsworthy Happenings at Marvin Test Solutions

See us at upcoming industry conferences and tradeshow events

New and recent YouTube videos

Trade publication news

Looking to generate test applications faster? Open-architecture-based ATEasy is the answer. Download your no-cost 30-day trial today! Download your 30 day FREE TRIAL!

Marvin Test Solutions has recently released updated drivers and software for several hardware and software products.
Read on to learn more.

Read the blog post here.

Upgrading MTS instrument Firmware
Most MTS instruments have field upgradeable firmware. Learn how to upgrade your instrument’s firmware.

Click here to learn more.

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Marvin Test Solutions Expands MTS- 3060 SmartCan™ Capabilities

Marvin Test Solutions recently upgraded the MTS-3060 SmartCan™ to support functional testing of the AIM-120 (AMRAAM) systems. Full functional testing of AMRAAM systems includes support for the MIL-STD-1760 bus as well as emulation of the AIM-120 - a capability that was previously unavailable at the flightline. The SmartCan supports AMRAAM systems testing on any platform including F-16, F-15, and F-18.
The MTS-3060’s new AMRAAM test capability is already deployed on two F-16 Blocks, and has been demonstrated on the F-15.

The SmartCan now also supports the BAE Hawk aircraft, further expanding the SmartCan’s cross platform capabilities. Currently, the SmartCan supports all legacy and “smart” armament systems on the following platforms:

F-16 (multiple blocks)
F-15
TA-50 and FA-50
F-5
BAE Hawk
UAV’s

To learn more about the MTS-3060 and its benefits, click here.

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Expanding Digital Test Capabilities with a Multi-Site Test Feature

Today’s semiconductor vendors are increasingly moving to open architecture, PXI –based solutions to provide them with cost effective, compact footprint, and flexible test solutions. MEMS suppliers in particular, are looking to PXI-based solutions as being well-suited for addressing their need for cost effective test solutions.

Recently, MTS was approached by a major supplier of MEMS devices to help with addressing their requirement to test multiple, low pin count devices using Marvin Test Solutions’ GX5295 digital instrument. Supporting 32 digital channels, with PMU per pin capability, the customer needed to support the testing of 8 devices, using a single GX5295 for their multi-site test configuration. The customer’s key requirements included the following:

Using the GX5295’s Real-Time Compare function, log the first failure on each channel if/when they occur. The failed channel is correlated to specific site failures.
For future failure analysis, record the test pattern step where each channel’s first-failure occurred.
Suppress all further real-time compare operations for a channel, after the first failure.
Enable or disable first-failure logging on a channel-by-channel basis.
Support complete test execution, without pause or interruption, regardless of the number of channel failures.
Report all failed channels with a single register read, avoiding the time-consuming operation of up-loading and post processing the full pattern buffer to identify failed channels.
Maintain existing real-time compare capability.
Support the LabVIEW programming environment

With the requirements defined, MTS’ engineering group enhanced the GX5295's features with an updated firmware, driver and software package to meet all of the objectives outlined above. These new features included the following enhancements:

Channel error latch with a feed-back loop to the real-time compare mask circuit.
Selection logic to enable the Record-First-Failure (RFF) mode or the standard Real-Time Compare mode (RTC).
A Channel-Disable register to globally and selectively disable real-time compare per channel when operating in the RFF mode.
New API functions added to the GX5295 DLL to control the new RFF features
An upgraded GtDio Panel application which provides interactive control and display of results for the RFF functions
LabVIEW wrappers for the new RFF functions which were added to the GX5295’s DLL.

Implementation
In normal operation, the RTC Error Memory will record up to 1K of errors, including address locations. However, for applications that require support for multi-site testing ( and recording of errors on each channel), what is needed is additional control logic that will record only the first failure for each channel, preventing the possibility of overflowing the 1K of error memory if multiple errors occur on a single channel. The block diagram below details the normal RTC operation and the enhanced RFF mode of operation. With the modified GX5295 firmware, both the RTC and RFF features are supported by the module with the mode of operation being a software selection.

On-Site Evaluation & Deployment
The new capabilities were delivered to the customer for beta testing, and installed on a development station in their test lab.  The GX5295 supports firmware upgrades in the field by loading the new firmware to the target hardware via the PXI bus. An updated DLL, DioEasy application and updated LabVIEW drivers were also installed on-site.

Initial checkout was done using the DioEasy application and involved loading the GX5295 with test patterns that would guarantee multiple RTC errors across many channels, using a simple loopback cable to inter-connect channels.  The original RTC functionality was first demonstrated and verified, proving that the changes did not affect the base-line functionality of the GX5295.  Then, the RFF mode was enabled, and the test results verified that only the first failure (and failing vector address) for a channel was recorded in the GX5295 error memory.  Subsequent errors for the channel were ignored.  At the conclusion of the test, the DioEasy display correctly indicated all known failing channels.

Once the new capabilities were demonstrated, the process was repeated with the customer’s Devices Under Test (DUT’s).  The GX5295 executed a 20M-vector scan test on twelve devices simultaneously.  With a 1K error memory, the un-enhanced GX5295 would over-run the error memory if one site were bad, forcing a cumbersome coding exercise to monitor the error memory, and when full, save the error information, clear the error memory, and continue the test.  At the conclusion of the test, the saved error data had to be integrated and correlated to the failed DUT site(s). With the RFF mode enabled, the tests were again executed and it was verified that only the first failure for a channel was recorded in the GX5295’s error memory.  Failures were also induced on several sites, and in each circumstance, the GX5295 correctly identified the failing sites – in a single pass and without an error memory over-run.

The customer’s LabVIEW control program was then modified to add the new functions for setting up and controlling the RFF capabilities and a single “Read Error” VI was placed in parallel with the LabVIEW code that was managing the data collection and correlation to identify failed sites.  When executed, the modified code executed as expected and correctly identified all of the failed sites.  The end result was that the multi-site test ran faster by eliminating a significant piece of code that was used to manage error collection, reducing a lengthy, iterative process of running, flushing error memory, and restarting the test.  In addition, test functionality was improved in that any known bad sites could be excluded from the test simply by writing a value to the Channel Disable Register that would mask the channel associated with that site, eliminating the need to fill a 20M-vector pattern (in this instance) with the equivalent mask pattern. With the enhanced GX5295, MTS was able to deliver a test solution that meets all of the customer’s stated requirements and provides a drop-in upgrade path for those customers using the GX5295 for multi-site semiconductor testing.

To learn more about Marvin Test Solutions’ GX5295 digital instrument, click here or contact us at sales@marvintest.com if you have specific test needs

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GX3788

Marvin Test Solutions has recently expanded its user programmable FPGA product line with the addition of the GX3788, which adds analog measurement and stimulus capabilities to the GX3700 FPGA family of PXI modules.

The GX3788 is based on the GX3700, user programmable, FPGA module and incorporates eight differential 16-bit A to D and eight differential 16-bit, D to A converters which are located on the module’s daughter board.

The user programmable FPGA utilizes the same Altera FPGA as the GX3700, or GX3700e, and features the following capabilities:

Free, web-downloadable FPGA design software from Altera
Supports Verilog, VHDL, and graphical Schematic Design
Access to all PXI bus resources for card synchronization and clock reference
Supports both analog and digital test capability

Key features of the A to D channels include the following:
Configurable as 8 Differential or 16 Single-ended inputs
250 KS/s sample rate with eight channel operation or 1MS/s time-interleaved dual channel operation
Programmable measurement range for improved accuracy, accepts input signals up to ± 13.6 V
ADC FIFO capable of storing 2K samples

Key features of the D to A channels include:
8 channels, supporting 1 MS/s simultaneous sampling
± 10 V output range
6 V/us slew rate

Customers have access to all of the module’s analog stimulus / measurement capabilities and can incorporate specific analog and digital instrument capabilities by programming the FPGA which in turn, controls and accesses the analog channels. The default FPGA configuration file provides firmware images to allow the user to operate the instrument with static analog input, static analog output, and programmable digital input/output. For instance, a simple direct digital synthesis generator can be realized in the FPGA, allowing the creation of up to 8 independently configured waveform generators. The diagram below provides a high-level overview of the implementation.

Implementation of the DDS using a schematic capture design is shown below. The schematic shows the design of the FPGA component which updates at 10MHz and uses a lookup table to generate a sine wave pattern. The output of FPGA is used to drive each of the eight D to A converters.

This same application can be achieved using Verilog or VHDL, as shown below:
The application can be achieved using Verilog or VHDL

By combining the programmability of the FPGA with the functionality of the A to D and D to A converters, users can construct their own custom, application specific mixed-signal instrumentation. To learn more about the GX3788, click here.

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Newsworthy Happenings at Marvin Test Solutions

See us at upcoming industry conferences and tradeshow events

New and recent YouTube videos
Trade publication news

YouTube Videos:

Marvin Test Solutions has just released a new corporate video which is available on YouTube.

You can also view several other MTS YouTube videos including ones that focus on the MTS-3060 and ATEasy.

Upcoming Events:
F-16 World Wide Review, September 14^th - 17^th, 2015
Ogden, UT
Booth #162 - 164
The Marvin Group will be exhibiting, including the Marvin Engineering Company and Marvin Test Solutions at the F-16 WWR. The Worldwide Review offers all F-16 and Proven Aircraft Technical Coordination Groups (TCG) member countries the opportunity to gather in one location to discuss common configuration/maintenance/and logistics issues and meet with qualified vendors, USG Engineers, Equipment Specialists and Program Managers for possible solutions.

AFA Air & Space Technology Exposition, September 14^th - 16^th, 2015
National Harbor, MD
Booth #443
Marvin Test Solutions will be exhibiting at the Air & Space Technology Exposition which will be held at the Gaylord National Resort & Convention Center, National Harbor, MD. The Air & Space Conference and Technology Exposition brings together Air Force leadership, industry experts, academia, and current aerospace specialists from around the world to discuss the issues and challenges facing America and the aerospace community today.

International Test Conference, October 6^th - 8^th, 2015
Anaheim, CA
Booth #223
Marvin Test Solutions will be exhibiting at the ITC show which will be held at the Disneyland Hotel, in Anaheim, CA. The International Test Conference is the world’s premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement.

Joint Munitions Worldwide Review, October 18^th - 23^rd, 2015
Orlando, FL
Booth #4-5
Marvin Test Solutions will be co-exhibiting with our parent company, The Marvin Group at the Joint Munitions Worldwide Review, which will be held at the Caribe Royale Hotel in Orlando, FL. The JMWWR event brings together members of the global munitions community for the purpose of sharing information and ideas.

Logistics Officer Association Symposium 2015, October 19^th - 22^nd, 2015
Arlington, VA
Booth #214
Marvin Test Solutions will be exhibiting at the Logistics Officer Association Symposium, which will be held at the Hyatt Regency Crystal City in Arlington, VA. This premier event brings together senior logistics leaders, industry, and logistics operators to identify grassroots problems, discuss possible solutions, as well as discuss future opportunities and needs in the logistics field.

WEPTAC ANG 2015, October 19^th -20^th, 2015
Tucson, AZ
Booth #112
Marvin Test Solutions will be exhibiting at the Air National Guard’s WEPTAC event, which will be held at the DoubleTree Suites in Tucson, AZ.

ADEX, October 20^th - 25^th, 2015
Seoul, Korea
Booth #D94
Marvin Test Solutions will be co-exhibiting with our distributor, Aero Precision at the Seoul Aerospace & Defense Expo, which will be held at the Seoul Airport, Seoul, Korea.

IEEE AUTOTESTCON, November 2^nd - 6^th, 2015
National Harbor, MD
Booth #113
Marvin Test Solutions will be exhibiting at AUTOTESTCON 2015, which will be held at the Gaylord National Convention Center, National Harbor, MD. The conference brings together the military/aerospace automatic test industry and government/military acquirers and users to share new technologies, discuss innovative applications, and demonstrate their products and services. It is sponsored annually by the Institute of Electrical and Electronic Engineers (IEEE). The Theme this year is "Increased Mission Effectiveness through Advanced Test & Support Technology”

Dubai Air Show, November 8^th - 12^th, 2015
Dubai World Central, United Arab Emirates
Booth #195
The Marvin Group will be exhibiting, including the Marvin Engineering Company and Marvin Test Solutions, for the first time, at the Dubai Air Show, which will be held at Dubai World Central, United Arab Emirates. The record-breaking Dubai Airshow is one of the largest and most successful air shows in the world, connecting aerospace professionals across all areas of the industry to facilitate successful global trade.

NDIA Air Armament Symposium, November 3^rd - 4^th, 2015
Fort Walton Beach, FL
Booth #1 & 2
Marvin Test Solutions will be co-exhibiting with the Marvin Group at the NDIA’s 41st Air Armament Symposium, which will be held at the Emerald Coast Convention Center, Fort Walton Beach, FL. The symposium provides a two-day interchange for senior government federal, state, local and industry leadership to identify and share opportunities to capitalize on the DoD's affordability-focused leadership and to discuss their application to current and planned armament development and modernization.

F-15 Worldwide Review, November 16^th - 20^th, 2015
Fort Walton Beach, FL
Booth 306
Marvin Test Solutions will be exhibiting at the F-15 Worldwide Review, which will be held at the Emerald Coast Convention Center, Fort Walton Beach, FL. The annual WWR is the only place where all five countries of the F-15 TCP come together with representatives from the USAF and industry to discuss their issues, concerns, as well as improvements and modification to the F-15 platform. The five member countries represented are Israel, Japan, Korea, Saudi Arabia and Singapore.

Productronica, November 10^th - 13^th, 2015
Munich, Germany
Booth 345
Marvin Test Solutions will be co- exhibiting with our distributor, LX Instruments at the Productronica show, which will be held at the Messe Munchen Fairground in Munich, Germany. Held bi-annually, the show is the world's leading trade fair for electronics development and production.

AES Aerospace Electrical Systems Expo, Europe, November 17^th - 19^th, 2015
Bremen, Germany
Booth #E42
Marvin Test Solutions will be exhibiting at AES Europe show, which will be held at the Messe Bremen convention center in Bremen, Germany. The show brings together manufacturers, distributors, contractors, suppliers, engineers and technical leaders, associated with the entire electrical system supply chain for commercial and business aviation, military aircraft, rotary, and spacecraft.

Featured Articles / Interviews:
Marvin Test Solutions’ products and people were recently featured in the following publications:

Evaluation Engineering: August 2015 "Leveraging Test Platform Diversity"

Evaluation Engineering: July 2015 "Difficult Signal Selection - Special Report Switching Systems"

Avionics, August / September 2015: “Testing the Waters: Avionics Test Equipment Sees New Markets”

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Marvin Test Solutions has recently released updated drivers and software for the following instruments and products:

GTDio6x.exe, Ver. 2.0.2, Driver package for GX5960 instruments and GX5296

GTDio6UG.pdf, Ver. 2.0.2, GtDio6x Software (GX5296, GX5961, GX5964) User's Guide

GX5296UG.pdf, Ver. 2.0.2, GX5296 user’s guide

ATEasy9-152d-PR7.exe, ATEasy pre-release setup, Supports Windows XP-10 (32/64 bit)

GXFpga.exe, Ver. 2.3, GXFPGA driver support for GX3500 / GX3700 / Gx3700e FPGA modules

GtWave.exe, Ver. 1.3.1, WaveEasy software, supporting GX1110/GX1120 modules

GxPio.exe, Ver. 4.0, GxPio driver supporting GX5641/2,GX5731/2/3 digital I/O modules

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Test Connections - September 2015

Marvin Test Solutions Expands MTS-3060 SmartCan™ Capabilities

Expanding Digital Test Capabilities with a Multi-Site Test Feature

GX3788

Newsworthy Happenings at Marvin Test Solutions

Marvin Test Solutions Expands MTS- 3060 SmartCan™ Capabilities

Expanding Digital Test Capabilities with a Multi-Site Test Feature

GX3788

Newsworthy Happenings at Marvin Test Solutions

Marvin Test Solutions has recently released updated drivers and software for the following instruments and products:

Enter message in space below

Product Lines

Resources

About Marvin Test Solutions

Contact Us

Aircraft

Weapons Systems

Maintenance Levels

GENASYS

GENASYS Benchtop

GENASYS Semi

GENASYS

GENASYS Benchtop

Commercial

Military

GENASYS Rugged

Test Connections - September 2015

Marvin Test Solutions Expands MTS-3060 SmartCan™ Capabilities

Expanding Digital Test Capabilities with a Multi-Site Test Feature

GX3788

Newsworthy Happenings at Marvin Test Solutions

Marvin Test Solutions Expands MTS- 3060 SmartCan™ Capabilities

Expanding Digital Test Capabilities with a Multi-Site Test Feature

GX3788

Newsworthy Happenings at Marvin Test Solutions

Marvin Test Solutions has recently released updated drivers and software for the following instruments and products:

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Product Lines

Resources

About Marvin Test Solutions

Contact Us