Performance and flexibility for demanding test applications
The GENASYS family of integrated test solutions delivers exceptional measurement performance and flexibility across a broad spectrum of critical test applications from avionics to satellites and smart weapons to semiconductors.
Understanding that one size doesn’t fit all, GENASYS is based on a reconfigurable, customizable PXI architecture capable of scaling to over 4,500 channels for demanding applications requiring any-resource-to-any-pin functionality, or to compact, rugged configurations for production, operational, intermediate, and depot use.
Five base configurations have been designed and developed to deliver a level of functionality needed to address typical test requirements for a variety of applications, and each is scalable and configurable to meet your requirements.
Users can build upon these base configurations to address their unique applications.
The GENASYS family of test sets provides an easily customizable, turnkey, commercial-off-the-shelf (COTS) test solution.
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GENASYS Ultra - High Performance Mixed Signal Test Platform
GENASYS Ultra is the definitive high-performance mixed signal test platform, and the flagship of the GENASYS family, delivering the most comprehensive functional test capabilities in the industry.
Ideally suited for a broad range of Mil/Aero and other mission critical functional test applications, the open-platform PXI-based architecture leverages COTS instrumentation and switching for exceptional flexibility and scalability to address evolving test needs – an ideal replacement for legacy test stations such as the Teradyne L200/L300, GenRad 2750 and VXI-based functional test systems.
GENASYS Ultra features an innovative modular hybrid switching subsystem capable of supporting over 4,500 interface test points with MTS’ exclusive “any-resource-to-any-pin” architecture.
| |  | GENASYS Lite - High Performance Mixed Signal Test Platform
GENASYS Lite delivers the same superior measurement performance, functionality and “any-resource-to-any-pin” architecture as GENASYS Ultra, but in a single bay configuration with reduced I/O channel capacity and a smaller footprint.
Ideal for reduced channel count applications that demand advanced test performance, GENASYS Lite incorporates the same scalable architecture allowing the base configuration of 256 multiplexed / hybrid digital channels, expandable up to 2304 channels to meet changing test demands.
| |  | GENASYS Benchtop - Compact / Portable Functional Test
GENASYS Benchtop is the ideal compact solution for lower channel count applications requiring high performance capabilities found in the larger Ultra and Lite families. This turnkey test set, as the name implies, is compact enough to be placed on a benchtop or cart, yet powerful enough to meet critical timing and accuracy requirements found in many Mil/Aero, medical and automotive applications.
“Application ready” from day one, GENASYS Benchtop gives test engineers the freedom to focus on developing test programs rather than building the test system. The test interface employs a unique design approach which allows customization of the system using any of the platform’s standard instrument options, without incurring the cost and design time typically associated with a customized functional test system.
GENASYS Benchtop models support analog, digital, boundary scan, commercial avionics, and military avionics applications.
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 | GENASYS Semi - Semiconductor Test Platform
GENASYS Semi is the most advanced open-architecture 5G semiconductor test platform in the industry, delivering exceptional system features and capabilities that were once only found in proprietary “big iron” ATE systems. The compact, flexible design can be configured as a benchtop system, or with an integrated manipulator, without impacting speed, measurement performance or up-time.
GENASYS Semi TS-900e-5G Series is the industry’s first production 5G / mmWave semiconductor solution capable of testing devices up to 53 GHz and supporting up to 20 independent 53 GHz channels. Laboratory grade PXIe RF instrumentation is coupled with a high-performance receiver interface to deliver the most accurate and repeatable production VNA / S-parameter test performance in the industry. The modular configuration of the TS-900e-5G provides between 4 and 20 independent VNA channels, up to 512 digital pins with per-pin PMU, and up to 64 DPS channels, making this the ideal solution for packaged or wafer production test of mmWave devices.
The innovative test interface delivers proven high-performance connectivity to the device under test (DUT), with field configurable receiver interface pin blocks that allow users to upgrade the receiver as test needs change or new application requirements emerge.
Furthermore, GENASYS Semi solutions are compatible with industry standard probe stations, device handlers (Opus 3, TEL, Seiko Epson E8040/ E8080), and manipulators (Reid-Ashman OM-1069, inTest). | |
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| | | GENASYS Rugged - Adverse Environment Test Platform
GENASYS Rugged test solutions for operational, intermediate, and depot level deployment extends high-accuracy measurement performance to applications where exposure to adverse environmental conditions is not uncommon, including aircraft armament and avionics systems troubleshooting and repair. The state-of-the-art MTS-207 portable test solution combines the capabilities of proven production, operational, intermediate, and depot level test sets in a rugged, compact case for use across the spectrum of sustainment and maintenance environments.
The GENASYS Rugged solution incorporates an innovative calibration process, utilizing built-in calibration references, to extend the calibration cycle to an industry leading 2 years for most deployed configurations. Additionally, calibration only requires simple verification utilizing basic metrology equipment, thus eliminating the need for PMEL calibration services and associated down-time.
GENASYS Rugged Applications Include:
• MTS-207 Common Core / Customizable
• AN/TSM-205B Hellfire System Test Set
• MTS-206A Maverick Field Test Set
• MTS-209 Common Armament Test Set
• MTS-235A F-35 Armament Test Set
• USAF PATS-70A A-10C Avionics / Armament Test Set
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Integrated Test Executive and Programming Development Environment
All GENASYS integrated test solutions share a common essential thread: the best-in-class ATEasy® Test Executive and Integrated Development Environment. Designed by test engineers for test engineers, ATEasy combines all of the features associated with familiar text-based software development environments with a customizable test executive for execution, sequencing, debugging and fault analysis.
The most cybersecure integrated development environment and test executive in the industry, ATEasy meets or exceeds stringent security technical implementation guidelines (STIGs) providing peace of mind for you and your customer. Advanced rapid application development (RAD) utilities, simulation capabilities, collaboration and debugging tools, and a well-defined test execution structure all combine to maximize programming efficiencies and productivity.
• Advanced cybersecurity
• User interface / GUI generation
• Common IDE interfaces and tools
• Built-in Hardware Abstraction Layer (HAL) to mitigate instrument obsolescence
• Familiar text-based programming
• Merge and team collaboration tools
• Royalty free executable distribution
• Comprehensive simulation capabilities
Flexible, scalable test solutions
GENASYS systems and subsystems are currently in use by commercial and military customers in the US and abroad to address the demanding test requirements of satellite payloads, armament electronics and subsystems, flight management and control systems, audio/video/communications systems, 5G mmWave semiconductor devices, and other critical electronics.
Based on the PXI architecture, GENASYS offers a compact, flexible, scalable system designed to address both current and future test requirements. Designing a system with future upgradeability in mind provides the ideal solution for customers whose test requirements evolve with every new advance in technology.
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