Test Connections - September 2017

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Legacy Semiconductor ATE Upgrade - Marvin Test Expansion Kit


Solve your semiconductor ATE system obsolescence problem
Simply testing today’s advanced semiconductor devices with yesterday’s ATE is not an option. With each new development in device technology, the test requirements can outpace the capabilities of the available test equipment. Marvin Test Solutions’ cost-effective, Marvin Test Expansion Kit (MTEK) platform provides the solution.

The MTEK platform breathes new life into your legacy semiconductor test systems with a PXI-based, add-on solution that easily adds capability without the expense of replacing the entire test system.

Marvin Test Expansion Kit

MTEK Features
  • Upgrade for legacy semiconductor test systems including Teradyne, LTX/Credence, and Verigy platforms
  • Cost-effective PXI-based, add-on solution with an open architecture
  • Easily add RF, digital, and analog performance
  • The MTEK’s open architecture can accommodate Marvin Test Solutions’ extensive line of digital test products and the full range of Keysight’s RF PXI products, as well as additional baseband instrumentation.
  • Fast implementation;  the PXI chassis becomes an extension of the host CPU
  • Simplified integration with existing test programs via DLL calls to the new instruments which are compatible with a wide range of programming languages
  • Easy integration with test floor data collection, data analysis, etc.
  • Reduced time spent on training; little or no additional training for production personnel
  • Multisite capability for both wafer sort  and packaged test

Part of Marvin Test Solutions’ suite of semiconductor test solutions, ideal for engineering and production applications as well as incoming inspection and failure analysis, the MTEK Series is a flexible, scalable, test system upgrade.

The MTEK platform offers you a cost-effective, performance solution that addresses common legacy test system challenges:

  • Existing test systems are 20+ years old, with dated and limited capacities
  • New test capabilities for testing and characterizing new designs
  • Costs of new test systems are prohibitive
  • New test systems require learning new tools
  • Porting tests to new test systems can be costly

MTEK Block Diagram